MEMS cavity-coating layers and methods
    31.
    发明授权
    MEMS cavity-coating layers and methods 有权
    MEMS空腔涂层及方法

    公开(公告)号:US07733552B2

    公开(公告)日:2010-06-08

    申请号:US11689430

    申请日:2007-03-21

    IPC分类号: G02F1/00

    摘要: Devices, methods, and systems comprising a MEMS device, for example, an interferometric modulator, that comprises a cavity in which a layer coats multiple surfaces. The layer is conformal or non-conformal. In some embodiments, the layer is formed by atomic layer deposition (ALD). Preferably, the layer comprises a dielectric material. In some embodiments, the MEMS device also exhibits improved characteristics, such as improved electrical insulation between moving electrodes, reduced stiction, and/or improved mechanical properties.

    摘要翻译: 包括MEMS器件(例如干涉式调制器)的器件,方法和系统,其包括其中层涂覆多个表面的空腔。 该层是保形的或非保形的。 在一些实施例中,该层由原子层沉积(ALD)形成。 优选地,该层包括电介质材料。 在一些实施例中,MEMS器件还表现出改进的特性,例如移动电极之间的改善的电绝缘性,降低的静摩擦力和/或改善的机械性能。

    ELIMINATE RELEASE ETCH ATTACK BY INTERFACE MODIFICATION IN SACRIFICIAL LAYERS
    33.
    发明申请
    ELIMINATE RELEASE ETCH ATTACK BY INTERFACE MODIFICATION IN SACRIFICIAL LAYERS 失效
    通过界面修改消除泄漏蚀刻侵蚀层

    公开(公告)号:US20080311690A1

    公开(公告)日:2008-12-18

    申请号:US12061592

    申请日:2008-04-02

    IPC分类号: H01L21/52 G02B26/00 C23C16/00

    CPC分类号: B81C1/00476 B81B2201/047

    摘要: Methods of making a microelectromechanical system (MEMS) device are described. In some embodiments, the method includes forming a sacrificial layer over a substrate, treating at least a portion of the sacrificial layer to form a treated sacrificial portion, forming an overlying layer over at least a part of the treated sacrificial portion, and at least partially removing the treated sacrificial portion to form a cavity situated between the substrate and the overlying layer, the overlying layer being exposed to the cavity.

    摘要翻译: 描述制造微机电系统(MEMS)装置的方法。 在一些实施例中,该方法包括在衬底上形成牺牲层,处理牺牲层的至少一部分以形成经处理的牺牲部分,在经处理的牺牲部分的至少一部分上形成覆盖层,并且至少部分地 去除经处理的牺牲部分以形成位于衬底和上覆层之间的空腔,上覆层暴露于空腔。

    Process and structure for fabrication of MEMS device having isolated edge posts
    34.
    发明授权
    Process and structure for fabrication of MEMS device having isolated edge posts 失效
    具有隔离边缘柱的MEMS器件的制造工艺和结构

    公开(公告)号:US07321457B2

    公开(公告)日:2008-01-22

    申请号:US11445607

    申请日:2006-06-01

    申请人: David Heald

    发明人: David Heald

    IPC分类号: G02B26/00 G02B26/08

    CPC分类号: G02B26/001

    摘要: A method of fabricating an array of MEMS devices includes the formation of support structures located at the edge of upper strip electrodes. A support structure is etched to form a pair of individual support structures located at the edges of a pair of adjacent electrodes. The electrodes themselves may be used as a hard mask during the etching of these support structures. A resultant array of MEMS devices includes support structures having a face located at the edge of an overlying electrode and coincident with the edge of the overlying electrode.

    摘要翻译: 制造MEMS器件阵列的方法包括形成位于上条带电极边缘处的支撑结构。 蚀刻支撑结构以形成位于一对相邻电极的边缘处的一对单独的支撑结构。 在蚀刻这些支撑结构期间,电极本身可用作硬掩模。 所得到的MEMS器件阵列包括支撑结构,其具有位于上覆电极的边缘处并与上覆电极的边缘重合的面。