公开(公告)号：US11674883B2

公开(公告)日：2023-06-13

申请号：US17565115

申请日：2021-12-29

申请人： Essenlix Corporation

发明人： Stephen Y. Chou ,  Wei Ding ,  Wu Chou ,  Jun Tian ,  Yuecheng Zhang ,  Mingquan Wu ,  Xing Li

IPC分类号： G06T1/00 ,  G01N15/14 ,  G06N20/00 ,  G01N1/28 ,  G06N3/08

CPC分类号： G01N15/1484 ,  G01N1/2813 ,  G06N3/08 ,  G06N20/00 ,  G06T1/0014 ,  G01N2001/282

摘要： The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.

公开(公告)号：US20220341842A1

公开(公告)日：2022-10-27

申请号：US17858931

申请日：2022-07-06

申请人： Essenlix Corporation

发明人： Stephen Y. CHOU ,  Wei DING ,  Ji QI ,  Jun Tian ,  Wu Chou

IPC分类号： G01N21/03 ,  G01N1/28 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49

摘要： Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.

公开(公告)号：US11346764B2

公开(公告)日：2022-05-31

申请号：US17268663

申请日：2019-08-16

申请人： Essenlix Corporation

发明人： Stephen Chou ,  Wei Ding ,  Wu Chou ,  Jun Tian ,  Yuecheng Zhang ,  Mingquan Wu ,  Xing Li

IPC分类号： G06T1/00 ,  G01N15/14 ,  G06N20/00 ,  G01N1/28 ,  G06N3/08

摘要： The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.

公开(公告)号：US20210392244A1

公开(公告)日：2021-12-16

申请号：US17179319

申请日：2021-02-18

申请人： Essenlix Corporation

发明人： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Qi ,  Jun Tian ,  Wei Dong

IPC分类号： H04N5/225 ,  G01N21/84

摘要： The present disclosure relates to devices, apparatus and methods of improving the accuracy of an image-based assay. One aspect of the present invention is to sandwich a sample between two plates and add reference marks in the sample areas of the plates, with at least one of the geometric and/optical properties of the reference marks being predetermined and known, and taking images of the sample with the reference marks, and applying a machine learning model in the analysis of the image-based assay.

公开(公告)号：US10972641B2

公开(公告)日：2021-04-06

申请号：US16483700

申请日：2018-02-08

申请人： Essenlix Corporation

发明人： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Qi ,  Jun Tian ,  Wei Dong

IPC分类号： H04N5/225 ,  G01N21/84

摘要： The present invention provides, among other thing, devices and methods for simple, fast, and sensitive assaying, including imaging.