Abstract:
A pre-charge step determining circuit of a generic bit line, particularly for non-volatile memories, including in one embodiment, circuitry for simulating the selection/deselection of a generic bit line of a memory device; circuitry for simulating the pre-charging of a bit line; and circuitry for determining when the working point of the bit line is reached; the selection/deselection simulation circuitry activating the pre-charging simulation means, which in turn activate the working point attainment determining circuitry, which generate a pre-charge end signal so as to define a minimal duration of the pre-charging that is closely correlated with the characteristics of the actual selection/deselection and pre-charge circuits of the memory device, with the supply conditions, and with the propagation of a generic bit line, the pre-charge simulation circuitry and the working point attainment determining circuitry being activated synchronously with respect to a new reading cycle of the memory device.
Abstract:
A CMOS output buffer circuit includes a final amplifier stage having a pull-up transistor and a pull-down transistor connected between a voltage supply and ground and having a common output node, and a control circuitry for driving the final amplifier stage including a first logic gate supplied with an input data signal, the first logic gate driving the pull-up transistor, a second logic gate supplied with said input data signal, the second logic gate driving the pull-down transistor. The pull-up transistor has a bulk electrode connected to a switchable bulk line; an auxiliary circuit is provided which as long as a voltage of the output node is not higher than said supply voltage keeps said switchable bulk line connected to the voltage supply. The first logic gate includes circuitry for transferring the voltage of the output node to said switchable bulk line when the voltage of the output node exceeds the supply voltage.
Abstract:
A sense circuit for reading EPROM and ROM type memory cells employs a circuit for generating an offsetting current which is exempt of error during transients and which thus permits to achieve a reduced access time. On the other hand, the sense circuit maintains the intrinsic advantages of a current-offset sensing architecture which is represented by a substantially unlimited operating voltage range toward the maximum value VCC.sub.max. The current generating circuit is driven by means of a supplementary row of cells which is decoded at every reading and which replicates, during transients, the behaviour of the row selected for the reading.
Abstract:
The power output of a static DC--DC converter employing a current mode PWM controller is controlled upon the varying of the switching frequency, by detecting the sawtooth signal produced by the local oscillator generating a DC signal with an amplitude inversely proportional to the frequency. The power output is controlled by alternatively clamping the output voltage of the error amplifier of the PWM controller at a voltage proportional to the amplitude of the DC signal, or by offsetting the signal present on the current sensing resistor by a voltage corresponding to the difference between a constant voltage and the DC signal.
Abstract:
A bipolar power transistor of interdigitated geometry having a buried P type base region, a buried N type emitter region, a P type base-contact region, an N type emitter-contact region, connected to an emitter electrode and an N type connection region disposed around the emitter-contact region. The emitter region is buried within the base region in such a way that the buried emitter region and the connection region delimit a P type screen region. The transistor further includes a biasing P type region in contact with the emitter electrode, which extends up to the screen region.
Abstract:
A method of depositing a layered dielectric structure to improve the planarity of electronic devices which include a plurality of active elements having gate regions laid across the substrate as discrete parallel lines, such as the bit lines of memory cells. The bit lines are isolated from one another by a layered dielectric structure to provide a planar architecture onto which an optional conductive layer may be deposited. The dielectric structure is formed from a highly planarizing dielectric layer of the SOG type spun over a first insulating dielectric layer and solidified by means of a thermal polymerization process. After solidifying the dielectric layer, it is subjected to a rapid thermal annealing treatment.
Abstract:
A power integrated circuit including a substrate of semiconductor material having a first conductivity type on which is formed a first epitaxial layer of the same conductivity type. In a first portion of the first epitaxial layer are formed first and second diffused regions having respectively first and second conductivity type. The first and the second diffused regions are isolated from a power stage included partially in a second portion of the first epitaxial layer by an annular region having the second conductivity type. Over the first epitaxial layer is formed a second epitaxial layer having the first conductivity type in which are extended the first and the second diffused regions to permit forming a control circuitry for the power stage.
Abstract:
A synchronization circuit for electronic devices and components, being of the type which includes an internal synchronization signal generator and an input/output terminal whereat an external synchronization signal can be received. The synchronization circuit further includes a comparator for receiving both synchronization signals and having a control output for supplying a terminal with the signal corresponding to the master/slave mode of operation of the synchronization circuit. A method of generating and supplying a synchronization signal to a plurality of electronic devices being operated as slave devices to a synchronization circuit acting as the master device is also provided.
Abstract:
The invention refers to a generating circuit for synchronization signals to regulate the read phase of memory cells in electronic devices with an integrated memory on a semiconductor, of the type controlled by a switching of logical states on a left ATD bus and a right ATD bus and comprising a left and a right section inserted between a first and a second voltage reference and connected respectively to the left and the right ATD bus, the sections being connected at the input to a reference-voltage generated and at the output to an ATD generator. Each of the sections of the generating circuit according to the invention includes a pull-up transistor inserted between the first voltage reference and a first internal circuit node and having a control terminal connected to a polarization structure suitable for modifying the conductivity of pull-up transistors, intentionally reduced in the coupling phase to assure capture of all transitions on the left and right ATD buses, and increased in the operating phase to follow with precision the events of the transition, guiding the read phase in a timely manner.
Abstract:
The circuit of a two-stage fully differential amplifier includes a differential input stage, two output stages and a common mode feedback circuit coupled to the output nodes of the amplifier. The amplifier also includes a non-inverting stage coupled to a respective output node of the differential input stage for driving the respective output stage. Each auxiliary non-inverting stage of the two branches of the fully differential amplifier uses as a biasing current generator, the load device of the branch of the differential input stage to the output of which the non-inverting stage is coupled. The fully differential amplifier permits the use of a null-consumption common mode feedback circuit as normally employed only in a single stage fully differential amplifier.