Method for programming memory device and associated memory device
    22.
    发明授权
    Method for programming memory device and associated memory device 有权
    用于编程存储器件和相关存储器件的方法

    公开(公告)号:US09478288B1

    公开(公告)日:2016-10-25

    申请号:US14687998

    申请日:2015-04-16

    Abstract: A method for programming a memory device comprises the following steps: performing an interleaving programming, including: programming a first memory cell during a first time interval and correspondingly verifying the first memory cell during a second time interval; programming a second memory cell during a third time interval and correspondingly verifying the second memory cell during a fourth time interval between the first and second time intervals; and inserting at least one dummy cycle between the first and second time intervals to ensure that a resistance change per unit of time of the first memory cell is less than a threshold.

    Abstract translation: 一种用于编程存储器件的方法包括以下步骤:执行交织编程,包括:在第一时间间隔期间对第一存储器单元进行编程,并在第二时间间隔内相应地验证第一存储器单元; 在第三时间间隔期间编程第二存储器单元,并在第一和第二时间间隔之间的第四时间间隔期间相应地验证第二存储器单元; 以及在所述第一和第二时间间隔之间插入至少一个虚拟周期,以确保所述第一存储单元的每单位时间的电阻变化小于阈值。

    METHOD FOR PROGRAMMING MEMORY DEVICE AND ASSOCIATED MEMORY DEVICE
    23.
    发明申请
    METHOD FOR PROGRAMMING MEMORY DEVICE AND ASSOCIATED MEMORY DEVICE 有权
    编程存储器件和相关存储器件的方法

    公开(公告)号:US20160307627A1

    公开(公告)日:2016-10-20

    申请号:US14687998

    申请日:2015-04-16

    Abstract: A method for programming a memory device comprises the following steps: performing an interleaving programming, including: programming a first memory cell during a first time interval and correspondingly verifying the first memory cell during a second time interval; programming a second memory cell during a third time interval and correspondingly verifying the second memory cell during a fourth time interval between the first and second time intervals; and inserting at least one dummy cycle between the first and second time intervals to ensure that a resistance change per unit of time of the first memory cell is less than a threshold.

    Abstract translation: 一种用于编程存储器件的方法包括以下步骤:执行交织编程,包括:在第一时间间隔期间对第一存储器单元进行编程,并在第二时间间隔内相应地验证第一存储器单元; 在第三时间间隔期间编程第二存储器单元,并在第一和第二时间间隔之间的第四时间间隔期间相应地验证第二存储器单元; 以及在所述第一和第二时间间隔之间插入至少一个虚拟周期,以确保所述第一存储单元的每单位时间的电阻变化小于阈值。

    Memory disturb reduction for nonvolatile memory
    26.
    发明授权
    Memory disturb reduction for nonvolatile memory 有权
    非易失性存储器的存储器干扰减少

    公开(公告)号:US09025375B2

    公开(公告)日:2015-05-05

    申请号:US14060296

    申请日:2013-10-22

    Abstract: Technology is described that supports reduced program disturb of nonvolatile memory. A three/two dimensional NAND array includes a plurality of pages, which are divided into a plurality of page groups. Access is allowed to memory cells within a first page group of a plurality of page groups in an erase block of the three dimensional NAND array, while access is minimized to memory cells within a second page group of the plurality of page groups in the erase block of the three/two dimensional NAND array. Pages in the same page group are physically nonadjacent with each other in the three/two dimensional NAND array.

    Abstract translation: 描述了支持减少非易失性存储器的程序干扰的技术。 三/二维NAND阵列包括被分成多个页组的多页。 允许访问在三维NAND阵列的擦除块中的多个寻呼组的第一页组内的存储单元,同时访问最小化到擦除块中的多个页组的第二页组内的存储单元 的三/二维NAND阵列。 同一页组中的页面在三维/二维NAND阵列中彼此物理上不相邻。

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