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公开(公告)号：US09829508B2
公开(公告)日：2017-11-28
申请号：US14791012
申请日：2015-07-02
Applicant: TECHNOPROBE S.p.A.
Inventor： Stefano Felici , Raffaele Vallauri , Roberto Crippa
CPC classification number: G01R1/07321 , G01R1/07357
Abstract: It is described a testing head for a testing equipment of an electronic device comprising at least one upper guide and a lower guide provided with guide holes, a plurality of contact probes inserted into the guide holes of the upper and lower guides and at least one containment element of the probes being is disposed between the upper and lower guides, each of the contact probes having at least one terminal portion which ends with a contact tip adapted to abut on a respective contact pad of the electronic device to be tested; at least one spacer element sandwiched between the containment element and at least one of the upper and lower guides, the spacer element being removable to adjust a length of the terminal portions of the contact probes projecting from the lower guide.
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公开(公告)号：US20170299634A1
公开(公告)日：2017-10-19
申请号：US15640130
申请日：2017-06-30
Applicant: Technoprobe S.p.A.
Inventor： Giuseppe Crippa , Roberto Crippa
CPC classification number: G01R3/00 , G01R1/06761 , G01R1/07307 , G01R1/07314
Abstract: A manufacturing method of a semi-finished product that includes a plurality of contact for a testing head of electronic devices comprises the steps of: providing a substrate made of a conductive material; and defining each contact probe by removing material from the substrate, each contact probes being anchored to the substrate by at least one bridge of material. The step of defining the contact probes includes a step of laser cutting, in correspondence with a contour of the contact probes and of that at least one bridge of material.
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公开(公告)号：US20150309076A1
公开(公告)日：2015-10-29
申请号：US14791012
申请日：2015-07-02
Applicant: TECHNOPROBE S.p.A.
Inventor： Stefano Felici , Raffaele Vallauri , Roberto Crippa
IPC: G01R1/073
CPC classification number: G01R1/07321 , G01R1/07357
Abstract: It is described a testing head for a testing equipment of an electronic device comprising at least one upper guide and a lower guide provided with guide holes, a plurality of contact probes inserted into the guide holes of the upper and lower guides and at least one containment element of the probes being is disposed between the upper and lower guides, each of the contact probes having at least one terminal portion which ends with a contact tip adapted to abut on a respective contact pad of the electronic device to be tested; at least one spacer element sandwiched between the containment element and at least one of the upper and lower guides, the spacer element being removable to adjust a length of the terminal portions of the contact probes projecting from the lower guide.
Abstract translation: 描述了一种用于电子设备的测试设备的测试头，其包括至少一个上引导件和设置有引导孔的下引导件，插入到上引导件和下引导件的引导孔中的多个接触探针和至少一个容纳件 探针的元件设置在上引导件和下引导件之间，每个接触探针具有至少一个末端部分，端接部分以接触末端为末端，接触头部适于邻接待测试的电子设备的相应接触焊盘; 夹在所述容纳元件与所述上导向件和所述下导向件中的至少一个之间的至少一个间隔元件，所述间隔元件可移除以调节从所述下引导件突出的所述接触探针的端子部分的长度。
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54.发明授权Method for cleaning a contact pad of a microstructure and corresponding cantilever contact probe and probe testing head 有权清洁微结构接触垫和相应的悬臂接触探针和探头测试头的方法公开(公告)号：US08981803B2
公开(公告)日：2015-03-17
申请号：US13661980
申请日：2012-10-26
Applicant: Technoprobe S.p.A.
Inventor： Riccardo Vettori
CPC classification number: G01R1/06727 , G01R1/06733 , G01R31/2898
Abstract: A method for cleaning a contact pad of a microstructure or device to be tested when it is in electric contact with a measure apparatus, being obtained by electrically contacting a flexible probe with said contact pad. The method includes mechanically engaging a free end of the flexible probe in a manner that sticks the free end in the pad; and laterally flexing, by a tip charge, the flexible probe in a manner that keeps the free end stuck in the pad, so as to locally dig into a covering layer of the pad and realize a localized crushing thereof.
Abstract translation: 一种用于在与测量装置电接触时清洁待测试的微结构或器件的接触焊盘的方法，其通过将柔性探针与所述接触垫电接触而获得。 该方法包括以将自由端粘贴在垫中的方式机械接合柔性探针的自由端; 并且以保持自由端保持在垫中的方式通过尖端装料横向弯曲柔性探针，以便局部地挖入垫的覆盖层并实现其局部破碎。
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55.发明申请公开(公告)号：US20130049782A1
公开(公告)日：2013-02-28
申请号：US13661980
申请日：2012-10-26
Applicant: Technoprobe S.p.A.
Inventor： Riccardo Vettori
CPC classification number: G01R1/06727 , G01R1/06733 , G01R31/2898
Abstract: A method for cleaning a contact pad of a microstructure or device to be tested when it is in electric contact with a measure apparatus, being obtained by electrically contacting a flexible probe with said contact pad. The method includes mechanically engaging a free end of the flexible probe in a manner that sticks the free end in the pad; and laterally flexing, by means of a tip charge, the flexible probe in a manner that keeps the free end stuck in the pad, so as to locally dig into a covering layer of the pad and realize a localized crushing thereof.
Abstract translation: 一种用于在与测量装置电接触时清洁待测试的微结构或器件的接触焊盘的方法，其通过将柔性探针与所述接触垫电接触而获得。 该方法包括以将自由端粘贴在垫中的方式机械接合柔性探针的自由端; 并且以使得自由端保持在垫中的方式通过尖端装料横向挠曲，以便局部地挖入垫的覆盖层并实现其局部破碎。
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Patent Agency Ranking
公开(公告)号：US12044703B2
公开(公告)日：2024-07-23
申请号：US17783433
申请日：2020-12-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Raffaele Vallauri , Fabio Morgana
IPC: G01R1/067
CPC classification number: G01R1/06716 , G01R1/06755
Abstract: A contact probe having a first end portion and a second end portion, a probe body extended along a longitudinal development direction between the first end portion and the second end portion is disclosed. The probe body has a pair of arms separated by a slot and extending according to the longitudinal development direction and a conductive insert extended along the longitudinal development direction, in a bending plane of the contact probe. The conductive insert is made of a first material and the contact probe is made of a second material and the first material has a lower electrical resistivity than an electrical resistivity of the second material. The conductive insert is a power transmission element of the contact probe and the arms are structural support elements of the contact probe during a deformation of the probe body.
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公开(公告)号：US11953522B2
公开(公告)日：2024-04-09
申请号：US17783440
申请日：2020-12-17
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto Crippa , Stefano Felici
CPC classification number: G01R1/0735 , G01R1/06744 , G01R1/06755 , G01R1/07357 , G01R1/07378 , G01R31/2889
Abstract: A probe head for a testing apparatus integrated on a semiconductor wafer is disclosed having a first plurality of contact probes having a first transversal diameter, a second plurality of micro contact probes having a second transversal diameter, smaller than the first transversal diameter, and a flexible membrane having conductive tracks for connecting a first plurality contact probe with a corresponding second plurality micro contact probe. The second plurality contact probes are arranged between the testing apparatus and the flexible membrane, and the second plurality micro contact probes are arranged between the flexible membrane and a semiconductor wafer. The second plurality micro contact probes are configured to abut onto contact pads of a device under test integrated in the semiconductor wafer, with each first plurality contact probe being in contact with a corresponding second plurality micro contact probe through a conductive track of the flexible membrane to connect the device under test with the testing apparatus.
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公开(公告)号：US20240044940A1
公开(公告)日：2024-02-08
申请号：US18254056
申请日：2021-11-22
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Flavio MAGGIONI
CPC classification number: G01R1/07307 , G01R1/06738
Abstract: A contact probe is disclosed having a first contact end portion adapted to abut onto a contact pad of a device under test, a second contact end portion adapted to abut onto a contact pad of a PCB board of a testing apparatus, and a rod-shaped probe body extended between the first and second contact end portions according to a longitudinal direction. The contact probe also includes an opening that extends along the probe body and along at least one contact end portion, a first opening part defining a pair of arms in the probe body and a second opening part defining a pair of end sections in the contact end portion.
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公开(公告)号：US20240027495A1
公开(公告)日：2024-01-25
申请号：US18254758
申请日：2021-12-09
Applicant: TECHNOPROBE S.P.A.
Inventor： Riccardo VETTORI
CPC classification number: G01R1/07357 , G01R1/06738 , G01R1/07371
Abstract: A contact probe is disclosed having a first end portion with a contact tip adapted to abut onto a contact pad of a device under test, a second end portion with a contact head adapted to abut onto a contact pad of a board of a test equipment, a probe body extended between the first and the second end portions according to a longitudinal development axis, and an elastic stopper provided in an elastic portion of the probe body arranged contiguous to the second end portion. The elastic stopper is deformable between a first working condition, in which it has a transversal diameter greater than a transversal diameter of the probe body, and a second working condition in which it has a transversal diameter corresponding to the transversal diameter of the probe body.
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60.发明公开公开(公告)号：US20240012025A1
公开(公告)日：2024-01-11
申请号：US18252141
申请日：2021-11-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA
CPC classification number: G01R1/06772 , G01R1/06727 , G01R1/06722 , G01R1/07314
Abstract: A contact element for a probe head for an electronic device test apparatus is disclosed, having a body extending along a longitudinal axis between a first and a second opposite contact end, each made of electrically conductive material. The body includes a first section which extends over a distance less than 1000 μm along the longitudinal axis starting from the first contact end towards the second contact end, a second section which extends along the longitudinal axis starting from the second contact end towards the first contact end, and a third section, interposed between the first and second sections, made of an electrically insulating material. The sections follow each other along the longitudinal axis so that the first contact end is included only in the first section, the second contact end is included only in the second section, and the third section electrically insulates the first section from the second section.
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