COENZYME Q10-CONTAINING WATER-SOLUBLE COMPOSITION AND PROCESS FOR PRODUCTION THEREOF
    23.
    发明申请
    COENZYME Q10-CONTAINING WATER-SOLUBLE COMPOSITION AND PROCESS FOR PRODUCTION THEREOF 失效
    COYZYME Q10-含水溶性组合物及其生产方法

    公开(公告)号:US20100284983A1

    公开(公告)日:2010-11-11

    申请号:US11917454

    申请日:2006-06-14

    摘要: A coenzyme Q10-containing water soluble composition comprises coenzyme Q10, a hydrophilic polyglycerol fatty acid ester, a lipophilic sucrose fatty acid ester and an aqueous phase component and a process for producing the same are disclosed. A coenzyme Q10-containing water-soluble dry powder can be obtained by drying the above-mentioned coenzyme Q10-containing water soluble composition. A food, functional food, beverage, pharmaceutical product, quasi drug, cosmetic, or animal food can be obtained by using the above-mentioned coenzyme Q10-containing water soluble composition or the above-mentioned coenzyme Q10-containing water-soluble dry powder. The coenzyme Q10-containing water soluble composition has a high bioavailability, and maintains a stable emulsion form for a long period of time from refrigeration temperature to room temperature and allows efficient supply.

    摘要翻译: 含有辅酶Q10的水溶性组合物包括辅酶Q10,亲水性聚甘油脂肪酸酯,亲脂性蔗糖脂肪酸酯和水相成分及其制造方法。 可以通过干燥上述含有辅酶Q10的水溶性组合物来获得含辅酶Q10的水溶性干粉。 可以通过使用上述含有辅酶Q10的水溶性组合物或上述含有辅酶Q10的水溶性干粉来获得食品,功能性食品,饮料,药物,准药物,化妆品或动物性食品。 含有辅酶Q10的水溶性组合物具有高的生物利用度,并且从制冷温度到室温长时间保持稳定的乳液形式并且可以有效地供应。

    Semiconductor device and method for manufacturing the same
    27.
    发明授权
    Semiconductor device and method for manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US08779418B2

    公开(公告)日:2014-07-15

    申请号:US12900136

    申请日:2010-10-07

    IPC分类号: H01L29/12

    摘要: An object is to provide a thin film transistor having favorable electric characteristics and a semiconductor device including the thin film transistor as a switching element. The thin film transistor includes a gate electrode formed over an insulating surface, a gate insulating film over the gate electrode, an oxide semiconductor film which overlaps with the gate electrode over the gate insulating film and which includes a layer where the concentration of one or a plurality of metals contained in the oxide semiconductor is higher than that in other regions, a pair of metal oxide films formed over the oxide semiconductor film and in contact with the layer, and a source electrode and a drain electrode in contact with the metal oxide films. The metal oxide films are formed by oxidation of a metal contained in the source electrode and the drain electrode.

    摘要翻译: 目的是提供一种具有良好电特性的薄膜晶体管和包括薄膜晶体管作为开关元件的半导体器件。 薄膜晶体管包括形成在绝缘表面上的栅极电极,栅电极上的栅极绝缘膜,与栅极绝缘膜上的栅电极重叠的氧化物半导体膜,并且包括其中浓度为1或 包含在氧化物半导体中的多种金属高于其他区域,形成在氧化物半导体膜上并与该层接触的一对金属氧化物膜,以及与金属氧化物膜接触的源电极和漏电极 。 金属氧化物膜通过氧化源电极和漏电极中所含的金属而形成。

    Semiconductor device and method for manufacturing the same
    28.
    发明授权
    Semiconductor device and method for manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US08492757B2

    公开(公告)日:2013-07-23

    申请号:US12717324

    申请日:2010-03-04

    IPC分类号: H01L29/10

    摘要: It is an object to provide a highly reliable semiconductor device including a thin film transistor with stable electric characteristics. In a semiconductor device including an inverted staggered thin film transistor whose semiconductor layer is an oxide semiconductor layer, a buffer layer is provided over the oxide semiconductor layer. The buffer layer is in contact with a channel formation region of the semiconductor layer and source and drain electrode layers. A film of the buffer layer has resistance distribution. A region provided over the channel formation region of the semiconductor layer has lower electrical conductivity than the channel formation region of the semiconductor layer, and a region in contact with the source and drain electrode layers has higher electrical conductivity than the channel formation region of the semiconductor layer.

    摘要翻译: 本发明的目的是提供一种包括具有稳定电特性的薄膜晶体管的高度可靠的半导体器件。 在包括半导体层为氧化物半导体层的反交错薄膜晶体管的半导体器件中,在氧化物半导体层上设置有缓冲层。 缓冲层与半导体层的沟道形成区域和源极和漏极电极层接触。 缓冲层的膜具有电阻分布。 设置在半导体层的沟道形成区域上的区域具有比半导体层的沟道形成区域更低的导电性,并且与源极和漏极电极层接触的区域具有比半导体的沟道形成区域更高的导电性 层。