Abstract:
An embodiment of a semiconductor apparatus may include technology to determine a differentiator associated with an access request for two or more memory devices, and set a target order for the two or more memory devices based on the differentiator. Other embodiments are disclosed and claimed.
Abstract:
Provided are a method and apparatus for remapping logical to physical addresses for a non-volatile memory having dies. Bands extend through the dies and planes in the dies extending through the bands define addressable blocks. A first remapping of a logical-to-physical mapping is performed by remapping logical addresses of blocks in a first end of the bands that map to defective physical blocks to map to good physical blocks at a second end of the bands. After performing the first remapping, a second remapping of the logical-to-physical mapping is performed by remapping logical addresses in the second end of bands that map to defective blocks to map to good physical blocks in the first end of bands.
Abstract:
An example apparatus includes a non-volatile memory including a first memory having a first write rate and a second memory having a second write rate, the first write rate greater than the second write rate An example controller is to determine, based on a ratio, a first portion of the data to be written to the first memory, and a second portion of the data to be written to the second memory type, the second portion of the data not included in the first portion of the data.
Abstract:
According to one configuration, a memory system includes a configuration manager and multiple memory devices. The configuration manager includes status detection logic, retrieval logic, and configuration management logic. The status detection logic receives notification of a failed attempt by a first memory device to be initialized with custom configuration settings stored in the first memory device. In response to the notification, the retrieval logic retrieves a backup copy of configuration settings information from a second memory device in the memory system. The configuration management logic utilizes the backup copy of the configuration settings information retrieved from the second memory device to initialize the first memory device.
Abstract:
Methods and apparatus related to a mechanism for quickly adapting garbage collection resource allocation for an incoming I/O (Input/Output) workload are described. In one embodiment, non-volatile memory stores data corresponding to a first workload and a second workload. Allocation of one or more resources in the non-volatile memory is determined based at least in part on a determination of an average validity of one or more blocks, where the one or more candidate bands are to be processed during operation of the first workload or the second workload. Other embodiments are also disclosed and claimed.
Abstract:
Apparatus, systems, and methods to implement read operations in nonvolatile memory devices are described. In one example, a controller comprises logic to receive a first read request from a host device, place the first read request in a read queue comprising a plurality of read requests directed to the nonvolatile memory, determine a first target die and a first target plane in the nonvolatile memory for the first read request and combine the first read request with at least a second read request in the read queue to form a combined read request, wherein the second read request comprise a second target die, which is the same as the first target die, and a second target plane which is different from the first target plane. Other examples are also disclosed and claimed.
Abstract:
An electronic memory or controller may use a first type of read command, addressed to a first page of memory of an electronic memory that includes information to indicate that a second page of memory of the electronic memory has not been programmed and a second type of read command, addressed to the first page of memory, that includes information to indicate that the second page of memory has been programmed. The first page of memory may include a lower page of a multi-level cell (MLC), and the second page of memory may include an upper page of the same MLC. The second page of memory is enabled during a period of time that the first type of read command is used.
Abstract:
An electronic memory or controller may use a first type of read command, addressed to a first page of memory of an electronic memory that includes information to indicate that a second page of memory of the electronic memory has not been programmed and a second type of read command, addressed to the first page of memory, that includes information to indicate that the second page of memory has been programmed. The first page of memory may include a lower page of a multi-level cell (MLC), and the second page of memory may include an upper page of the same MLC. The second page of memory is enabled during a period of time that the first type of read command is used.
Abstract:
A flash memory device may include two or more flash memory cells organized as a NAND string in a block of flash memory cells, and flash cells, coupled to the NAND string at opposite ends, to function as select gates. The flash memory device may be capable of providing information related to a voltage threshold of the select gates to a flash controller, erasing the flash cells that function as select gates in response to a select gate erase command, and programming the flash cells that function as select gates in response to a select gate program command. A flash controller may be coupled to the flash memory device, and is capable of sending the select gate erase commend to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is above a predetermined voltage level, and sending the select gate program command to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is outside of a predetermined voltage range.
Abstract:
A flash memory device may include two or more flash memory cells organized as a NAND string in a block of flash memory cells, and flash cells, coupled to the NAND string at opposite ends, to function as select gates. The flash memory device may be capable of providing information related to a voltage threshold of the select gates to a flash controller, erasing the flash cells that function as select gates in response to a select gate erase command, and programming the flash cells that function as select gates in response to a select gate program command. A flash controller may be coupled to the flash memory device, and is capable of sending the select gate erase commend to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is above a predetermined voltage level, and sending the select gate program command to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is outside of a predetermined voltage range.