公开(公告)号：US20170176250A1

公开(公告)日：2017-06-22

申请号：US14977259

申请日：2015-12-21

Applicant: STMicroelectronics (Research & Development) Limited

Inventor： Bruce Rae ,  Ivan Ivanov

IPC: G01J1/44 ,  H01L27/146 ,  H01L31/107

CPC classification number: H01L27/14683 ,  G01J2001/442 ,  G01J2001/4466 ,  G01J2001/448 ,  H01L27/14609 ,  H01L27/14636 ,  H01L27/14643

Abstract: A device includes an array of single photon avalanche diodes (SPADs) and a plurality of pulse shapers. Each of the SPADs are electrically coupled to a respective SPAD quench circuit. Each of the pulse shapers have an input electrically coupled to an output of a respective SPAD quench circuit.

公开(公告)号：US20170003165A1

公开(公告)日：2017-01-05

申请号：US14755745

申请日：2015-06-30

Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

Inventor： Orit SKORKA ,  Salman KABIR

IPC: G01J1/44 ,  G01J1/04 ,  H01L27/146 ,  G01J1/02

CPC classification number: G01J1/44 ,  G01J1/0209 ,  G01J1/0411 ,  G01J1/0488 ,  G01J2001/446 ,  G01J2001/448 ,  H01L27/1461 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14636 ,  H01L27/1464 ,  H01L27/14685

Abstract: An image sensor with an array of pixels is provided. In order to achieve high image quality, it may be desirable to improve well capacity of individual pixels within the array by forming deep photodiodes in a thick substrate. When forming the array of pixels, conductive contacts may be formed in a back surface of the substrate opposing ground contacts located on a front side of the substrate. A conductive grid layer may be formed over the conductive contacts. A color filter layer may be formed over the conductive grid layer that may include a barrier grid in which color filter material is deposited. The conductive grid layer and conductive contacts may be biased to a voltage to improve the strength of electric fields in the substrate. Conductive contacts will thereby improve charge collection and electrical isolation and prevent electrical crosstalk and blooming.

Abstract translation: 提供具有像素阵列的图像传感器。 为了实现高图像质量，可能需要通过在厚衬底中形成深度光电二极管来提高阵列内的各个像素的良好容量。 当形成像素阵列时，可以在衬底的背面中形成导电触点，该衬底的相对于位于衬底前侧的接地触点。 可以在导电触点上形成导电栅格层。 可以在导电栅格层上形成滤色器层，其可以包括其中沉积滤色器材料的阻挡栅格。 导电栅格层和导电触点可以被偏压到电压以改善衬底中的电场强度。 因此，导电接触将改善电荷收集和电隔离，并防止电串扰和起霜。

公开(公告)号：US20160273961A1

公开(公告)日：2016-09-22

申请号：US14743891

申请日：2015-06-18

Applicant: SK hynix Inc.

Inventor： Do-Hwan KIM

IPC: G01J1/44 ,  H01L27/146

CPC classification number: G01J1/44 ,  G01J2001/446 ,  G01J2001/448 ,  H01L27/14612 ,  H01L27/14634 ,  H01L27/14636

Abstract: An image sensor includes a light receiving section suitable for generating photocharges corresponding to incident light, a first driving section suitable for transferring a first output voltage corresponding to a first voltage to a first column line based on the photocharges, a second driving section suitable for transferring a second output voltage corresponding to a second voltage to a second column line based on the photocharges, and an output section suitable for outputting an image signal based on the first and second output voltages.

Abstract translation: 图像传感器包括适于产生对应于入射光的光电荷的光接收部分，适于将基于光电荷的第一电压对应的第一输出电压传送到第一列线的第一驱动部分，适于转移的第二驱动部分 基于光电荷对应于第二列线的第二电压的第二输出电压，以及适于基于第一和第二输出电压输出图像信号的输出部分。

公开(公告)号：US20160195385A1

公开(公告)日：2016-07-07

申请号：US15068439

申请日：2016-03-11

Applicant: Carl Zeiss Industrielle Messtechnik GmbH

Inventor： Frank Hoeller ,  Bernd Spruck

IPC: G01B11/24 ,  G01J1/44

CPC classification number: G01B11/2425 ,  G01J1/44 ,  G01J2001/448

Abstract: The invention is directed to a method for measuring an internal thread of a workpiece with a coordinate measuring apparatus and a CCD or CMOS sensor. The sensor records at least two images of a section of the internal thread and the recording conditions for the two images are modified. The data from these two recorded images are used to establish the position, orientation, core diameter and/or the pitch of the internal thread. The invention is also directed to an arrangement for measuring an internal thread of a workpiece and includes a coordinate measuring apparatus and the CCD or CMOS sensor in accordance with the above method.

Abstract translation: 本发明涉及一种用坐标测量装置和CCD或CMOS传感器测量工件的内螺纹的方法。 传感器记录内部线段的至少两个图像，并且修改两个图像的记录条件。 来自这两个记录图像的数据用于建立内螺纹的位置，取向，芯直径和/或间距。 本发明还涉及一种用于测量工件的内螺纹的装置，并且包括坐标测量装置和根据上述方法的CCD或CMOS传感器。

公开(公告)号：US20160147091A1

公开(公告)日：2016-05-26

申请号：US14919074

申请日：2015-10-21

Applicant: e.solutions GmbH

Inventor： Stefan CHRISTMANN ,  Thomas FRANKE

IPC: G02F1/137 ,  G09G3/36 ,  G09G3/34 ,  G02F1/1335

CPC classification number: G09G3/3406 ,  G01J1/0266 ,  G01J1/0411 ,  G01J1/0437 ,  G01J3/433 ,  G01J2001/448 ,  G02F1/13306 ,  G03B9/02 ,  G03B11/043 ,  G09G2320/0626 ,  G09G2360/144 ,  H01L27/1446

Abstract: An optical device is described. The device has a sensor having a light incident side, wherein the sensor is designed to convert light that is incident upon the light incident side into an electrical signal. In one embodiment, the device further has at least one lens and a liquid crystal device which is arranged in front of the light incident side of the sensor in such a manner that the at least one lens is situated between the liquid crystal device and the sensor, wherein the liquid crystal device comprises at least one region whose light transmission is electronically controllable. There are further described an electronic device, a method of controlling an optical device, and a computer program.

Abstract translation: 描述光学装置。 该装置具有光入射侧的传感器，其中传感器被设计成将入射在光入射侧的光转换成电信号。 在一个实施例中，该装置还具有至少一个透镜和液晶装置，其被布置在传感器的光入射侧的前方，使得至少一个透镜位于液晶装置和传感器之间 ，其中所述液晶装置包括至少一个光透射是电子可控的区域。 还描述了电子设备，控制光学设备的方法和计算机程序。

公开(公告)号：US20130161494A1

公开(公告)日：2013-06-27

申请号：US13607123

申请日：2012-09-07

Applicant: Young-Chul SOHN

Inventor： Young-Chul SOHN

IPC: H03K5/153 ,  G01J1/44

CPC classification number: G01J1/46 ,  G01J2001/448 ,  G11C27/02 ,  G11C27/024 ,  H04N5/378

Abstract: A signal sampling circuit includes: a signal output unit configured to output a level signal to an output node in response to a control signal; a signal sampling unit coupled to the output node and configured to sample the level signal in a sampling period; a first current sinking unit configured to sink a constant current from the output node; and a second current sinking unit configured to sink a current from the output node after a time point where the control signal is deactivated.

Abstract translation: 信号采样电路包括：信号输出单元，被配置为响应于控制信号将电平信号输出到输出节点; 信号采样单元，其耦合到所述输出节点并且被配置为在采样周期中对所述电平信号进行采样; 第一电流吸收单元，被配置为从所述输出节点吸收恒定电流; 以及第二电流吸收单元，配置成在控制信号被去激活的时间点之后从输出节点吸收电流。

公开(公告)号：US5812690A

公开(公告)日：1998-09-22

申请号：US104057

申请日：1993-10-01

Applicant: John Lawrence Fordham

Inventor： John Lawrence Fordham

IPC: G01J1/44 ,  G01J1/42 ,  G01J11/00 ,  G06T7/60

CPC classification number: G01J1/42 ,  G01J2001/442 ,  G01J2001/448

Abstract: A method is provided for setting up a photon counting detector, to enable it to carry out a centroiding procedure in which a photon event occurring in a given range is allocated to one of a plurality of channels into which the range is divided. The method comprises the steps of: a) sub-dividing the range into a plurality of channels of preferably equal width and loading the channel boundaries into a look-table; b) performing an integration on a flat field and allocating photon events to the channels defined in step a); c) counting the number of events allocated to each channel; d) altering the channel boundaries in directions tending to equalize the number of events allocated to each; and, optionally, e) repeating steps b), c) and d) until the variation between the number of events held by the channels is at an acceptable level.

Abstract translation: PCT No.PCT / GB92 / 00224 Sec。 371日期：1993年10月1日 102（e）日期1993年10月1日PCT提交1992年2月6日PCT公布。 公开号WO92 / 14127 日期1992年8月20日提供了一种用于设置光子计数检测器的方法，以使其能够执行质心过程，其中在给定范围内发生的光子事件被分配给多个通道中的一个，其中范围是 分为。 该方法包括以下步骤：a）将该范围细分成多个优选相等宽度的信道，并将信道边界加载到查表中; b）在平坦场上执行积分并将光子事件分配给步骤a）中定义的通道; c）计算分配给每个频道的事件数; d）改变趋向于均衡分配给每个事件的事件数的方向的通道边界; 并且可选地，e）重复步骤b），c）和d），直到由信道保持的事件数量之间的变化处于可接受的水平。

公开(公告)号：US5459323A

公开(公告)日：1995-10-17

申请号：US927504

申请日：1992-09-11

Applicant: Christopher G. Morgan

Inventor： Christopher G. Morgan

IPC: G01J1/44 ,  G01N21/64

CPC classification number: G01N21/6408 ,  G01J2001/442 ,  G01J2001/448 ,  G01J2001/4493

Abstract: Apparatus for producing decay time weighted information (e.g. a decay time weighted image) of a luminescent sample, comprises an excitation light source arranged to illuminate the sample, means for modulating or pulsing the intensity of the excitation light in a predetermined cyclical manner, detector means for detecting photons emitted by the sample as a result of luminescence, means for storing data representative of detected photons, the stored data being weighted as a function of phase difference between detection of photons and the cyclically varying modulation, and means for producing decay time weighted information from the stored data.

Abstract translation: PCT No.PCT / GB91 / 00046 Sec。 371日期：1992年9月11日 102（e）1992年9月11日PCT PCT 1991年1月14日PCT公布。 公开号WO91 / 10897 日期：1991年7月25日。用于制造发光样品的衰减时间加权信息（例如衰减时间加权图像）的装置包括布置成照射样品的激发光源，用于调制或脉冲激发光强度的装置 预定的周期性方式，用于检测作为发光的结果由样品发射的光子的检测器装置，用于存储表示检测到的光子的数据的装置，所存储的数据被加权为光子的检测与循环变化的调制之间的相位差的函数， 以及用于从存储的数据产生衰减时间加权信息的装置。

公开(公告)号：US5256883A

公开(公告)日：1993-10-26

申请号：US959747

申请日：1992-10-13

Applicant: Armin Weichmann ,  Theodor Tatarczyk

Inventor： Armin Weichmann ,  Theodor Tatarczyk

IPC: B41F33/00 ,  G01J1/44 ,  G01N21/89 ,  H04N5/3725 ,  G01N21/86

CPC classification number: G01N21/8903 ,  B41F33/0036 ,  H04N3/1525 ,  G01J2001/448

Abstract: Information is received from an image on a moving substrate. Flash exposure is used, defining operating or exposure cycles. The reflection or a representation of the image is subdivided into a matrix having n columns and m rows or lines. The sensor is a charge coupled device (CCD), arranged to have a sensing area (11) with n columns and m rows or lines, and a storage region or section (12), likewise arranged to have storage cells of n and m columns and rows or lines. Information of any one image element, upon sensing, is shifted by a line transfer pulse by one image line. The line transfer pulses are synchronized with web movement of the substrate and operate as shift pulses. The m line, at the first transfer line shift pulse, is shifted into the first line or row of the matrix of the storage portion of the CCD. For each operating cycle, at least one line transfer pulse is used. The information of the image elements can be read out serially from the storage portion (12) at high speed. The storage portion of the CCD chip is protected against exposure to light.

Abstract translation: 从移动基板上的图像接收信息。 使用闪光曝光，定义工作或曝光周期。 图像的反射或表示被细分为具有n列和m行或行的矩阵。 传感器是电荷耦合器件（CCD），被布置为具有n列和m行或线的感测区域（11），以及存储区域或部分（12），其同样被布置成具有n和m列的存储单元 和行或行。 任何一个图像元素在感测时的信息通过线路传输脉冲移位一个图像线。 线传输脉冲与基板的幅材移动同步，并作为移位脉冲进行操作。 在第一传输线移位脉冲处的m行被移动到CCD的存储部分的矩阵的第一行或行中。 对于每个操作周期，使用至少一个线传输脉冲。 图像元素的信息可以从存储部分（12）高速读出。 CCD芯片的存储部分被防止曝光。

公开(公告)号：US5241178A

公开(公告)日：1993-08-31

申请号：US742052

申请日：1991-08-06

Applicant: John Shields

Inventor： John Shields

IPC: G01J1/44 ,  G01J3/12 ,  G01N21/31 ,  G01N21/35 ,  G01N21/85

CPC classification number: G01N21/359 ,  G01N21/3563 ,  G01J2001/448 ,  G01J2003/1247 ,  G01J3/0229 ,  G01J3/0235 ,  G01N2021/3133 ,  G01N2021/3148 ,  G01N2021/3174 ,  G01N2021/8592 ,  Y10S250/91

Abstract: Apparatus for quantitative analysis of a material sample, such as whole grain, as a function of optical characteristics thereof includes a light source and a solid state detector of silicon or other suitable construction. A material sample is positioned between the light source and the detector, and light energy is focused through the sample onto the detector at a plurality of preselected wavelengths in the near-infrared range of 800-1100 nm. Illumination wavelength is selectively controlled by an opaque disc having a central axis and a plurality of apertures around the periphery at uniform radius from the disc axis. A plurality of filter elements are carried by the disc over respective ones of the peripheral apertures and have transmission characteristics corresponding to the plurality of preselected wavelengths. The filter elements are carried in a continuous circumferential array around the disc periphery, with the array including at least one opaque section for chopping light energy incident on the detector. The disc is rotated about its axis in a continuous motion so that each filter element in turn intersects light energy transmitted through the sample. Analysis electronics is responsive to light energy incident on the detector at the plurality of preselected wavelengths to indicate a preselected characteristic of the material sample.

Abstract translation: 作为其光学特性的函数的材料样品（例如全粒子）的定量分析的装置包括光源和硅或其他合适结构的固态检测器。 材料样品位于光源和检测器之间，并且光能量以800-1100nm的近红外范围内的多个预选波长通过样品聚焦到检测器上。 照明波长由具有中心轴和围绕圆周的多个孔的不透光盘选择性地控制，该圆周以与光盘轴线成均匀的半径。 多个滤光元件由盘承载在相应的外围孔上，具有对应于多个预选波长的透射特性。 过滤元件以围绕盘周边的连续圆周阵列承载，阵列包括用于切割入射在检测器上的光能的至少一个不透明部分。 盘以其连续运动的方式绕其轴线旋转，使得每个过滤元件依次与透过样品的光能相交。 分析电子学响应于在多个预选波长处入射到检测器上的光能，以指示材料样品的预选特性。