Abstract:
A column decoder is for a phase-change memory device provided with an array of memory cells, a reading stage for reading data contained in the memory cells, and a programming stage for programming the data. The column decoder selects and enables biasing of a bitline of the array and generates a current path between the bitline and the reading stage or, alternatively, the programming stage, respectively during a reading or a programming operation of the contents of the memory cells. In the column decoder, a first decoder circuit generates a first current path between the bitline and the reading stage, and a second decoder circuit, distinct and separate from the first decoder circuit, generates a second current path, distinct from the first current path, between the bitline and the programming stage.
Abstract:
A sense amplifier for nonvolatile memory cells includes a reference cell, a first load, connected to the reference cell, and a second load, connectable to a nonvolatile memory cell, both the first load and the second load having controllable resistance; a control circuit of the first load and of the second load supplies the first load and the second load with a control voltage irrespective of an operating voltage between a first conduction terminal and a second conduction terminal of the first load.
Abstract:
A dynamically reconfigurable processing unit includes a microprocessor, and an embedded Flash memory for non-volatile storage of code, data and bit-streams. The embedded Flash includes a field programmable gate array (FPGA) port. The reconfigurable processing unit further includes a direct memory access (DMA) channel, and an S-RAM embedded FPGA for FPGA reconfigurations. The S-RAM embedded FPGA has an FPGA programming interface connected to the FPGA port of the Flash memory through the DMA channel. The microprocessor, the embedded Flash memory, the DMA channel and the S-RAM embedded FPGA are integrated as a single chip.
Abstract:
Described herein is a method for storing a datum in a first and a second memory cells of a nonvolatile memory. The storage method envisages programming the first and second memory cells in a differential way, by setting a first threshold voltage in the first memory cell and a second threshold voltage different from the first threshold voltage in the second memory cell, the difference between the threshold voltages of the two memory cells representing a datum stored in the memory cells themselves.
Abstract:
A digital device for testing and calibrating the oscillation frequency of an integrated oscillator circuit, the testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a comparison circuit for comparing a signal of known duration and a signal from the integrated oscillator circuit; a circuit connected to the comparison circuit, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into a storage and control section of the integrated oscillator circuit.
Abstract:
The optimized soft programming method is used in a memory consisting of a plurality of cells that are grouped into sectors. The cells that belong to a single sector have gate terminals connected to a plurality of word lines, and drain terminals connected to a plurality of local bit lines. The soft programming method consists of selecting at least one local bit line in the sector, and simultaneously selecting all the word lines in the same sector. A corresponding gate voltage is applied to all the word lines, whereas a constant drain voltage, with a pre-determined value is applied to the local bit line.
Abstract:
A reading circuit having an array branch connected to a multi-level array memory cell; a reference branch connected to a reference memory cell; a current/voltage converter stage formed of a current mirror having a variable mirror ratio, connected to the array and reference branches, and supplying at an array node and at a reference node respectively an array potential and a reference potential, which are correlated respectively to the currents flowing in the array branch and in the reference branch; and a comparator stage having a first and a second input connected to the array and reference nodes for comparing with one another the array and reference potentials.
Abstract:
Circuit for erasing and rewriting blocks of memory cells and particularly of analog flash cells, including at least one row decoding circuit including at least two adder blocks, suitable to generate a row address signal, at least two decoder blocks, suitable to generate respective pluralities of signals identifying a respective sector of memory to be enabled, at least two shifter blocks, suitable to generate an address signal of another row to be enabled, at least two OR logic blocks, suitable to generate respective signals serving the purpose to simultaneously enable at least two rows of the memory matrix.
Abstract:
A voltage regulator is provided for limiting overcurrents when used with a plurality of loads, particularly in flash memories, which are connected between an output node of the regulator and a voltage reference by way of a plurality of switches. The voltage regulator includes at least one differential stage that has a non-inverting input terminal for a control voltage, and an inverting input terminal connected to the voltage reference and the output node of the regulator through a feedback network. There is an output terminal connected to the output node of the voltage regulator to produce an output reference voltage from a comparison of input voltages. In the voltage regulator is a main control transistor connected between a high-voltage reference and the output terminal of the regulator. Advantageously, the regulator further includes a number of balance transistors connected between the high-voltage reference and the output node of the regulator and driven according to the load being connected to the output node, thereby to shorten the duration of an overcurrent at the output terminal while delivering the current required by the loads.
Abstract:
A read device comprises a sense amplifier having an input connected to a data memory cell to be read and an output issuing a signal correlated to the threshold voltage of the data memory cell. A first and second voltage sources circuit have respect first and second outputs that supply respective first and a second input reference voltage. A resistive divider connected between the first and the second outputs of the voltage source circuits has a plurality of outputs supplying respective intermediate reference voltages having values between the first and the second input reference voltages. A plurality of comparator circuits have a first input connected to the output of the sense amplifier, a second input connected to a respective output of the resistive divider, and an output supplying a digital signal indicative of the outcome of a respective comparison. Each voltage source circuit comprises a nonvolatile reference memory cell of the same type as the data memory cell and having an own threshold voltage correlated to the input reference voltage, supplied by the voltage source circuit. Thereby, the input reference voltages, and thus the intermediate reference voltages supplied to the comparator circuits, undergo variations in time correlated to the voltage supplied by the sense amplifier and consequent on the variations of the threshold voltages of the data memory cells.