公开(公告)号：US09581675B2

公开(公告)日：2017-02-28

申请号：US13773253

申请日：2013-02-21

Applicant: Tektronix, Inc.

Inventor： Laudie J. Doubrava ,  Josiah A. Bartlett

IPC: G01R35/00 ,  G01R31/319

CPC classification number: G01R35/005 ,  G01R27/28 ,  G01R31/3191

Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.

Abstract translation: 系统和方法可以允许信号测量仪器的操作者用不支持的连接器类型来表征和校准网络，例如不可追溯到已知的标准。 具有支持和不支持接口的适配器可用于测量被测系统中网络的系统响应。 这些测量可以在数学上级联以推导出产生精确和完全校准的总系统响应的虚拟模型。

公开(公告)号：US08723530B2

公开(公告)日：2014-05-13

申请号：US13854566

申请日：2013-04-01

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Lester L. Larson ,  Scott R. Jansen ,  Kenneth P. Dobyns ,  Michael Duane Stevens

IPC: G01R35/00

CPC classification number: G01R35/005 ,  G01R1/06766

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统提供极零对，以保持信号采集系统频率带宽的平坦度。

公开(公告)号：US12210039B2

公开(公告)日：2025-01-28

申请号：US17721294

申请日：2022-04-14

Applicant: Tektronix, Inc.

Inventor： Joshua J. O'Brien ,  Josiah A. Bartlett

IPC: G01R1/067 ,  G01R1/10 ,  G01R31/10

Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.

公开(公告)号：US20240353447A1

公开(公告)日：2024-10-24

申请号：US18645352

申请日：2024-04-24

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Charles Adrian Hwang ,  Mark A. Norris

IPC: G01R13/02

CPC classification number: G01R13/0218

Abstract: A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die

公开(公告)号：US11815548B2

公开(公告)日：2023-11-14

申请号：US17379940

申请日：2021-07-19

Applicant: Tektronix, Inc.

Inventor： Charles W. Case ,  Daniel G. Knierim ,  Joshua J. O'Brien ,  Josiah A. Bartlett ,  Julie A. Campbell

IPC: G01R31/28 ,  G01R29/26

CPC classification number: G01R31/2886 ,  G01R29/26

Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.

公开(公告)号：US11733271B2

公开(公告)日：2023-08-22

申请号：US17478738

申请日：2021-09-17

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett

IPC: G01R15/18 ,  G01R19/10

CPC classification number: G01R15/181 ,  G01R19/10

Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a Rogowski coil having plurality of conductor segments. The plurality of conductor segments are positionable to form a substantially complete loop. A first conductor segment of the plurality of conductor segments is electrically isolated from a second conductor segment of the plurality of conductor segments.

公开(公告)号：US11719721B2

公开(公告)日：2023-08-08

申请号：US17251179

申请日：2019-06-11

Applicant: Tektronix, Inc.

Inventor： Karl A. Rinder ,  David A. Sailor ,  Josiah A. Bartlett

IPC: G01R1/067 ,  G01R1/02 ,  G01R1/04 ,  G01R31/302

CPC classification number: G01R1/06788 ,  G01R1/025 ,  G01R1/04 ,  G01R31/3025

Abstract: A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

公开(公告)号：US11619657B2

公开(公告)日：2023-04-04

申请号：US17099701

申请日：2020-11-16

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Amr Haj-Omar ,  Donald J. Dalebroux ,  Barton T. Hickman ,  Alexander Krauska

IPC: G01R13/02 ,  G01R13/22

Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

公开(公告)号：US20220390513A1

公开(公告)日：2022-12-08

申请号：US17832535

申请日：2022-06-03

Applicant: Tektronix, Inc.

Inventor： Shane A. Hazzard ,  Ajaiey Kumar Sharma ,  Timothy E. Bieber ,  John Marrinan ,  Andrew McCann ,  Pieter Christiaan Seidel ,  Josiah A. Bartlett

IPC: G01R31/317

Abstract: An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.

公开(公告)号：US20220137091A1

公开(公告)日：2022-05-05

申请号：US17514987

申请日：2021-10-29

Applicant: Tektronix, Inc.

Inventor： Josiah A. Bartlett

IPC: G01R1/02 ,  G01R31/26

Abstract: A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.