摘要:
Round-off error in fixed-point arithmetic is minimized by changing the magnitudes of two multipliers simultaneously. The dynamic range of an intermediate output is thus maximized to increase computation precision. A much smaller round-off error, caused by fixed-point arithmetic, thus results.
摘要:
A redundant circuit that includes a combination of fuses and anti-fuses, and which may be used during various phases of the manufacturing process (e.g., during wafer test or final test) to replace a defective circuit. The redundant circuit includes (1) a replacement circuit (e.g., a redundant memory cell) that is configurable to replace a defective circuit, and (2) supporting circuitry for the replacement circuit. The support circuit is configurable to provide a control signal (e.g., to activate a word line) for the replacement circuit and further includes at least one fuse and at least one anti-fuse. The fuses or anti-fuses may be programmed to provide a programmed value (e.g., a programmed address) for the replacement circuit. The redundant circuit can be efficiently fabricated within a memory device, and may also be used for other circuits and applications.
摘要:
A memory array architecture that supports block write operation and has many advantages over conventional memory array architectures. A memory array is partitioned into a number of (N) segments. Each segment includes at least one bit line. Each segment is associated with a local input/output (I/O) line that couples to zero or more bit lines within that segment. The bit lines are coupled to the local I/O line by controlling one or more column select lines associated with that segment. Each segment is also associated with a write driver that couples to the local I/O line. Each local I/O line has a length that is a portion of a length of the memory array. A block write operation is performed by concurrently driving one or more write drivers (up to N write drivers). Each write driver drives the bit lines coupled to the local I/O line associated with that write driver.
摘要:
An integrated device includes a configuration circuit that is coupled to first and second bond pads and first and second conductive paths of the integrated device. The circuit receives a map signal that has a first value during a first operational mode of the integrated device and a second value during a second operational mode of the integrated device. In response to the first value, the circuit couples the first pad to the second conductive path. In response to the second value, the circuit couples the first pad to the first conductive path and the second pad to the second conductive path. The first operational mode may be a wafer test mode.
摘要:
An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.
摘要:
A self refresh decoder generates a self refresh command as long as the clock enable signal transitions low within a predetermined latency period after an auto refresh command is generated. As a result, an SDRAM is able to enter the self refresh mode even though the clock enable control signal differentiating the auto refresh command from the self refresh command is excessively delayed beyond the other control signals corresponding to both the auto refresh and the self refresh commands. The self refresh decoder includes a counter that is preloaded with a latency value and decrements to a terminal count responsive to the auto refresh command to terminate the latency period. The output of the counter is decoded to provide an enable signal as long as the terminal count has not been reached. As long as the enable signal is present, the self refresh command is generated responsive to receipt of the clock enable signal.
摘要:
A precharge circuit is operable during a standby mode to drive a word line to a low voltage level and one or more (pairs of) bit lines to a standby voltage level. The precharge circuit comprises a driver for driving the on or more bit lines to the stand by voltage level. The precharge circuit also includes a control circuit connected to a control input of the driver which control circuit receives the standby signal. The control circuit outputs a varying enable signal to the driver for varying the drive of the bit lines by the driver. The precharge circuit can include a first current limiting driver for driving the bit lines to the standby voltage level, and second driver, for driving the bit lines to the standby voltage level. The second driver has a greater switching speed, and a higher current driving capacity, than the first current limiting driver. Tie control circuit enables the second driver for a certain period of time in response to detecting an indication of a beginning of the standby mode of the standby signal.
摘要:
This invention is concerned with improved processes for reductive alkylation of glycopeptide antibiotics. The improvement residing in providing a source of copper which results in the initial production of a copper complex of the glycopeptide antibiotic. Reductive alkylation of this complex favors regioselective alkylation and increased yields. Copper complexes of the glycopeptide antibiotic starting materials and of the alkylated products are also part of the invention.
摘要:
A memory device that includes decoding circuitry, a memory array, conditioning circuitry, and an output circuit. The decoding circuitry is configured to receive address information and generate a set of control signals. The memory array couples to the decoding circuitry and is configured to provide a data value in response to the set of control signals. The conditioning circuitry couples to the memory array and is configured to receive and condition the data value to provide a data bit. The output circuit couples to the conditioning circuitry and is configured to receive the data bit and provide an output bit. The output circuit is further configured to operate in one of a number of operating modes, with each operating mode corresponding to a different timing scheme. The output circuit can be implemented using a pair of latches coupled in series. The different operating modes can be achieved, for example, by selectively placing one of the latches in a bypass mode. A timing circuit can be used to provide the necessary clock signal(s) for the output circuit.
摘要:
A memory device is provided with N>1 memory arrays. Each of the memory arrays comprises a plurality of memory cells arranged into rows and columns. N I/O lines are provided that can be simultaneously activated during a prefetch cycle. Each of the I/O lines is connected to the memory cells of a different one of the N memory arrays for transferring data signals to and from specific addressed ones of the memory cells of the respective memory array. N latches are also provided wherein each of the latches is connected to a different one of the I/O lines. Furthermore, a read/write line is connected to each of the latches and extends along an edge of each memory array. During a prefetch cycle, each of the N I/O lines simultaneously transfers a data signal thereon. Each of the N latches receives a different phase clock signal for synchronizing a transfer of N data signals, including one data signal of each of the latches. The data signals are transferred between the latches and the read/write line so that each data signal is transferred during a respective different n.sup.th interval of a transfer cycle, where 1.ltoreq.n.ltoreq.N. As such, N data signals, including one data signal originating at, or destined to, each of the N memory arrays, are transferred sequentially via the read/write line during the prefetch cycle.