Abstract:
Provided is a chromatic dispersion measurement device including a light branching unit that divides a incident measured light signal into a first measured light signal and a second measured light signal and causes a frequency difference between the first measured light signal and the second measured light signal when the signals are output, an optical phase shifter provided in either one of the first branch path and the second branch path having a polarization maintaining characteristic and periodically changing a phase αi of the measured light signal, an optical combination unit that combines the first measured light signal and the second measured light signal and outputs an interference element of an i-th optical component obtained by interference of the first measured light signal and the second measured light signal when the phase difference is the phase αi, as a combined measured light signal.
Abstract:
A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.
Abstract:
The invention relates to a spectroscopic detector, including: at least one waveguide (70) arranged on a substrate (7) and having an input surface (700) to be connected to an electromagnetic source, in particular an infrared source, and a mirror (701) on the opposite surface, so as to generate a standing wave inside the waveguide; and a means for detecting electromagnetic radiation, which output an electrical signal according to the local intensity of the electromagnetic wave, characterised in that said detection means consists of suspended membrane bolometers (72 to 75) distributed between the input surface and the mirror, each membrane of said heat detectors being separated from said at least one waveguide by anchoring points (42) on said substrate (7), and in that means (702 to 705) for sampling a portion of the electromagnetic wave is provided between the input surface and the mirror.
Abstract:
The present invention is directed to an assembly for use in detecting an analyte in a sample based on thin-film spectral interference. The assembly comprises a waveguide, a monolithic substrate optically coupled to the waveguide, and a thin-film layer directly bonded to the sensing side of the monolithic substrate. The refractive index of the monolithic substrate is higher than the refractive index of the transparent material of the thin-film layer. A spectral interference between the light reflected into the waveguide from a first reflecting surface and a second reflecting surface varies as analyte molecules in a sample bind to the analyte binding molecules coated on the thin-film layer.
Abstract:
A spectrometer is provided, the spectrometer having an interferometer generating an interferogram by splitting an interferometer input signal between a reference arm and a variable delay arm, and introducing a delay between the split interferometer input signals prior to interfering the split interferometer input signals. The spectrometer additionally has a controllable delay element operable to adjust the delay introduced by the interferometer and a dispersive element outputting a plurality of narrowband outputs representative of a received broadband input signal. The interferometer and dispersive element are optically connected to output a plurality of narrowband interferograms representative of a spectra of a spectrometer input signal received by the spectrometer, and the plurality of narrowband interferograms are received by a detector array for analysis.
Abstract:
Various embodiments of apparatuses, systems and methods are described herein related to a spectrometer that can generate a plurality of narrowband optical signals having a wavenumber linear format without using an increased number of optical components and without an increase in signal processing.
Abstract:
There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.
Abstract:
The present subject matter is directed to a device for spectroscopy. The device includes an excitation source configured to illuminate a sample with wavelengths. The device also includes a spatial heterodyne interferometer configured to receive Raman wavelengths from the sample.
Abstract:
Current apparatuses and methods for analysis of spectroscopic optical coherence tomography (SOCT) signals suffer from an inherent tradeoff between time (depth) and frequency (wavelength) resolution. In one non-limiting embodiment, multiple or dual window (DW) apparatuses and methods for reconstructing time-frequency distributions (TFDs) that applies two windows that independently determine the optical and temporal resolution is provided. For example, optical resolution may relate to scattering information about a sample, and temporal resolution may be related to absorption or depth related information. The effectiveness of the apparatuses and methods is demonstrated in simulations and in processing of measured OCT signals that contain fields which vary in time and frequency. The DW technique may yield TFDs that maintain high spectral and temporal resolution and are free from the artifacts and limitations commonly observed with other processing methods.
Abstract:
There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.