Abstract:
A method of forming a conductive line suitable for decreasing a sheet resistance of the conductive lines. The method comprises steps of providing a material layer having a conductive layer formed thereon and forming a patterned mask layer on the conductive layer. In addition, a portion of the conductive layer is removed by using the patterned mask layer as a mask and a spacer is formed on a sidewall of the patterned mask layer and the conductive layer. A portion of the conductive layer is removed until the material layer is exposed to form a conductive line, wherein the spacer and the patterned mask layer serve as a mask.
Abstract:
A system and method are provided for scheduling a monitor job for a tool in a semiconductor manufacturing environment and for optimizing the scheduling of jobs in such an environment. In one example, the method includes receiving a monitor job and monitoring a status of the tool to determine when a predefined event occurs. A position in a buffer in which to place the monitor job may be identified in response to the event occurring, where placing the monitor job in the identified position will cause the monitor job to be executed at a correct time.
Abstract:
A bi-display mode liquid crystal display comprises a top and a bottom transparent substrate that are arranged in a parallel way, and between the two transparent substrates are a liquid crystal layer, a semi-reflector and a color filter sequentially, in addition, a top and a bottom polarizer are set on the outer surface of the top and the bottom transparent substrate respectively; by setting the semi-reflector upon the color filter, it makes the light not pass through the color filter and increase the reflection rate. Therefore, the present invention not only provides a reflective mode of high brightness gray scale display, but has a transmissive mode of beautiful color, and has the advantage of power saving and easy to use.
Abstract:
A highly efficient data characteristic identification device for flash memory is provided, including an instruction register, a plurality of auxiliary controllers, a data register, an address register, a microprocessor, a plurality of hash function units, a hash table unit, a comparator, a shifter, and an adder. By connecting the instruction register, data register and address register to a flash memory access control circuit and flash memory for storing the control instruction of the access control circuit and the data and physical and logical address of the flash memory, the control instruction is decoded and transmitted by the microprocessor and the auxiliary controllers to each circuit. A plurality of hash function units, a hash table unit, a comparator, a shifter, and an adder form an index computation circuit for flash memory LBA. By using the index and computation on the contents of the hash function units, the data characteristics of the LBA can be stored with less memory and higher efficiency. Therefore, the object of a highly efficient data access characteristic identification device for flash memory is provided.
Abstract:
A lens device includes a lens barrel, a lens, a guiding unit, and a positioning unit. The lens barrel has a barrel axis. The lens has a lens axis and is disposed between the lens barrel and the positioning unit. The guiding unit includes guiding studs and guiding slots formed on the lens barrel and the lens, wherein the guiding slots receive the guiding studs respectively therein and have dimensions larger than those of the guiding studs. The positioning unit has outer and inner ring sections. The outer ring section has a ring axis and is sleeved on the lens barrel. The inner ring section engages the lens such that the lens axis forms a radial offset with the ring axis, wherein the lens is positioned relative to the barrel axis by the inner ring section according to angular orientation of the inner ring section relative to the ring axis.
Abstract:
A method for switch dual Id verification systems for installing another carrier ID system on an equipment installation complying with SEMI E87. A first identification access system has internally installed on an equipment installation on which a second identification access system is then installed. Both systems are switched using a control flow and a wafer carrier ID is obtained by the chosen verification system.
Abstract:
The present invention discloses a method of applying micro-protection in defect analysis. The method includes providing a substrate having at least one defect thereon, forming the micro-protection on the surface of the defect, confirming the site of the defect, and forming a specimen of the defect by utilizing a focused ion beam microscope.
Abstract:
The systems and methods described herein provide for a radio frequency micro-electromechanical systems switch having two or more resonant frequencies. The switch can be configured as a capacitive shunt switch having a deflectable member coupled between two electrodes over a transmission line. A first insulator can be located between one of the electrodes and the deflectable member to form a capacitive element. The deflectable member can be deflectable between an up-state and a down-state, the down-state capacitively coupling the deflectable member with the transmission line. The degree by which the deflectable member overlaps the first insulator can be adjusted to adjust the capacitance of the capacitive element and the resulting resonant frequency.
Abstract:
A drive module of liquid crystal panel is formed by arranging a plurality of transversal signal scan lines and a plurality of longitudinal data transmission lines on a liquid crystal panel. A signal scan control IC and a data transmission control IC having a memory component and a panel controller built therein are disposed at the upper and lower sides of the liquid crystal panel, respectively. Each of the data transmission lines is connected to the data transmission control IC with the shortest distance. The signal scan lines are connected to contacts at two sides of the signal scan control IC from two sides of the liquid crystal panel. The earlier a signal scan line is for scan, the closer to the inner side it is connected to a contact on the signal scan control IC.
Abstract:
A system for manufacturing semiconductor integrated circuit (IC) devices, including an operating control system, a process intermediate station in communication with the operating control system, and a gas purge device, wherein the gas purge device is included in the process intermediate station.