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120 条记录 (耗时 0.023 秒)

    Optical system of optical pick-up
    41.
    发明授权
    Optical system of optical pick-up 有权
    光学拾光器的光学系统

    公开(公告)号：US07339876B2

    公开(公告)日：2008-03-04

    申请号：US10829279

    申请日：2004-04-22

    申请人： Kenzo Yamanaka ,  Koichi Maruyama ,  Shuichi Takeuchi

    发明人： Kenzo Yamanaka ,  Koichi Maruyama ,  Shuichi Takeuchi

    IPC分类号： G11B7/00

    CPC分类号： G11B7/1374 ,  G11B7/1353 ,  G11B2007/0006

    摘要： There is provided an optical system of an optical pick-up for recording/reproducing data to/from at least two types of optical discs including a first optical disc and a second optical disc whose recording density is higher than that of the first optical disc. The optical system is provided with a light source unit for the first and second optical discs, an objective lens, and a photo detector. The optical system further includes an optical surface to satisfy compatibility between the at least two types of optical discs, the optical surface being located between the light source unit and one of the at least two type of optical discs. The optical surface has an inner region having a numerical aperture for the first optical disc, an outer region located having a numerical aperture for the second optical disc, and an intermediate region that is located within the outer region at a periphery of the inner region. Transmissivity for a light beam having a wavelength suitable for the first optical disc in the intermediate region is lower than that in the inner region.

    摘要翻译： 提供了一种用于向/从至少两种类型的光盘记录/再现数据的光学拾取器的光学系统，包括第一光盘和记录密度高于第一光盘的第二光盘。 光学系统设置有用于第一和第二光盘的光源单元，物镜和光电检测器。 光学系统还包括光学表面以满足至少两种类型的光盘之间的兼容性，光学表面位于光源单元和至少两种类型的光盘中的一种之间。 光学表面具有内部区域，其具有用于第一光盘的数值孔径，具有用于第二光盘的数值孔径的外部区域和位于内部区域周边的外部区域内的中间区域。 具有适合于中间区域中的第一光盘的波长的光束的透射率低于内部区域的透射率。

    Objective lens having diffractive structure for optical pick-up
    42.
    发明授权
    Objective lens having diffractive structure for optical pick-up 失效
    物镜具有用于光学拾取的衍射结构

    公开(公告)号：US06807019B2

    公开(公告)日：2004-10-19

    申请号：US10107133

    申请日：2002-03-28

    申请人： Shuichi Takeuchi ,  Koichi Maruyama

    发明人： Shuichi Takeuchi ,  Koichi Maruyama

    IPC分类号： G02B308

    CPC分类号： G11B7/13922 ,  G02B5/1895 ,  G11B7/1353 ,  G11B7/1374 ,  G11B2007/0006

    摘要： Disclosed is an objective lens of an optical pick-up that converges light beams of two different wavelengths onto recording layers of optical discs of two different standards, respectively. The objective lens includes a refractive lens having a positive power and a diffractive lens structure formed on one surface of the refractive lens. The diffractive lens structure has a plurality of concentric ring areas with minute steps at the boundaries therebetween. The diffractive lens structure maximizes the diffraction efficiency of the third order diffracted light at the shorter wavelength and maximizes the diffraction efficiency of the second order diffracted light at the longer wavelength. This enables the diffractive lens structure to correct the chromatic aberration at the respective wavelengths with keeping high diffraction efficiency.

    摘要翻译： 公开了将两种不同波长的光束分别聚焦到两种不同标准的光盘的记录层上的光学拾取器的物镜。 物镜包括具有正功率的折射透镜和形成在折射透镜的一个表面上的衍射透镜结构。 衍射透镜结构具有在它们之间的边界处具有微小阶梯的多个同心圆环区域。 衍射透镜结构使得在较短波长处的三次衍射光的衍射效率最大化，并且使较长波长的二次衍射光的衍射效率最大化。 这使得衍射透镜结构能够以高衍射效率来校正各波长处的色像差。

    Objective lens for optical pick-up
    43.
    发明授权
    Objective lens for optical pick-up 有权
    物镜用于光学拾取

    公开(公告)号：US06624942B2

    公开(公告)日：2003-09-23

    申请号：US10166680

    申请日：2002-06-12

    申请人： Koichi Maruyama ,  Shuichi Takeuchi

    发明人： Koichi Maruyama ,  Shuichi Takeuchi

    IPC分类号： G02B2744

    CPC分类号： G02B5/1876

    摘要： An objective lens for an optical pick-up has a refractive lens element provided with a diffraction lens structure on at least one surface thereof. The diffraction lens structure has a plurality of annular zones. The objective lens is capable of converging at least two beams having different wavelengths on at least two types of optical discs having different data recording densities, respectively. The objective lens is partitioned into a common area through which a beam with a low NA passes, and an exclusive high NA area which is designed to converge a beam with a high NA. The boundaries of the annular zones formed on the exclusive high NA area are designed independently from boundaries obtained from an optical path difference function so that the beam with the high NA is converged substantially on a certain point and the beam with the low NA is diffused.

    摘要翻译： 用于光学拾取器的物镜具有在其至少一个表面上设置有衍射透镜结构的折射透镜元件。 衍射透镜结构具有多个环形区域。 物镜能够在具有不同数据记录密度的至少两种类型的光盘上分别聚焦具有不同波长的至少两束光束。 物镜被分割成具有低NA的光束通过的公共区域和被设计成会聚具有高NA的光束的专用高NA区域。 形成在专用高NA区域上的环形区域的边界独立于从光程差函数获得的边界设计，使得具有高NA的光束基本上会聚在某一点上，并且具有低NA的光束被扩散。

    Diffraction optical element
    44.
    发明授权
    Diffraction optical element 有权
    衍射光学元件

    公开(公告)号：US06624941B2

    公开(公告)日：2003-09-23

    申请号：US10166677

    申请日：2002-06-12

    申请人： Shuichi Takeuchi ,  Koichi Maruyama

    发明人： Shuichi Takeuchi ,  Koichi Maruyama

    IPC分类号： G02B2744

    CPC分类号： G02B5/1876

    摘要： A diffraction optical element is configured such that a plurality of annular zones having minute steps extending in a direction of the optical axis therebetween are formed on a base element. The plurality of annular zones include narrow and wide zones respectively satisfying conditions (1) and (2): &Dgr;Z(i) (3/2)·&Dgr;E(i)  (2), wherein, i represents the order of the steps counted from the optical axis, &Dgr;E(i) represents an absolute value of an OPD provided by the i-th step, and &Dgr;Z(i) represents an absolute value of a difference between OPDs provided, with respect to a base curve, by an inner side end portion and outer side end portion of an annular zone between an i-th step and (i+1)-th step.

    摘要翻译： 衍射光学元件被构造成使得在基底元件上形成具有沿其光轴方向延伸的微小台阶的多个环形区域。 多个环形区域包括分别满足条件（1）和（2）的狭窄宽区域：其中，i表示从光轴计数的步骤的顺序，DeltaE（i）表示由光轴提供的OPD的绝对值 第i步，并且DeltaZ（i）表示在第i步和第i步之间的环形区的内侧端部和外侧端部之间相对于基线曲线提供的OPD之间的差的绝对值 （i + 1）步。

    Slider tester
    48.
    发明申请
    Slider tester 审中-公开
    滑块测试仪

    公开(公告)号：US20090146652A1

    公开(公告)日：2009-06-11

    申请号：US12292650

    申请日：2008-11-24

    申请人： Norio Kainuma ,  Kenji Kobae ,  Hidehiko Kira ,  Hiroshi Kobayashi ,  Shuichi Takeuchi ,  Takayoshi Matsumura ,  Hirokazu Yamanishi ,  Shinji Hiraoka ,  Yoshiaki Yanagida

    发明人： Norio Kainuma ,  Kenji Kobae ,  Hidehiko Kira ,  Hiroshi Kobayashi ,  Shuichi Takeuchi ,  Takayoshi Matsumura ,  Hirokazu Yamanishi ,  Shinji Hiraoka ,  Yoshiaki Yanagida

    IPC分类号： G01R33/12

    CPC分类号： G11B5/455 ,  G11B5/4555 ,  G11B5/6005 ,  H01R13/2421 ,  H01R2201/20

    摘要： A slider tester includes a driving unit that rotates a test medium, a set plate that detachably supports a slider as a single body, and an investigating apparatus that is electrically connected to the slider supported by the set plate and investigates the characteristics of the slider. A movable support part 30 that tiltably supports the slider is provided on the set plate. There is also provided a pressing mechanism that elastically presses the slider via the movable support part toward a surface of the medium to dispose the slider floating over the surface of the medium. The pressing mechanism includes an elastic body 56 composed of a plate spring that contacts the movable support part and elastically presses the movable support part.

    摘要翻译： 滑块测试器包括使测试介质旋转的驱动单元，可拆卸地支撑滑块作为单个主体的固定板，以及与由固定板支撑的滑块电连接的调查装置，并且调查滑块的特性。 在该固定板上设置有可滑动地支承滑块的可动支承部30。 还提供了一种按压机构，其通过可移动支撑部件朝向介质的表面弹性地按压滑块以将滑块设置在介质表面上。 按压机构包括弹性体56，其由与所述可动支撑部接触并弹性地按压所述可动支撑部的板簧构成。

    Scanning Electron Microscope
    49.
    发明申请
    Scanning Electron Microscope 有权
    扫描电子显微镜

    公开(公告)号：US20080191135A1

    公开(公告)日：2008-08-14

    申请号：US12021810

    申请日：2008-01-29

    申请人： Yasuko Aoki ,  Tetsuya Sawahata ,  Mine Araki ,  Atsushi Muto ,  Shuichi Takeuchi

    发明人： Yasuko Aoki ,  Tetsuya Sawahata ,  Mine Araki ,  Atsushi Muto ,  Shuichi Takeuchi

    IPC分类号： G01N23/00

    CPC分类号： G01N23/203 ,  G01N23/225 ,  H01J37/244 ,  H01J37/28 ,  H01J2237/24465 ,  H01J2237/24475 ,  H01J2237/2448 ,  H01J2237/24495

    摘要： An object of the present invention is to provide a scanning electron microscope including decelerating-electric-field forming means for decreasing the energy of a beam of electrons reaching a sample, and being capable of selectively detecting BSEs with high efficiency. To this end, the scanning electron microscope including the decelerating-electric-field forming means has a detector for detecting electrons. The detector includes a part for receiving the electrons at a position which is positioned outside trajectories of SEs accelerated by the decelerating-electric-field forming means, and which is further away from the optical axis of the beam of electrons than the trajectories of the SEs.

    摘要翻译： 本发明的目的是提供一种扫描电子显微镜，其包括用于降低到达样品的电子束的能量的减速电场形成装置，并且能够以高效率选择性地检测BSE。 为此，包括减速电场形成装置的扫描电子显微镜具有用于检测电子的检测器。 检测器包括用于在位于由减速电场形成装置加速的SE的轨迹外的位置处接收电子的部分，并且远离SE的轨迹远离电子束的光轴 。