摘要:
Interconnection structures for integrated circuits have first cells disposed in a first plane, at least second cells disposed in at least a second plane parallel to the first plane, and vertical interconnections disposed for connecting conductors in the first plane with conductors in the second plane, at least some of the vertical interconnections initially incorporating antifuses. The antifuses may be disposed over conductors that are disposed on a base substrate. The antifuses are selectively fused to prepare the integrated circuit for normal operation. Methods for fabricating and using such vertical interconnection structures are disclosed.
摘要:
An integrated circuit includes an array of state-change devices, first and second decoder circuits for selecting a particular state-change device. A voltage source is coupled to the first decoder circuit and sense circuitry is coupled to the second decoder to receive an electrical parameter from the selected state-change device and to detect a particular value of the electrical parameter. A control circuit is coupled to the voltage source, the first and second decoders, and the sense circuitry to select a first voltage from the voltage source to alter the selected state-change device and to select a second voltage from the voltage source when the sense circuitry detects the particular value of the electrical parameter.
摘要:
Disclosed are systems and methods for transmitting graphical data via a communication line. For example, in one embodiment, a system includes means for receiving voice data, means for generating graphical data representative of a user input, and means for simultaneously transmitting the voice data and information representative of the generated graphical data via a communication line such that a bandwidth of the communication line is not exceeded.
摘要:
A memory structure includes a memory storage element electrically coupled to a control element. The control element comprises a tunnel-junction device. The memory storage element may also comprise a tunnel-junction device. Methods for fusing a tunnel-junction device of a memory storage element without fusing a tunnel-junction device of an associated control element are disclosed. The memory storage element may have an effective cross-sectional area that is greater than an effective cross-sectional area of the control element. A memory structure comprises a memory storage element, a control element comprising a tunnel-junction device electrically coupled to the memory storage element and configured to control the state of the memory storage element, and a reference element. The reference element is configured as a reference to protect the control element when selectively controlling the state of the memory storage element. The reference element may comprise a tunnel-junction device and be used with a current source to fuse a memory storage element without fusing a tunnel-junction device of an associated control element. Methods of making the memory structure and using it in electronic devices are disclosed.
摘要:
Interconnection structures for integrated circuits have first cells disposed in a first plane, at least second cells disposed in at least a second plane parallel to the first plane, and vertical interconnections disposed for connecting conductors in the first plane with conductors in the second plane, at least some of the vertical interconnections initially incorporating antifuses. The antifuses may be disposed over conductors that are disposed on a base substrate. The antifuses are selectively fused to prepare the integrated circuit for normal operation. Methods for fabricating and using such vertical interconnection structures are disclosed.
摘要:
A method of creating a memory circuit preferably includes (1) forming a first plurality of select-lines in a plane substantially parallel to a substrate, (2) forming a second plurality of select-lines in a plane substantially parallel to the substrate, where the second plurality of select-lines is divided into first and second groups, where the first group is formed in a direction normal to that of the first plurality of select-lines and the second group is formed in a direction substantially diagonal to that of the first group, (3) forming a plurality of pillars normal to the substrate, and (4) forming an array of memory cells, each memory cell being respectively coupled to a pillar and one of each of said first and second pluralities of select-lines.
摘要:
An antifuse structure has an antifuse between first and second thermal conduction regions. Each of the first and second thermal conduction regions has a portion of low thermal conductivity and a portion of high thermal conductivity. The portion having low thermal conductivity is between the respective portion of high thermal conductivity and the antifuse.
摘要:
Interconnection structures for integrated circuits have a first array of cells, at least a second array of cells parallel to the first array, and interconnections disposed for connecting cells of the first array with cells of the second array, at least some of the interconnections being disposed along axes oriented obliquely to the first and second arrays. First and second sets of oblique axes of interconnections may be parallel or opposed to each other. The interconnections may include obliquely slanted pillars or stair-stepped pillars disposed along the oblique axes. Methods for fabricating and using such structures are disclosed.
摘要:
A memory device includes memory components that represent a logic value corresponding to a data bit in a bit sequence. A defective memory component in the memory device represents a data bit in the bit sequence. An additional memory component in the memory device represents an encode bit in the bit sequence, where the encode bit indicates whether the bit sequence is inverted.
摘要:
A display element (100) corresponds to a pixel of a display. The display element includes a top electrode (102) connected to a first addressable line of the display, and a bottom electrode (104) connected to a second addressable line of the display. The display element includes a display mechanism (106) situated between the top electrode and the bottom electrode and having a number of individually turned-on steps. Each individually turned-on step has a turn-on voltage threshold at which the step is turned on upon a voltage applied between the top and the bottom electrodes equal to or greater than the turn-on voltage threshold. Each individually turned-on step has a turn-off voltage threshold at which the step is turned off upon a voltage applied between the top and the bottom electrodes equal to or less than the turn-off voltage threshold.