公开(公告)号：US11662479B2

公开(公告)日：2023-05-30

申请号：US17325591

申请日：2021-05-20

Applicant: Bruker Nano, Inc.

Inventor： David Lewis Adler ,  Freddie Erich Babian ,  Scott Joseph Jewler

IPC: G01T1/20 ,  G06N20/00 ,  G06F30/398 ,  G01N23/04 ,  G01N23/083 ,  G01N23/18 ,  G06T5/00 ,  G06T7/00 ,  H01L21/67 ,  H05K1/11 ,  H05K3/40 ,  G06F18/24 ,  G06F18/214 ,  G06V10/82 ,  G06F119/18 ,  G06F115/12

CPC classification number: G01T1/20 ,  G01N23/04 ,  G01N23/043 ,  G01N23/083 ,  G01N23/18 ,  G06F18/214 ,  G06F18/24 ,  G06F30/398 ,  G06N20/00 ,  G06T5/007 ,  G06T7/0012 ,  G06T7/0014 ,  G06V10/82 ,  H01L21/67288 ,  H05K1/115 ,  H05K3/4038 ,  G01N2223/04 ,  G01N2223/401 ,  G01N2223/426 ,  G01N2223/505 ,  G01N2223/6466 ,  G06F2115/12 ,  G06F2119/18 ,  G06T2207/10081 ,  G06T2207/10116 ,  G06T2207/20024 ,  G06T2207/20081 ,  G06T2207/20208 ,  G06T2207/30004

Abstract: In one embodiment, a computing system may access design data of a printed circuit board to be produced by a manufacturing process. The system may determine one or more corrections for the design data of the printed circuit board based on one or more correction rules for correcting one or more parameters associated with the printed circuit board. The system may automatically adjust one or more of the parameters associated with the design data of the printed circuit board based on the one or more corrections. The adjusted parameters may be associated with an impedance of the printed circuit board. The one or more corrections may cause the impendence of the printed circuit board to be independent from layer thickness variations of the printed circuit board to be produced by the manufacturing process.

公开(公告)号：US20230153970A1

公开(公告)日：2023-05-18

申请号：US18156448

申请日：2023-01-19

Applicant: CANON KABUSHIKI KAISHA

Inventor： Atsushi IWASHITA ,  Kosuke TERUI ,  Ryuichi FUJIMOTO

IPC: G06T5/50 ,  G01N23/083 ,  G01N23/04 ,  G06T7/11 ,  G06T7/60

CPC classification number: G06T5/50 ,  G01N23/083 ,  G01N23/04 ,  G06T7/11 ,  G06T7/60 ,  G01N2223/505 ,  G01N2223/04 ,  G01N2223/401 ,  G06T2207/20021 ,  G06T2207/10121 ,  G06T2207/30008 ,  G06T2207/20224

Abstract: An image processing apparatus comprises a processing unit configured to performing energy subtraction processing using information concerning a plurality of attenuation rates corresponding to a plurality of radiation energies that are different from each other and are obtained by performing imaging in which an object is irradiated with radiation. The processing unit estimates attenuation information of a decomposition target material contained in the object using at least one image obtained by the energy subtraction processing, and generates an image concerning the decomposition target material using the attenuation information and the information concerning the plurality of attenuation rates.

公开(公告)号：US11650338B2

公开(公告)日：2023-05-16

申请号：US17292625

申请日：2019-11-20

Applicant: BAE SYSTEMS plc

Inventor： Lionel William John Kent

IPC: G01T1/208 ,  G01T1/20 ,  G01N23/203 ,  G01T1/40 ,  A61B6/00

CPC classification number: G01T1/208 ,  G01N23/203 ,  G01T1/20185 ,  G01T1/40 ,  A61B6/4258 ,  G01N2223/505 ,  G01N2223/639

Abstract: The scintillation detector assembly 10 comprises a first scintillation detector 11A of a set SSD of scintillation detectors 11, comprising a first scintillator 12A of a set SS of scintillators 12 and a first light sensor 13A of a set SLS of respective light sensors 13 optically coupled thereto, arranged to detect electromagnetic radiation and output a first signal; a first radiation source 14A of a set SRS of radiation sources 14, configured to emit first gamma radiation G1 of a first set SG of gamma radiation G, having a first reference energy RE1 of a set SRE of respective first reference energies RE; and a controller 15 configured to control a gain of the first scintillation detector 11A based, at least in part, on the first gamma radiation, having the first reference energy, detected by the first scintillation detector 11A.

公开(公告)号：US20180136344A1

公开(公告)日：2018-05-17

申请号：US15701088

申请日：2017-09-11

Applicant: Minnesota Imaging and Engineering LLC

Inventor： Robert Sigurd Nelson ,  William Bert Nelson

IPC: G01T1/20 ,  G01N23/046 ,  A61B6/03

CPC classification number: G01T1/2018 ,  A61B6/032 ,  A61B6/037 ,  A61B6/4233 ,  A61B6/4417 ,  A61B8/4416 ,  G01N23/046 ,  G01N2223/419 ,  G01N2223/505

Abstract: Detector module designs for radiographic imaging include first and second layers of scintillator rods or pixel arrays oriented in first and second directions. The first and second directions are transversely oriented to define a light sharing region between the first and second layers. Encoding features may be disposed in, on or between the first and second layers, and configured to modulate propagation of optical signals therealong or therebetween.

公开(公告)号：US20170343701A1

公开(公告)日：2017-11-30

申请号：US15679784

申请日：2017-08-17

Applicant: Halliburton Energy Services, Inc.

Inventor： Imran Sharif Vehra

IPC: G01V5/08 ,  G01T1/202 ,  E21B47/12 ,  E21B49/00 ,  G01N23/203

CPC classification number: G01V5/08 ,  E21B47/12 ,  E21B47/124 ,  E21B49/00 ,  G01N23/203 ,  G01N2223/304 ,  G01N2223/505 ,  G01T1/20 ,  G01T1/2026 ,  G01T1/208

Abstract: A radiation logging tool is provided that includes a scintillator detector for use on a wellbore tool string to characterize earth formations. The scintillator detector has a shutter to allow for the collection of data differentiating between incident radiation, such as backscatter signal, and system noise, such as dark current, vibration noise, electronics thermal noise, and electrostatic noise. The radiation logging tool provides for a method of calibrating and measuring incident radiation by the removal of system noise. The shutter is positioned between the photosensor and scintillation member of the scintillator detector, and is able to switch between open and closed states while the scintillation detector is deployed. Measurements of signal noise can be used to calibrate the sampling signal of incident radiation on the scintillator detector.

公开(公告)号：US09720111B2

公开(公告)日：2017-08-01

申请号：US14188651

申请日：2014-02-24

Applicant: SYMETRICA LIMITED

Inventor： David Ramsden ,  Mark Abbott Foster

IPC: G01T3/08 ,  G01T3/06 ,  G01N23/09 ,  G01T1/20

CPC classification number: G01T3/06 ,  G01N23/09 ,  G01N2223/045 ,  G01N2223/301 ,  G01N2223/505 ,  G01T1/2018 ,  G01T3/08 ,  G01V5/0091

Abstract: An apparatus comprises a neutron detector. The neutron detector comprises a conversion layer comprising a mixture of a neutron absorbing material and a scintillation material; and a photodetector optically coupled to the conversion layer and arranged to detect photons generated as a result of neutron absorption events in the conversion layer; wherein the apparatus is adapted to be carried by a user and the conversion layer is positioned within the neutron detector such that when the apparatus is being carried by a user in normal use neutrons are absorbed in the conversion layer after passing through the user such that the user's body provides a neutron moderating effect. In some cases the apparatus may be carried in association with a backpack or clothing worn by a user, for example, the neutron detector may be sized to fit in a pocket. In other cases the apparatus may be a hand-held device with the conversion layer arranged within a handle of the device to be gripped by a user when being carried.

公开(公告)号：US20170122886A1

公开(公告)日：2017-05-04

申请号：US15337256

申请日：2016-10-28

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Mototsugu SUGIYAMA ,  Toshiyasu SUYAMA

IPC: G01N23/04

CPC classification number: G01N23/04 ,  G01N2223/33 ,  G01N2223/3306 ,  G01N2223/3308 ,  G01N2223/424 ,  G01N2223/505 ,  G01N2223/6113 ,  G01N2223/6116 ,  G01T1/20

Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.

公开(公告)号：US20150276626A1

公开(公告)日：2015-10-01

申请号：US14674133

申请日：2015-03-31

Applicant: Hitachi High-Tech Science Corporation

Inventor： Yoshiki Matoba

IPC: G01N23/083 ,  G01N23/16

CPC classification number: G01N23/083 ,  G01N23/043 ,  G01N23/16 ,  G01N2223/04 ,  G01N2223/505 ,  G01N2223/642 ,  G01N2223/652

Abstract: An X-ray transmission inspection apparatus includes: an X-ray source configured to irradiate a sample with an X-ray; a detector configured to be disposed on a side opposite to the X-ray source with respect to the sample and to detect the X-ray which is transmitted through the sample using a phosphor; a shield member configured to be arranged to face a detection surface of the detector and to block a part of X-rays to partially form a shield area from the X-rays on the detection surface; and a shield moving mechanism configured to move the shield member relative to the detector to enable change of a position of the shield area.

Abstract translation: X射线透射检查装置包括：X射线源，被配置为用X射线照射样品; 检测器，被配置为相对于样品设置在与所述X射线源相对的一侧，并且检测通过使用荧光体透射的样品的X射线; 屏蔽构件，被配置为面对检测器的检测表面并阻挡X射线的一部分以部分地形成与检测表面上的X射线的屏蔽区域; 以及屏蔽移动机构，其构造成相对于所述检测器移动所述屏蔽构件以能够改变所述屏蔽区域的位置。

公开(公告)号：US08866101B1

公开(公告)日：2014-10-21

申请号：US14229128

申请日：2014-03-28

Applicant: FUJIFILM Corporation

Inventor： Keita Watanabe ,  Kentaro Noma ,  Yasufumi Oda

IPC: G01J1/42 ,  H01L27/146 ,  G01N23/04 ,  G01T1/16 ,  H04N5/365

CPC classification number: G01T1/16 ,  G01N23/04 ,  G01N2223/505 ,  H04N5/32 ,  H04N5/347 ,  H04N5/3655 ,  H04N5/3658 ,  H04N5/367

Abstract: Binning readout reads out electric charge accumulated in pixels to signal lines in blocks of a plurality of adjoining pixel-rows. A correction image generator of a line defect corrector scales up an image size of a reference frame image RP outputted by the binning readout and corrects pixel values of the reference frame image RP, to produce a correction image RPC to be used for correction of a line defect occurring in an X-ray image XP. The scale-up is performed by applying row interpolation processing to the reference frame image RP. The correction of the pixel values is performed by multiplying the reference frame image RP after being subjected to the row interpolation processing by a correction coefficient. An adder adds the correction image RPC to the X-ray image XP, and produces an X-ray image XPC in which the line defect is corrected.

Abstract translation: 分箱读出将多个相邻像素行中的块中的以像素累积的电荷读出为信号线。 线缺陷校正器的校正图像生成器对通过合并读出输出的参考帧图像RP的图像尺寸进行放大，并校正参考帧图像RP的像素值，以产生用于校正线的校正图像RPC 在X射线图像XP中出现缺陷。 通过对参考帧图像RP应用行内插处理来执行放大。 像素值的校正是通过将进行行内插处理后的基准帧图像RP乘以校正系数来进行的。 加法器将校正图像RPC添加到X射线图像XP，并产生校正线缺陷的X射线图像XPC。

公开(公告)号：US20140110590A1

公开(公告)日：2014-04-24

申请号：US13656918

申请日：2012-10-22

Applicant: TROXLER ELECTRONIC LABORATORIES, INC.

Inventor： Wewage Hiran Linus Dep ,  Robert Ernest Troxler

IPC: G01N33/18 ,  G01T1/16 ,  G01T1/20 ,  G01T3/00

CPC classification number: G01N23/08 ,  B65G15/08 ,  B65G43/08 ,  B65G2201/045 ,  B65G2203/0208 ,  B65G2203/04 ,  G01B15/025 ,  G01N23/06 ,  G01N23/083 ,  G01N23/09 ,  G01N33/383 ,  G01N2223/04 ,  G01N2223/205 ,  G01N2223/505 ,  G01N2223/613 ,  G01N2223/633 ,  G01N2223/643

Abstract: A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

Abstract translation: 提供了一个系统。 该系统包括构造成输送物料的输送装置和围绕输送装置定位的含水量测量系统，用于确定材料中的含水量。 提供了一种用于检测材料的一个或多个维度特征的维度特征测量系统，并且计算机设备被配置为操纵从含水量测量系统和尺寸特征测量系统接收的数据，以确定材料的含水量。