摘要:
Embodiments of the invention provide a detection apparatus for detecting charged particles having a charged particle detector for receiving and detecting either incoming charged particles or secondary charged particles generated from the incoming charged particles, a photon generator for generating photons in response to receiving at least some of the same incoming charged particles or secondary charged particles generated from the incoming charged particles as are received and detected by the charged particle detector, and a photon detector for detecting photons generated by the photon generator.
摘要:
An ion transfer arrangement for transporting ions between higher and lower pressure regions of the mass spectrometer comprises an ion transfer conduit 60. The conduit 60 has an inlet opening towards a relatively high pressure chamber 40 and an outlet 70 opening towards a relatively low pressure chamber. The conduit 60 also has at least one side wall surrounding an ion transfer channel 115. The side wall includes a plurality of apertures 140 formed in the longitudinal direction of the side wall so as to permit a flow of gas from within the ion transfer channel 115 to a lower pressure region outside of the side wall of the conduit 60.
摘要:
The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.
摘要:
A method of selecting ions of interest from a beam of ions using an analyser, the method comprising: (i) providing an analyser comprising two opposing ion mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an analyser axis z, each system comprising one or more electrodes, the outer system surrounding the inner; (ii) causing the beam of ions to fly through the analyser along a main flight path in the presence of an analyser field so as to undergo within the analyser at least one full oscillation in the direction of the analyser axis whilst orbiting about or oscillating between one or more electrodes of the inner field defining electrode system; (iii) providing one or more sets of electrodes adjacent the main flight path; (iv) constraining the arcuate divergence from the main flight path of ions of interest by applying one set of voltages to one or more of the sets of electrodes adjacent the main flight path when the ions of interest are in the vicinity of at least one of said one or more sets of electrodes adjacent the main flight path and applying one or more different sets of voltages to the said one or more sets of electrodes adjacent the main flight path when the ions of interest are not in the vicinity of at least one of said one or more sets of electrodes adjacent the main flight path; and: (v) ejecting the ions of interest from the analyser. Also provided is a charged particle analyser comprising the two opposing ion mirrors comprising inner and outer field-defining electrode systems elongated along an analyser axis z, and at least one arcuate focusing lens for constraining the arcuate divergence of a beam of charged particles within the analyser whilst the beam orbits around the axis z, the analyser further comprising a disc having two faces at least partly spanning the space between the inner and outer field defining electrode systems and lying in a plane perpendicular to the axis z, the disc having resistive coating upon both faces.
摘要:
The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof.
摘要:
An ion transfer tube for a mass spectrometer comprises a tube member having an inlet end and an outlet end; and at least one bore extending through the tube member from the inlet end to the outlet end, the at least one bore having a non-circular cross section. A method of forming an ion transfer tube comprises the steps of providing a tube member having a length and an internal bore, the internal bore having a wall of circular cross section; and etching or eroding portions of the tube member adjacent to the wall so as to form an enlarged bore having a non-circular cross section.
摘要:
Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
摘要:
Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.
摘要:
Mass spectrometers, ion sources and methods for providing and transporting analyte ions derived from a sample to ion optics. A sample chamber is configured to receive a sample plate supporting a sample, and an illumination source is configured to illuminate the sample to generate analyte ions and particles. A matrix-protecting interface is located between the sample plate and the ion optics, and configured such that the shortest travel path between the illuminated portion of the sample plate and the sampling aperture or input of the ion optics is substantially obstructed. Alternatively, a gas flow directed at an angle from zero to 90 degrees relative to the main axis of the ion optics and away from the ion optics influences particles generated by the action of the illumination source away from the ion optics, and a voltage source extracts analyte ions of interest.
摘要:
The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.