Semiconductor structures and method for fabricating the same
    21.
    发明授权
    Semiconductor structures and method for fabricating the same 有权
    半导体结构及其制造方法

    公开(公告)号:US07651876B2

    公开(公告)日:2010-01-26

    申请号:US11949081

    申请日:2007-12-03

    IPC分类号: H01L21/00 H01L21/84 H01L21/44

    摘要: A semiconductor structure is provided. The semiconductor structure includes a substrate, a gate disposed thereon, an insulation layer disposed on the substrate and overlying the gate, a patterned semiconductor layer disposed on the insulation layer, a source and a drain disposed on the patterned semiconductor layer, a protective layer overlying the insulation layer, the source and the boundary of the drain to expose a portion of the drain, and a pixel electrode disposed on the substrate, overlying the protective layer overlying the boundary of the drain, electrically connected to the exposed drain.

    摘要翻译: 提供半导体结构。 半导体结构包括衬底,设置在其上的栅极,设置在衬底上并覆盖栅极的绝缘层,设置在绝缘层上的图案化半导体层,设置在图案化半导体层上的源极和漏极,保护层覆盖 所述绝缘层,所述漏极的源极和边界以暴露所述漏极的一部分,以及设置在所述衬底上的像素电极,覆盖所述保护层,所述保护层覆盖所述漏极的边界,电连接到所述暴露的漏极。

    SEMICONDUCTOR STRUCTURES AND METHOD FOR FABRICATING THE SAME
    22.
    发明申请
    SEMICONDUCTOR STRUCTURES AND METHOD FOR FABRICATING THE SAME 有权
    半导体结构及其制造方法

    公开(公告)号:US20080197372A1

    公开(公告)日:2008-08-21

    申请号:US11949081

    申请日:2007-12-03

    IPC分类号: H01L33/00

    摘要: A semiconductor structure is provided. The semiconductor structure includes a substrate, a gate disposed thereon, an insulation layer disposed on the substrate and overlying the gate, a patterned semiconductor layer disposed on the insulation layer, a source and a drain disposed on the patterned semiconductor layer, a protective layer overlying the insulation layer, the source and the boundary of the drain to expose a portion of the drain, and a pixel electrode disposed on the substrate, overlying the protective layer overlying the boundary of the drain, electrically connected to the exposed drain.

    摘要翻译: 提供半导体结构。 半导体结构包括衬底,设置在其上的栅极,设置在衬底上并覆盖栅极的绝缘层,设置在绝缘层上的图案化半导体层,设置在图案化半导体层上的源极和漏极,保护层覆盖 所述绝缘层,所述漏极的源极和边界以暴露所述漏极的一部分,以及设置在所述衬底上的像素电极,覆盖所述保护层,所述保护层覆盖所述漏极的边界,电连接到所述暴露的漏极。

    Active device array substrate and method for fabricating the same
    24.
    发明授权
    Active device array substrate and method for fabricating the same 有权
    有源器件阵列衬底及其制造方法

    公开(公告)号:US08071407B2

    公开(公告)日:2011-12-06

    申请号:US12835874

    申请日:2010-07-14

    IPC分类号: H01L21/28

    CPC分类号: H01L27/1288 H01L27/124

    摘要: An active device array substrate and its fabricating method are provided. According to the subject invention, the elements of an array substrate such as the thin film transistors, gate lines, gate pads, data lines, data pads and storage electrodes, are provided by forming a patterned first metal layer, an insulating layer, a patterned semiconductor layer and a patterned metal multilayer. Furthermore, the subject invention uses the means of selectively etching certain layers. Using the aforesaid means, the array substrate of the subject invention has some layers with under-cut structures, and thus, the number of the time-consuming and complicated mask etching process involved in the production of an array substrate can be reduced. The subject invention provides a relatively simple and time-saving method for producing an array substrate.

    摘要翻译: 提供一种有源器件阵列衬底及其制造方法。 根据本发明,诸如薄膜晶体管,栅极线,栅极焊盘,数据线,数据焊盘和存储电极之类的阵列基板的元件通过形成图案化的第一金属层,绝缘层,图案化 半导体层和图案化金属多层。 此外,本发明使用选择性蚀刻某些层的方法。 使用上述方法,本发明的阵列基板具有一些具有欠切割结构的层,因此可以减少与制造阵列基板有关的耗时且复杂的掩模蚀刻工艺的数量。 本发明提供了用于制造阵列基板的相对简单且省时的方法。

    PHOTOVOLTAIC CELL
    25.
    发明申请
    PHOTOVOLTAIC CELL 审中-公开
    光伏电池

    公开(公告)号:US20110284074A1

    公开(公告)日:2011-11-24

    申请号:US12891721

    申请日:2010-09-27

    IPC分类号: H01L31/0376

    CPC分类号: H01L31/0747 Y02E10/50

    摘要: A photovoltaic cell includes a first type doped mono-crystalline silicon substrate, an intrinsic amorphous silicon layer, a second type doped amorphous silicon layer, a first type doped crystalline Ge-containing layer, and a pair of electrodes. The first type doped mono-crystalline silicon substrate has a front surface and a rear surface. The intrinsic amorphous silicon layer is disposed on the front surface. The second type doped amorphous silicon layer is disposed on the intrinsic amorphous silicon layer. The first type doped crystalline Ge-containing layer is disposed on the rear surface. The pair of electrodes are electrically connected to the second type doped amorphous silicon layer and first type doped crystalline Ge-containing layer, respectively.

    摘要翻译: 光伏电池包括第一掺杂单晶硅衬底,本征非晶硅层,第二掺杂非晶硅层,第一掺杂晶体Ge含量层和一对电极。 第一种掺杂单晶硅衬底具有前表面和后表面。 本征非晶硅层设置在前表面上。 第二类掺杂非晶硅层设置在本征非晶硅层上。 第一类型的掺杂结晶Ge含量层设置在后表面上。 该对电极分别电连接到第二类掺杂非晶硅层和第一掺杂结晶Ge含量层。

    PIXEL STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
    26.
    发明申请
    PIXEL STRUCTURE AND METHOD FOR MANUFACTURING THE SAME 有权
    像素结构及其制造方法

    公开(公告)号:US20110117707A1

    公开(公告)日:2011-05-19

    申请号:US13013887

    申请日:2011-01-26

    IPC分类号: H01L21/336

    CPC分类号: H01L27/1288 H01L27/1214

    摘要: A method for manufacturing a pixel structure is provided. First, a first mask process is performed to form a patterned first metal layer on a substrate, wherein the patterned first metal layer includes a gate. Next, a second mask process is performed to form a patterned insulating layer and a patterned semiconductor layer over the gate, wherein the patterned insulating layer is disposed on the patterned first metal layer, and the patterned semiconductor layer is disposed on the patterned insulating layer. Then, a third mask process is performed to define a thin film transistor (TFT) and a pixel electrode connected thereto and to form a passivation layer to cover the TFT.

    摘要翻译: 提供了一种用于制造像素结构的方法。 首先,执行第一掩模处理以在基板上形成图案化的第一金属层,其中图案化的第一金属层包括栅极。 接下来,执行第二掩模处理以在栅极上形成图案化绝缘层和图案化半导体层,其中图案化绝缘层设置在图案化的第一金属层上,并且图案化的半导体层设置在图案化的绝缘层上。 然后,执行第三掩模处理以限定连接到其上的薄膜晶体管(TFT)和像素电极,并形成覆盖TFT的钝化层。

    Bottom-Gate Thin Film Transistor and Method of Fabricating the Same
    27.
    发明申请
    Bottom-Gate Thin Film Transistor and Method of Fabricating the Same 有权
    底栅薄膜晶体管及其制造方法

    公开(公告)号:US20110012114A1

    公开(公告)日:2011-01-20

    申请号:US12893063

    申请日:2010-09-29

    IPC分类号: H01L29/786

    摘要: A bottom-gate thin film transistor includes a gate electrode, a gate insulating layer and a microcrystalline silicon layer. The gate electrode is disposed on a substrate. The gate insulating layer is made up of silicon nitride and disposed on the gate electrode and the substrate. The microcrystalline silicon layer is disposed on the gate insulating layer and corresponds to the gate electrode, in which a contact interface between the gate insulating layer and the microcrystalline silicon layer has a plurality of oxygen atoms, and concentration of the oxygen atoms ranges between 1020 atoms/cm3 and 1025 atoms/cm3. A method of fabricating a bottom-gate thin film transistor is also disclosed herein.

    摘要翻译: 底栅薄膜晶体管包括栅电极,栅极绝缘层和微晶硅层。 栅电极设置在基板上。 栅极绝缘层由氮化硅构成并且设置在栅电极和基板上。 微晶硅层设置在栅极绝缘层上,对应于栅电极,其中栅极绝缘层和微晶硅层之间的接触界面具有多个氧原子,氧原子的浓度范围在1020原子之间 / cm3和1025原子/ cm3。 本文还公开了制造底栅薄膜晶体管的方法。

    Active Device Array Substrate and Method for Fabricating the Same
    28.
    发明申请
    Active Device Array Substrate and Method for Fabricating the Same 有权
    有源器件阵列基板及其制造方法

    公开(公告)号:US20100279450A1

    公开(公告)日:2010-11-04

    申请号:US12835874

    申请日:2010-07-14

    IPC分类号: H01L21/28

    CPC分类号: H01L27/1288 H01L27/124

    摘要: An active device array substrate and its fabricating method are provided. According to the subject invention, the elements of an array substrate such as the thin film transistors, gate lines, gate pads, data lines, data pads and storage electrodes, are provided by forming a patterned first metal layer, an insulating layer, a patterned semiconductor layer and a patterned metal multilayer. Furthermore, the subject invention uses the means of selectively etching certain layers. Using the aforesaid means, the array substrate of the subject invention has some layers with under-cut structures, and thus, the number of the time-consuming and complicated mask etching process involved in the production of an array substrate can be reduced. The subject invention provides a relatively simple and time-saving method for producing an array substrate.

    摘要翻译: 提供一种有源器件阵列衬底及其制造方法。 根据本发明,诸如薄膜晶体管,栅极线,栅极焊盘,数据线,数据焊盘和存储电极之类的阵列基板的元件通过形成图案化的第一金属层,绝缘层,图案化 半导体层和图案化金属多层。 此外,本发明使用选择性蚀刻某些层的方法。 使用上述方法,本发明的阵列基板具有一些具有欠切割结构的层,因此可以减少在阵列基板的制造中涉及的耗时且复杂的掩模蚀刻工艺的数量。 本发明提供了用于制造阵列基板的相对简单且省时的方法。

    Method of manufacturing active matrix array structure
    29.
    发明授权
    Method of manufacturing active matrix array structure 有权
    有源矩阵阵列结构的制造方法

    公开(公告)号:US07754547B2

    公开(公告)日:2010-07-13

    申请号:US12102027

    申请日:2008-04-14

    IPC分类号: H01L21/00

    摘要: An active matrix array structure, disposed on a substrate, includes a first patterned conductive layer, a patterned gate insulating layer, a patterned semiconductor layer, a second patterned conductive layer, a patterned overcoat layer and a transparent conductive layer. The patterned gate insulating layer has first openings that expose a part of the first patterned conductive layer. The patterned semiconductor layer is disposed on the patterned gate insulating layer. The second patterned conductive layer is disposed on the patterned semiconductor layer. The patterned overcoat layer has second openings that expose a part of the first patterned conductive layer and a part of the second patterned conductive layer. The transparent conductive layer is completely disposed on the substrate. The transparent conductive layer disposed in the first openings and the second openings is broken off at a position that is in between the substrate and the patterned overcoat layer.

    摘要翻译: 设置在基板上的有源矩阵阵列结构包括第一图案化导电层,图案化栅极绝缘层,图案化半导体层,第二图案化导电层,图案化外涂层和透明导电层。 图案化栅极绝缘层具有暴露第一图案化导电层的一部分的第一开口。 图案化的半导体层设置在图案化的栅极绝缘层上。 第二图案化导电层设置在图案化的半导体层上。 图案化的外涂层具有暴露第一图案化导电层的一部分和第二图案化导电层的一部分的第二开口。 透明导电层完全设置在基板上。 设置在第一开口和第二开口中的透明导电层在基板和图案化外涂层之间的位置处断开。

    Pixel structure and method for manufacturing the same
    30.
    发明申请
    Pixel structure and method for manufacturing the same 有权
    像素结构及其制造方法

    公开(公告)号:US20100051954A1

    公开(公告)日:2010-03-04

    申请号:US12591019

    申请日:2009-11-05

    IPC分类号: H01L33/00 H01L31/0224

    CPC分类号: H01L27/1288 H01L27/1214

    摘要: A method for manufacturing a pixel structure is provided. First, a first mask process is performed to form a patterned first metal layer on a substrate, wherein the patterned first metal layer includes a gate. Next, a second mask process is performed to form a patterned insulating layer and a patterned semiconductor layer over the gate, wherein the patterned insulating layer is disposed on the patterned first metal layer, and the patterned semiconductor layer is disposed on the patterned insulating layer. Then, a third mask process is performed to define a thin film transistor (TFT) and a pixel electrode connected thereto and to form a passivation layer to cover the TFT.

    摘要翻译: 提供了一种用于制造像素结构的方法。 首先,执行第一掩模处理以在基板上形成图案化的第一金属层,其中图案化的第一金属层包括栅极。 接下来,执行第二掩模处理以在栅极上形成图案化绝缘层和图案化半导体层,其中图案化绝缘层设置在图案化的第一金属层上,并且图案化的半导体层设置在图案化的绝缘层上。 然后,执行第三掩模处理以限定连接到其上的薄膜晶体管(TFT)和像素电极,并形成覆盖TFT的钝化层。