摘要:
A method for storing state information, the method includes storing, at a first circuit, state information representative of a state of a second circuit while the second circuit enters a low power mode; characterized by receiving an indication that a task switching from a first task to a second task should occur; storing a state information representative of a state of the second circuit, at the first circuit; receiving an indication that the first task should be resumed; and writing the stored state information from the first circuit to the second circuit. A system includes a first circuit and a second circuit, whereas the first circuit is connected to the second circuit and is adapted to store state information representative of a state of a second circuit; characterized by including a controller adapted to control a storage of the state information if at least a portion of the second circuit is powered down or if the second circuit is associated with a task switching operation.
摘要:
The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit.
摘要:
An apparatus for voltage ripple reduction on a power supply line of an integrated circuit device is provided to be operable in at least two modes. The apparatus includes: one or more clamping devices connectable to the power supply line; a clamp control unit; and a mode change detection unit arranged to monitor an interface of the integrated circuit device for one or more information indicating an upcoming mode change of the integrated circuit device and to provide a mode change signal to the clamp control unit when the one or more information is detected. The clamp control unit is arranged to connect at least one of the one or more clamping devices to the power supply line when receiving the mode change signal.
摘要:
An integrated circuit is provided that includes a plurality of modules comprising at least one clock-gated module and a controller unit, which is arranged to enable and disable provision of a clock signal to the at least one clock-gated module. The at least one clock-gated module includes one or more electronic circuits arranged to be in a first state of an electrical stress condition during a first portion of a period of time and in a second state of less electrical stress than in the first state during a second portion of the period of time. The at least one clock-gated module is further arranged to switch the one or more electronic circuits between the first state and the second state such that a change of a characteristic of at least one of the one or more electronic circuits caused by the electrical stress condition is at least partially reduced.
摘要:
An input/output (IO) driver circuit is described. The IO buffer driver circuit comprises: at least one input for receiving an input signal and at least one output for providing at least one output signal; and a plurality of switches arranged to provide a variable voltage level between a low voltage value and a high voltage value to the at least one output. The at least one first switch of the plurality of switches is arranged to initiate a voltage change to an intermediate voltage level between the low voltage value and the high voltage value in a first time period. The at least one second switch of the plurality of switches is arranged to continue the voltage change to the low voltage value or the high voltage value in a second time period.
摘要:
An asymmetric multi-core processing module is described. The asymmetric multi-core processing module comprises at least one processing core of a first type, at least one processing core of at least one further type, and at least one core identifier configuration component. The at least one core identifier configuration component is arranged to enable dynamic configuration of a value of a core identifier of at least one of the processing cores of the first and at least one further types.
摘要:
A method and an apparatus for controlling voltage level and clock signal frequency supplied to a system. The method comprises: providing at least one reference circuit representative of a behavior of at least one estimated circuit, whereas the at least one estimated circuit includes transistors of multiple types; supplying at least one input signal to at least one reference circuits and monitoring a behavior of the at least one reference circuit one or more reference circuit; determining a characteristic of at least one output signal provided to the at least one estimated circuit; and providing at least one output signal to one or more estimated circuitsThe apparatus includes at least one reference circuit representative of a behavior of at least one estimated circuit, whereas the at least one estimated circuit includes transistors of multiple types; and monitoring circuitry adapted to monitor a behavior of at least one reference circuit and to determine a characteristic of at least one output signal provided to the at least one estimated circuit.
摘要:
An integrated circuit device comprises a signal processing system having at least one first signal processing module fabricated by way of a first production process; and at least one second signal processing module fabricated by way of a second production process, wherein the second production process is different to the first production process. The signal processing system further comprises a signal processing management module arranged to: determine a desired system performance of the integrated circuit device; determine at least one operating condition of the signal processing system; and configure a signal processing operating mode of the signal processing system based at least partly on: the determined desired system performance; the at least one determined operating condition; and at least one of the first production process and the second production process.
摘要:
A method for protecting a secured real time clock module, the method includes: locking multiple input ports of the secured real time clock module if the multiple input ports of the secured real time clock module are idle during at least a first duration; unlocking the multiple input ports of the secured real time clock module if a predefined high frequency code is received over a control input port of the secured real time clock module; and providing a secured real time clock signal when the multiple input ports of the secured real time clock module are locked and when the multiple input ports of the secured real time clock module are unlocked; wherein changes in a supply voltage results in a supply voltage induced changes of an input signal provided to an input port of the secured real time clock module; wherein a maximal frequency of the supply voltage induced changes of the input signal is lower than the high frequency of the predefined high frequency code.
摘要:
A method and a device for estimating parameter variations of transistors that belong to the same circuit. The method includes: providing the first circuit; providing a test circuit adapted to perform a first function and a stacked test circuit adapted to perform a second function that substantially equals the first function; wherein the test circuit, the stacked test circuit and the first circuit are processed under substantially the same processing conditions; determining a relationship between a parameter of the test circuit and a parameter of the stacked test circuit; and estimating parameter variations of transistors that belong to the first circuit in response to the determined relationship.