SNAPSHOT BASED MEMORY CHECKPOINT COPY

    公开(公告)号:US20250028611A1

    公开(公告)日:2025-01-23

    申请号:US18762217

    申请日:2024-07-02

    Inventor: John M. Groves

    Abstract: A system can include a memory device and a processing device operatively coupled with the memory device, to perform operations of maintaining a set of data items reflective of a state of a host application and receiving a first request to make a checkpoint copy of the state of the host application. The operations can also include responsive to receiving the first request, associating a snapshot identifier with the object identifier, and receiving a second request to modify a data item of the set of data items at the first set of physical address ranges. They can also include executing the second request by recording a modification a data item exclusively at a second set of physical address ranges and making the checkpoint copy by copying the set of data items of the snapshot from the first set of physical address ranges to a second memory device.

    VOLTAGE SCALING BASED ON ERROR RATE
    252.
    发明申请

    公开(公告)号:US20250028595A1

    公开(公告)日:2025-01-23

    申请号:US18773151

    申请日:2024-07-15

    Abstract: A method includes generating, by circuitry resident on a memory device, parity information, appending parity information to data read from the memory device to generate a bit string comprising the data read from the memory device and parity information, transmitting the bit string from the memory device to a physical input/output (PHY I/O) device couplable to the memory device via a channel, calculating a parity mismatch value based on a comparison between received memory parity information and a calculated PHY I/O parity information, determining a target parity mismatch value, comparing the calculated parity mismatch value and the determined target parity mismatch value, and regulating a voltage in response to the comparison between the calculated parity mismatch value and the target parity mismatch value to maintain an actual channel error rate within an optimal range.

    GENERATING X-RAY IMAGES AND INDICATING DIAGNOSES ASSOCIATED WITH THE X-RAY IMAGES

    公开(公告)号:US20250025117A1

    公开(公告)日:2025-01-23

    申请号:US18909407

    申请日:2024-10-08

    Abstract: In some implementations, a device may produce, via an x-ray module, x-rays to be directed towards a body part. The device may detect, via a sensor, the x-rays reflected from the body part. The device may generate, via the sensor, signals based on the x-rays reflected from the body part. The device may generate, via a processor, an x-ray image of the body part based on the first signals. The device may transmit the x-ray image to a server. The device may receive, from the server, a message that indicates a diagnosis associated with the x-ray image. The device may display, via a user interface, the x-ray image and information associated with the diagnosis associated with the x-ray image.

    Dynamically boosting read voltage for a memory device

    公开(公告)号:US12205641B2

    公开(公告)日:2025-01-21

    申请号:US17834702

    申请日:2022-06-07

    Abstract: Systems, methods, and apparatus related to dynamically determining read voltages used in memory devices. In one approach, a memory device has a memory array including memory cells. One or more resistors are formed as part of the memory array. A memory controller increments a counter as write operations are performed on the memory cells. When the counter reaches a limit, a write operation is performed on the resistors. The write operation applies voltages to the resistors similarly as applied to the memory cells over time during normal operation. When performing a read operation, a current is applied to one or more of the resistors to determine a boost voltage. When reading the memory cells, a read voltage is adjusted based on the boost voltage. The memory cells are read using the adjusted read voltage.

    WAFER-LEVEL STACKED DIE STRUCTURES AND ASSOCIATED SYSTEMS AND METHODS

    公开(公告)号:US20250022852A1

    公开(公告)日:2025-01-16

    申请号:US18901972

    申请日:2024-09-30

    Inventor: Chih Yuan Chang

    Abstract: A stacked die structure for a semiconductor device generally includes a primary level with a first die formed in a wafer, and a second level with a second die coupled to the first die. A third level includes a third die coupled to the second die. The levels have conductive first, second, and third interconnects, respectively, extending from active sides of the dies and may be bonded prior to stacking the dies. The dies may be stacked in an offset or rotated position relative to each other such that the interconnects extend beyond each of the other dies to contact a redistribution layer that forms electrical connections with external components. In some configurations, a fourth level having a fourth die and a conductive fourth interconnect is coupled to the third die and positioned laterally offset from the third die such that the third interconnect extends beyond the fourth die.

    SELECTION OF AN OPTIMAL SINGLE LEVEL CELL PROGRAMMING SCHEME

    公开(公告)号:US20250022515A1

    公开(公告)日:2025-01-16

    申请号:US18767584

    申请日:2024-07-09

    Abstract: In some implementations, a memory device may receive, from a host device, a program command. The memory device may determine that the program command is associated with a single level cell (SLC) program command. The memory device may determine a size of host data associated with the program command. The memory device may select a programming scheme, from multiple candidate programming schemes, to be used to write the host data to a memory based on the size of the host data and based on determining that the program command is associated with the SLC program command. The memory device may write the host data to the memory using the programming scheme.

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