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    DESIGN OF MULTIVARIATE OPTICAL ELEMENTS FOR NONLINEAR CALIBRATION
    341.
    发明申请
    DESIGN OF MULTIVARIATE OPTICAL ELEMENTS FOR NONLINEAR CALIBRATION 有权
    用于非线性校准的多元光学元件的设计

    公开(公告)号：US20100153048A1

    公开(公告)日：2010-06-17

    申请号：US12528101

    申请日：2008-02-25

    Applicant: Michael L. Myrick ,  Luisa Profeta

    Inventor： Michael L. Myrick ,  Luisa Profeta

    IPC: G06F19/00

    CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/0232 ,  G01J3/12 ,  G01N21/274 ,  G01N21/31 ,  G01N2201/12769

    Abstract: The present subject matter is direct to methodologies for calibrating data obtained from an optical analysis system. An initial calibration matrix of sampled analyte concentrations is modified using mean-centering techniques and selection of low and high analyte concentration spectra to produce a two-point calibration. A modified calibration matrix is produced by generating a non-linear calibration matrix by multiplying the initial calibration matrix by the two-point calibration. In an alternate embodiment, an initial multivariate optical element design is modified by iteratively adjusting the design based on standard error of calibration determination based on non-linerly fitted functions.

    Abstract translation: 本主题直接涉及用于校准从光学分析系统获得的数据的方法。 使用平均定心技术和低分辨率和高分析物浓度光谱的选择来修改采样分析物浓度的初始校准矩阵，以产生两点校准。 通过将初始校准矩阵乘以两点校准来生成非线性校准矩阵来产生修改的校准矩阵。 在替代实施例中，通过基于非线性拟合函数的校准确定的标准误差迭代地调整设计来修改初始多变量光学元件设计。

    ATOMIC ABSORPTION SPECTROPHOTOMETER
    343.
    发明申请
    ATOMIC ABSORPTION SPECTROPHOTOMETER 有权
    原子吸收光谱仪

    公开(公告)号：US20100091277A1

    公开(公告)日：2010-04-15

    申请号：US12574213

    申请日：2009-10-06

    Applicant: Kazuo YAMAUCHI

    Inventor： Kazuo YAMAUCHI

    IPC: G01N21/74 ,  G01J3/30

    CPC classification number: G01N21/3103 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/08 ,  G01J3/42

    Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22. In using the apparatus, by the control program, the frequency of the power source used in this apparatus is identified, the lighting period and sampling data extraction period corresponding to the identified frequency and the measurement mode that a user of the apparatus has previously set are selected from among a plurality of memorized values, and the appropriate lighting period is set to the hardware (PLD 43). Accordingly, without depending on the frequency, it is possible to obtain measurement data always in the state where the lowest detection limit performance is optimized.

    Abstract translation: 本发明的目的是提供一种原子吸收分光光度计，其能够在不依赖于电源的频率的情况下始终以最低检测极限性能优化的状态获得测量数据。 在安装在原子吸收分光光度计110上的微计算机芯片42上运行的控制程序中，存储光源11和12的多个点亮周期和采样数据的提取周期，其最低检测限性能针对 用于驱动AC电动机22的AC电源的频率（50Hz和60Hz）。在使用该装置时，通过控制程序识别在该装置中使用的电源的频率，照明周期和采样数据提取 从多个存储值中选择对应于所识别的频率和装置的用户预先设置的测量模式的周期，并且将适当的发光周期设置到硬件（PLD 43）。 因此，在不依赖于频率的情况下，可以在最低检测极限性能优化的状态下始终获得测量数据。

    Broad band referencing reflectometer
    345.
    发明申请
    Broad band referencing reflectometer 有权
    宽带参考反射计

    公开(公告)号：US20100051822A1

    公开(公告)日：2010-03-04

    申请号：US12590151

    申请日：2009-11-03

    Applicant: Dale A. Harrison

    Inventor： Dale A. Harrison

    IPC: G01N21/47 ,  G01N21/55

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/08 ,  G01J3/10 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/36 ,  G01J3/42 ,  G01J3/4531 ,  G01N21/211 ,  G01N21/274 ,  G01N21/33 ,  G01N21/47 ,  G01N21/55 ,  G01N21/9501 ,  G01N2021/335

    Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.

    Abstract translation: 提供了一种光谱系统，其被优化用于在VUV区域中的操作并且能够在DUV-NIR区域中表现良好。 此外，该系统还包含一个光学模块，该模块提供可用于VUV和DUV-NIR中优化的可选择的源和检测器。 同样，光学模块提供通用的传送和收集光学器件，以使得能够使用类似的光点特性来收集两个光谱区域中的测量。 该模块还提供了快速参考测量数据的方法，以确保实现高度可重复的结果。 该模块还在VUV源，样品室和VUV检测器之间提供受控的环境，其作用是以可重复的方式限制VUV光子的吸收。 除了DUV-NIR波长之外，使用包含VUV波长的宽带数据集使得可以有意义地表征更多种类的材料。 可以利用基于阵列的检测仪器来允许同时收集更大的波长区域。

    Contamination monitoring and control techniques for use with an optical metrology instrument
    346.
    发明授权
    Contamination monitoring and control techniques for use with an optical metrology instrument 有权
    用于光学计量仪器的污染监测和控制技术

    公开(公告)号：US07622310B2

    公开(公告)日：2009-11-24

    申请号：US11600414

    申请日：2006-11-16

    Applicant: Dale A. Harrison ,  Matthew Weldon

    Inventor： Dale A. Harrison ,  Matthew Weldon

    IPC: H01L21/66

    CPC classification number: G01N21/33 ,  G01J3/02 ,  G01J3/0232 ,  G01J3/0291 ,  G01J3/08 ,  G01J3/42 ,  G01N21/94

    Abstract: A technique is provided for generating and subsequently monitoring the controlled environment(s) within an optical metrology instrument in such a manner as to minimize absorbing species within the light path of the metrology instrument and to minimize the build-up of contaminants on the surfaces of optical elements that may result in performance degradation. Both evacuation and backfill techniques may be utilized together along with a monitoring technique to determine if the environmental is suitable for measurements or if the environment should be regenerated. The optical metrology instrument may be an instrument which operates at wavelengths that include vacuum ultra-violet (VUV) wavelengths.

    Abstract translation: 提供了一种技术，用于产生和随后监测光学测量仪器内的受控环境，使得最小化测量仪器的光路内的吸收物质的最小化，并使污染物在表面上的积聚最小化 可能导致性能下降的光学元件。 撤离和回填技术都可以与监测技术一起使用，以确定环境是否适合于测量或者是否应该再生环境。 光学测量仪器可以是在包括真空紫外（VUV）波长的波长下操作的仪器。

    Method and apparatus for conducting Raman spectroscopy
    348.
    发明授权
    Method and apparatus for conducting Raman spectroscopy 有权
    用于进行拉曼光谱的方法和装置

    公开(公告)号：US07548311B2

    公开(公告)日：2009-06-16

    申请号：US11475582

    申请日：2006-06-27

    Applicant: Kevin J. Knopp ,  Peidong Wang ,  Masud Azimi ,  Daryoosh Vakhshoori

    Inventor： Kevin J. Knopp ,  Peidong Wang ,  Masud Azimi ,  Daryoosh Vakhshoori

    IPC: G01J3/44

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0227 ,  G01J3/0232 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/44 ,  G01J2003/1213 ,  G01N21/65 ,  G01N2021/656

    Abstract: A Raman probe assembly comprises: a light source for generating laser excitation light; a camera for capturing an image; a light analyzer for analyzing a Raman signature; and a light path for (i) delivering the laser excitation light from the light source to the specimen so as to produce the Raman signature for the specimen, (ii) capturing an image of the specimen and directing that image to the camera, and (iii) directing the Raman signature of the specimen to the light analyzer. A method includes providing a Raman probe assembly carried by a remote controlled robot; navigating the remote control robot to a position adjacent to a specimen; opening a shutter/wiper disposed adjacent to a window of the Raman analyzer; using a camera to aim the probe body at the specimen; energizing a light source; and analyzing the return light passed to the light analyzer.

    Abstract translation: 拉曼探针组件包括：用于产生激光激发光的光源; 用于捕获图像的相机; 用于分析拉曼签名的光分析器; 以及用于（i）将激光激发光从光源传送到样本以产生用于样本的拉曼特征的光路，（ii）拍摄样本的图像并将该图像引导到相机，以及（ iii）将样品的拉曼标记引导到光分析仪。 一种方法包括提供由遥控机器人携带的拉曼探针组件; 将远程控制机器人导航到与样本相邻的位置; 打开与拉曼分析仪的窗口相邻设置的快门/刮水器; 使用相机将探针主体对准样本; 激励光源; 并分析通过光分析器的返回光。

    Arrangement for a selection of wavelength
    349.
    发明申请
    Arrangement for a selection of wavelength 有权
    布置选择波长

    公开(公告)号：US20090140130A1

    公开(公告)日：2009-06-04

    申请号：US11990679

    申请日：2006-08-17

    Applicant: Zhang Xiqin ,  Ting Choon Meng

    Inventor： Zhang Xiqin ,  Ting Choon Meng

    IPC: G01J3/50

    CPC classification number: G01J3/108 ,  A61B5/14532 ,  A61B5/1455 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235

    Abstract: The present invention relates to an arrangement for a selection of a wavelength including a wavelength source for providing a plurality of wavelengths, a wavelength selector for allowing a selection of a desired wavelength from the wavelength source, and a wavelength detector to detect a selected wavelength for subsequent use.

    Abstract translation: 本发明涉及一种用于选择包括用于提供多个波长的波长源的波长的布置，用于允许从波长源选择所需波长的波长选择器，以及用于检测所选波长的波长检测器 随后使用。

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