Composition and method for recycling semiconductor wafers having low-k dielectric materials thereon
    33.
    发明授权
    Composition and method for recycling semiconductor wafers having low-k dielectric materials thereon 有权
    用于回收其上具有低k电介质材料的半导体晶片的组合物和方法

    公开(公告)号:US07960328B2

    公开(公告)日:2011-06-14

    申请号:US12093290

    申请日:2006-11-09

    IPC分类号: C11D7/32

    摘要: A removal composition and process for removing low-k dielectric material, etch stop material, and/or metal stack material from a rejected microelectronic device structure having same thereon. The removal composition includes hydrofluoric acid. The composition achieves at least partial removal of the material(s) from the surface of the microelectronic device structure having same thereon, for recycling and/or reuse of said structure, without damage to the underlying polysilicon or bare silicon layer employed in the semiconductor architecture.

    摘要翻译: 一种去除组合物和用于从其上具有相同材料的废弃微电子器件结构去除低k电介质材料,蚀刻停止材料和/或金属堆叠材料的去除组合物和方法。 除去组合物包括氢氟酸。 该组合物至少部分地从其上具有相同的微电子器件结构的表面去除材料,用于所述结构的再循环和/或再利用,而不会损坏半导体结构中使用的下面的多晶硅或裸硅层 。

    Composition and method for recycling semiconductor wafers having low-k dielectric materials thereon
    39.
    发明授权
    Composition and method for recycling semiconductor wafers having low-k dielectric materials thereon 有权
    用于回收其上具有低k电介质材料的半导体晶片的组合物和方法

    公开(公告)号:US08642526B2

    公开(公告)日:2014-02-04

    申请号:US13103536

    申请日:2011-05-09

    IPC分类号: G03F7/42

    摘要: A removal composition and process for removing low-k dielectric material, etch stop material, and/or metal stack material from a rejected microelectronic device structure having same thereon. The removal composition includes hydrofluoric acid. The composition achieves at least partial removal of the material(s) from the surface of the microelectronic device structure having same thereon, for recycling and/or reuse of said structure, without damage to the underlying polysilicon or bare silicon layer employed in the semiconductor architecture.

    摘要翻译: 一种去除组合物和用于从其上具有相同材料的废弃微电子器件结构去除低k电介质材料,蚀刻停止材料和/或金属堆叠材料的去除组合物和方法。 除去组合物包括氢氟酸。 该组合物至少部分地从其上具有相同的微电子器件结构的表面去除材料,用于所述结构的再循环和/或再利用,而不会损坏半导体结构中使用的下面的多晶硅或裸硅层 。