公开(公告)号：US4872187A

公开(公告)日：1989-10-03

申请号：US156179

申请日：1988-02-16

申请人： Kozo Nakahata ,  Toshimitsu Hamada ,  Yasuo Nakagawa ,  Mineo Nomoto

发明人： Kozo Nakahata ,  Toshimitsu Hamada ,  Yasuo Nakagawa ,  Mineo Nomoto

IPC分类号： G01N23/04 ,  G01N23/18

CPC分类号： G01N23/18 ,  G01N23/046 ,  G01N2223/419

摘要： In an X-ray tomographic imaging system and method, an object to be inspected is irradiated with X-rays from an X-ray source to obtain an X-ray transmission image of the object. The X-ray transmission image is converted by an X-ray fluorescence image intensifier into a detection image. The intensity of the detection image is also intensified by the X-ray fluorescence image intensifier. A photo-electric converter converts the intensified detection image from the X-ray fluorescence image intensifier into an electrical signal. The object to be inspected is held by an object holder rotatably at a position in proximity to the X-ray source and movably in a direction of the axis of rotation of the object and a direction perpendicular to the rotation axis. The electrical signal from the photo-electric converter is processed to a cross-sectional image.

摘要翻译： 在X射线层析成像系统和方法中，从X射线源照射X射线检查对象物，得到被检体的X射线透过图像。 通过X射线荧光图像增强器将X射线透射图像转换成检测图像。 X射线荧光图像增强器也增强了检测图像的强度。 光电转换器将强化的检测图像从X射线荧光图像增强器转换成电信号。 待检查对象由物体保持器可旋转地保持在靠近X射线源的位置，并且可沿物体的旋转轴线和垂直于旋转轴线的方向移动。 来自光电转换器的电信号被处理成横截面图像。

公开(公告)号：US20140183126A1

公开(公告)日：2014-07-03

申请号：US14237134

申请日：2012-08-10

申请人： Shinichi CHikura ,  Yasuhiro Uda ,  Toshimitsu Hamada

发明人： Shinichi CHikura ,  Yasuhiro Uda ,  Toshimitsu Hamada

IPC分类号： B01D29/13

CPC分类号： B01D29/13 ,  B01D63/106 ,  B01D63/12 ,  B01D2201/291 ,  B01D2201/293 ,  B01D2313/08 ,  B01D2313/10 ,  B01D2313/13 ,  B01D2313/21

摘要： An end member (3A) for a spiral separation membrane element includes: an inner annular portion (31); an outer annular portion (32) surrounding the inner annular portion (31) at a distance from the inner annular portion (31); a plurality of connecting portions (33) connecting the inner annular portion (31) and the outer annular portion (32); and a shield plate (34) disposed between at least one pair of the connecting portions (33) and forming an opening (41) between the shield plate (34) and the outer annular portion (32). According to this configuration, a radially outwardly spreading flow is formed by the shield plate (34), and therefore suspended solids in a feed liquid can be effectively directed to the peripheral region.

摘要翻译： 用于螺旋分离膜元件的端部构件（3A）包括：内部环形部分（31）; 围绕所述内环形部分（31）与所述内环形部分（31）相距一定距离的外环形部分（32）; 连接所述内部环形部分（31）和所述外部环形部分（32）的多个连接部分（33）; 以及设置在至少一对所述连接部分（33）之间并在所述屏蔽板（34）和所述外部环形部分（32）之间形成开口（41）的屏蔽板（34）。 根据该结构，由屏蔽板（34）形成径向向外扩展的流动，因此能够将进料液中的悬浮固体有效地导向周边区域。

公开(公告)号：US20130220915A1

公开(公告)日：2013-08-29

申请号：US13876611

申请日：2011-09-27

申请人： Shinichi Chikura ,  Toshimitsu Hamada

发明人： Shinichi Chikura ,  Toshimitsu Hamada

IPC分类号： B01D63/10 ,  B01D63/00

CPC分类号： B01D63/10 ,  B01D63/00 ,  B01D2313/12 ,  B01D2313/13

摘要： Provided is a separation membrane element used under a high-temperature environment, in which the stress acting on a portion for fixing between a fluid collecting tube and a separation membrane is reduced and a deformation caused by receiving a long time thermal history can be prevented, and also provided is a fluid collecting tube used for the separation membrane element. The separation membrane element has a fluid collecting tube (10), a separation membrane, and fixing portions (4) provided at at least two places and fixing between the fluid collecting tube (10) and the separation membrane. The separation membrane element has at least one elastic portion in the fluid collecting tube (10) between the fixing portions (4).

摘要翻译： 提供了在高温环境下使用的分离膜元件，其中作用在用于在流体收集管和分离膜之间固定的部分的应力减小并且可以防止由于接收长时间的热历史引起的变形， 并且还提供了用于分离膜元件的流体收集管。 分离膜元件具有流体收集管（10），分离膜和设置在至少两个位置并固定在流体收集管（10）和分离膜之间的固定部分（4）。 分离膜元件在固定部分（4）之间的流体收集管（10）中具有至少一个弹性部分。

公开(公告)号：US20130186819A1

公开(公告)日：2013-07-25

申请号：US13877030

申请日：2011-09-13

申请人： Shinichi Chikura ,  Toshimitsu Hamada ,  Yasuhiro Uda ,  Hideyuki Yamane ,  Kazuhito Yoshida ,  Masashi Beppu ,  Masakatsu Takata

发明人： Shinichi Chikura ,  Toshimitsu Hamada ,  Yasuhiro Uda ,  Hideyuki Yamane ,  Kazuhito Yoshida ,  Masashi Beppu ,  Masakatsu Takata

IPC分类号： B01D65/00

CPC分类号： B01D65/003 ,  B01D63/106 ,  B01D63/12 ,  B01D2313/04 ,  B01D2313/083

摘要： A separation membrane module (1A) includes: a tubular pressure container (7); a plurality of separation membrane elements (2) inserted in the pressure container (7) and each having a first end member (3) and a second end member (4); and a sealing member (5A) mounted on one of or both the first end member (3) and the second end member (4) that are adjacent to each other. In a normal condition, the sealing member (5A) is located radially inward of a maximum diameter portion of the first end member (3) and/or the second end member (4) on which the sealing member (5A) is mounted. The sealing member (5A) is deformed due to contact between the adjacent separation membrane elements (2) or due to supply of a pressurized liquid into the pressure container (7), and comes into close contact with an inner circumferential face (7a) of the pressure container (7).

摘要翻译： 分离膜组件（1A）包括：管状压力容器（7）; 多个分离膜元件（2）插入压力容器（7）中，每个具有第一端部构件（3）和第二端部构件（4）; 以及安装在彼此相邻的第一端构件（3）和第二端构件（4）中的一个或两者上的密封构件（5A）。 在正常情况下，密封构件（5A）位于安装有密封构件（5A）的第一端构件（3）和/或第二端构件（4）的最大直径部分的径向内侧。 密封构件（5A）由于相邻的隔离膜元件（2）之间的接触而变形，或者由于向压力容器（7）供应加压液体而变形，并且与密封构件（5A）的内周面（7a）紧密接触 压力容器（7）。

公开(公告)号：US20100326901A1

公开(公告)日：2010-12-30

申请号：US12918163

申请日：2009-02-20

申请人： Shinichi Chikura ,  Toshimitsu Hamada ,  Masashi Beppu ,  Yasuhiro Uda ,  Masakatsu Takata

发明人： Shinichi Chikura ,  Toshimitsu Hamada ,  Masashi Beppu ,  Yasuhiro Uda ,  Masakatsu Takata

IPC分类号： B01D63/00 ,  B01D63/10 ,  C02F1/44 ,  B23P17/04

CPC分类号： B01D63/12 ,  B01D65/00 ,  B01D2313/04 ,  B01D2313/06 ,  B01D2313/20 ,  Y10T29/49826

摘要： Provided are a pressure vessel for a membrane element in which the membrane element can be easily mounted, a membrane filtration apparatus equipped with the pressure vessel for a membrane element, and a method for manufacturing a membrane filtration apparatus. A rail (protrusion) 60 is formed on the inner circumferential surface of the pressure vessel 40 in such a manner that a ridge line 61 extends along the insertion direction of the membrane element. Consequently, the membrane element 10 can be inserted into the pressure vessel 40 so as to be in a sliding contact onto the ridge line 61 of the rail 60 formed on the inner circumferential surface of the pressure vessel 40. Therefore, the frictional resistance can be reduced as compared with conventional ways, so that the membrane element 10 can be easily mounted onto the pressure vessel 40.

摘要翻译： 本发明提供一种用于膜元件易于安装的膜元件的压力容器，配备有用于膜元件的压力容器的膜过滤装置以及膜过滤装置的制造方法。 在压力容器40的内周面上形成轨道（突起）60，棱线61沿着膜元件的插入方向延伸。 因此，可以将膜元件10插入到压力容器40中，以与滑动接触在形成在压力容器40的内周面上的轨道60的脊线61上。因此，摩擦阻力可以 与常规方式相比减少，使得膜元件10可以容易地安装到压力容器40上。

公开(公告)号：US06542830B1

公开(公告)日：2003-04-01

申请号：US09142546

申请日：1998-09-10

申请人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

发明人： Fumio Mizuno ,  Seiji Isogai ,  Kenji Watanabe ,  Yasuhiro Yoshitake ,  Terushige Asakawa ,  Yuichi Ohyama ,  Hidekuni Sugimoto ,  Seiji Ishikawa ,  Masataka Shiba ,  Jun Nakazato ,  Makoto Ariga ,  Tetsuji Yokouchi ,  Toshimitsu Hamada ,  Ikuo Suzuki ,  Masami Ikota ,  Mari Nozoe ,  Isao Miyazaki ,  Yoshiharu Shigyo

IPC分类号： H01L2166

CPC分类号： H01L22/20 ,  G01N21/9501 ,  G01R31/2894 ,  G01R33/06 ,  H01L2223/54466 ,  H01L2924/0002 ,  H01L2924/00

摘要： A process management system in accordance with the present invention includes inspection apparatuses for inspecting defects on a wafer, the inspection apparatuses being connected through a communication network, inspection information and image information obtained from these inspection apparatuses being collected to construct a data base and an image file, therein definition of defects is given by combinations of elements which characterize the defect based on the inspection information and the image information obtained from the inspection apparatuses. By giving definition of the defect, characteristics of the defect can be subdivided and known. Therefore, the cause of a defect can be studied.

摘要翻译： 根据本发明的处理管理系统包括用于检查晶片上的缺陷的检查装置，通过通信网络连接的检查装置，从这些检查装置获得的检查信息和图像信息被收集以构建数据库和图像 文件，其中缺陷的定义通过基于检查信息和从检查装置获得的图像信息来表征缺陷的元件的组合来给出。 通过给出缺陷的定义，可以细分和知道缺陷的特征。 因此，可以研究缺陷的原因。

公开(公告)号：US6002989A

公开(公告)日：1999-12-14

申请号：US831298

申请日：1997-04-01

申请人： Masataka Shiba ,  Kenji Watanabe ,  Toshimitsu Hamada ,  Seiji Ishikawa ,  Naoki Go ,  Toshiaki Yachi ,  Tetsuya Watanabe ,  Takahiro Jingu

发明人： Masataka Shiba ,  Kenji Watanabe ,  Toshimitsu Hamada ,  Seiji Ishikawa ,  Naoki Go ,  Toshiaki Yachi ,  Tetsuya Watanabe ,  Takahiro Jingu

IPC分类号： G01N21/84 ,  B23Q41/08 ,  G05B19/418 ,  G06Q50/00 ,  G06Q50/04 ,  H01L21/66 ,  G06F15/18

CPC分类号： H01L22/20 ,  G05B19/41875 ,  H01L22/12 ,  H01L2924/0002 ,  Y02P90/14 ,  Y02P90/18 ,  Y02P90/22

摘要： Inspection apparatuses of an inspection apparatus group are connected to a network and transfer inspected result to a data collection system. The same wafer selected from a specific process is inspected by the different inspection apparatuses and the inspected data are collected and analyzed to calculate a correlation degree among the inspection apparatuses. On the other hand, the course of occurrence of failures in the same process can be analyzed to thereby calculate an average occurrence frequency of failures. An optimum inspection apparatus and inspection frequency are successively obtained on the basis of calculated results of an inter-apparatus correlation degree calculation process and a failure occurrence frequency calculation process, so that a feeding method of wafers to the inspection apparatus group is indicated through an inspection apparatus group management system. In the manufacturing of electronic components, complicated conditions such as the optimum inspection apparatus to be applied, the inspection frequency and the like can be set easily and the expected total loss value can be minimized to improve the economical efficiency of inspection remarkably.

摘要翻译： 检查装置组的检查装置连接到网络并将检查结果传送到数据收集系统。 通过不同的检查装置检查从具体处理中选出的相同的晶片，收集和分析检查数据，以计算检查装置之间的相关度。 另一方面，可以分析相同处理中的故障发生的过程，从而计算故障的平均发生频率。 基于设备间相关度计算处理和故障发生频率计算处理的计算结果连续获得最佳检查装置和检查频率，从而通过检查来指示晶片向检查装置组的馈送方法 设备组管理系统。 在电子部件的制造中，可以容易地设定诸如要应用的最佳检查装置等复杂的条件，并且可以将预期的总损失值最小化，从而提高检查的经济性。

公开(公告)号：US5493594A

公开(公告)日：1996-02-20

申请号：US207796

申请日：1994-03-07

申请人： Toshimitsu Hamada ,  Kozo Nakahata ,  Yoshifumi Morioka

发明人： Toshimitsu Hamada ,  Kozo Nakahata ,  Yoshifumi Morioka

IPC分类号： G01N23/04 ,  B23K1/00 ,  G01N23/18 ,  H05K1/18 ,  H05K3/34 ,  G01N23/02

CPC分类号： G01N23/04

摘要： A method and apparatus for inspecting a solder joint by an X-ray fluoroscopic image in which an X-ray is irradiated on an object to be inspected located by a specimen stage and having a lead of an electronic part soldered to a substrate to detect an X-ray fluoroscopic image signal, a position of a lead in a tip direction is obtained by a distribution of projection with said X-ray fluoroscopic image signal projected in a lead row direction, a position of a lead in a row direction is obtained by a distribution of projection with said X-ray fluoroscopic image projected in a lead tip direction to extract a position of a solder joint as an object to be inspected, and said X-ray fluoroscopic image is evaluated every solder joint in accordance with the postion information to effect a defect detection.

摘要翻译： 一种用于通过X射线透视图像来检查焊点的方法和装置，其中X射线被照射在被检体的位置上，并且具有被焊接到基底的电子部件的引线以检测 X射线透视图像信号，通过在引导行方向上投影的所述X射线透视图像信号的投影分布来获得尖端方向上的引线位置，通过以下方式获得引线在行方向上的位置： 利用所述X射线透视图像在引线尖端方向上投射的突起的分布，以提取作为被检查对象的焊点的位置，并且根据位置信息对每个焊点评估所述X射线透视图像 以实现缺陷检测。

公开(公告)号：US4772125A

公开(公告)日：1988-09-20

申请号：US875974

申请日：1986-06-19

申请人： Kazushi Yoshimura ,  Takashi Hiroi ,  Takanori Ninomiya ,  Toshimitsu Hamada ,  Yasuo Nakagawa ,  Kohichi Karasaki

发明人： Kazushi Yoshimura ,  Takashi Hiroi ,  Takanori Ninomiya ,  Toshimitsu Hamada ,  Yasuo Nakagawa ,  Kohichi Karasaki

IPC分类号： G01B11/24 ,  G01N21/64 ,  G01N21/88 ,  G01N21/956 ,  G06T7/00

CPC分类号： G06T7/0006 ,  G01N21/95684 ,  G01N2021/95646 ,  G01N21/64 ,  G06T2207/10064 ,  G06T2207/30152

摘要： An apparatus for inspecting an appearance of soldered portions connected between the pads formed on a printed circuit board and leads of an electronic body part. A slit light beam is directed to portions to be inspected and scanned thereon with a light fluorescent image generated from the substrate portion of the printed circuit board and a dark fluorescent image generated from the leads, pads and soldered portions being detected with an image signal being generated in accordance therewith. The image signal is binarized and different functions are extracted from the binarized signal which functions are utilized in connection with other functions and previously obtained data to determine whether an abnormal portion is present or not in a predetermined position on the circuit board.

摘要翻译： 一种用于检查连接在形成在印刷电路板上的焊盘和电子主体部分的引线之间的焊接部分的外观的装置。 利用从印刷电路板的基板部分产生的荧光图像将狭缝光束引导到要检查和扫描的部分，并且从引线，焊盘和焊接部分产生的暗荧光图像被图像信号检测到 根据其产生。 图像信号被二值化，并且从二值化信号中提取不同的功能，该功能与其他功能相关联使用，并且先前获得的数据用于确定在电路板上的预定位置是否存在异常部分。

公开(公告)号：US4744047A

公开(公告)日：1988-05-10

申请号：US793219

申请日：1985-10-31

申请人： Keiichi Okamoto ,  Toshimitsu Hamada ,  Mineo Nomoto

发明人： Keiichi Okamoto ,  Toshimitsu Hamada ,  Mineo Nomoto

IPC分类号： G06K9/00 ,  G01R31/28 ,  G06F11/00 ,  G06F15/70

CPC分类号： G01R31/281

摘要： An apparatus for testing printed wiring patterns for use in combination with an apparatus including a plurality of dedicated pattern generators for generating arcuate wiring patterns. In contrast to the conventional LSI pattern inspection effected with design data being inputted, the apparatus can inspect the pattern including curved portions peculiar to the printed wiring pattern. Although the conventional LSI inspection technique involves an impracticably increased amount of design data, the invention allows the test or inspection to be performed at a high speed with an improved reliability and can be applied to the inspection of any pattern including arcuate patterns. By inputting graphic data in conformance with the order for generating patterns, pattern generation can be accomplished not only through ordinary raster scan but also by other various scanning methods.

摘要翻译： 一种用于测试印刷布线图案的装置，用于与包括用于产生弓形布线图案的多个专用图案发生器的装置组合使用。 与通过输入设计数据进行的常规LSI图案检查相反，该设备可以检查包括印刷布线图案特有的弯曲部分的图案。 虽然传统的LSI检测技术涉及到不切实际地增加的设计数据量，但是本发明允许以高速度提高测试或检查的可靠性，并且可以应用于包括弧形图案的任何图案的检查。 通过根据生成图案的顺序输入图形数据，不仅可以通过普通光栅扫描也可以通过其他各种扫描方法来实现图案生成。