公开(公告)号：US20060066318A1

公开(公告)日：2006-03-30

申请号：US10951562

申请日：2004-09-28

申请人： Emad Andarawis ,  Samhita Dasgupta

发明人： Emad Andarawis ,  Samhita Dasgupta

IPC分类号： G01R27/26

CPC分类号： G01D5/2417 ,  G01B7/14

摘要： A sensor system comprising a sensor operable to provide an output signal representative of a sensed parameter is provided. The sensor system also comprises a control system coupled to the sensor, wherein the control system is operable to change a physical characteristic of the sensor based on the output signal representative of the sensed parameter.

摘要翻译： 提供一种包括可操作以提供表示感测参数的输出信号的传感器的传感器系统。 传感器系统还包括耦合到传感器的控制系统，其中控制系统可操作以基于表示所感测参数的输出信号来改变传感器的物理特性。

公开(公告)号：US08790006B2

公开(公告)日：2014-07-29

申请号：US12627293

申请日：2009-11-30

申请人： Hejie Li ,  Samhita Dasgupta ,  Edward Randall Furlong ,  Nirm Velumylum Nirmalan ,  Anquan Wang ,  Guanghua Wang ,  Stephen Thomas Walls ,  Lesley Ellen Brown

发明人： Hejie Li ,  Rodrick Gordon Brown ,  Samhita Dasgupta ,  Edward Randall Furlong ,  Nirm Velumylum Nirmalan ,  Anquan Wang ,  Guanghua Wang ,  Stephen Thomas Walls

IPC分类号： G01J5/00 ,  G01K1/14 ,  G01K11/00

CPC分类号： G01J5/0014 ,  G01J3/02 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/28 ,  G01J3/36 ,  G01J3/42 ,  G01J3/443 ,  G01J5/0022 ,  G01J5/0044 ,  G01J5/0088 ,  G01J5/08 ,  G01J5/0815 ,  G01J5/0821 ,  G01J5/0846 ,  G01J5/0862 ,  G01J5/58

摘要： A thermal measurement system that includes a light collection device and a detection system in communication with the device. The detection system includes two detection subsystems, wherein one subsystem is configured to detect light from a surface of an object, while the other subsystem is configured to detect light from the surface and a gas. The present invention has been described in terms of specific embodiment(s), and it is recognized that equivalents, alternatives, and modifications, aside from those expressly stated, are possible and within the scope of the appending claims.

摘要翻译： 一种热测量系统，其包括光收集装置和与装置通信的检测系统。 检测系统包括两个检测子系统，其中一个子系统被配置为检测来自物体表面的光，而另一子系统被配置为检测来自表面的气体和气体。 已经根据具体实施例描述了本发明，并且认识到除了明确说明的那些之外的等同物，替代方案和修改是可能的并且在所附权利要求的范围内。

公开(公告)号：US08177474B2

公开(公告)日：2012-05-15

申请号：US11768211

申请日：2007-06-26

申请人： Emad Andarawis Andarawis ,  William Lee Herron ,  Samhita Dasgupta ,  John Harry Down ,  Mahadevan Balasubramaniam ,  David So Keung Chan ,  David Walter Parry

发明人： Emad Andarawis Andarawis ,  William Lee Herron ,  Samhita Dasgupta ,  John Harry Down ,  Mahadevan Balasubramaniam ,  David So Keung Chan ,  David Walter Parry

IPC分类号： F01D11/20 ,  F01D11/22 ,  F01D11/24

CPC分类号： G01B7/14 ,  F01D9/00 ,  F01D11/20 ,  F01D15/02 ,  F01D17/20 ,  F01D21/003 ,  F04D27/001 ,  F05D2220/40 ,  F05D2260/80 ,  F05D2270/11 ,  F05D2270/305 ,  F05D2270/42

摘要： A method of detecting rubs during operation of a turbomachine comprising at least one rotating object having a tip and a shelf is provided. The method includes generating signals representative of a sensed parameter and processing the signals to generate height versus time data for the tip. The height of the tip corresponds to the distance between the tip and the shelf. The method further includes monitoring the height versus time data, in order to determine whether a change in the height data exceeds a threshold value, and detecting a rub of the rotating object(s) on a second object, when the change in the height data exceeds the threshold value. A rub detection system for a turbomachine and a turbine engine system with rub detection are also provided.

摘要翻译： 提供了一种在涡轮机操作期间检测摩擦的方法，包括至少一个具有尖端和搁架的旋转物体。 该方法包括产生表示感测参数的信号，并处理信号以产生尖端的高度与时间数据。 尖端的高度对应于尖端和搁板之间的距离。 该方法还包括监视高度与时间数据，以便确定高度数据中的变化是否超过阈值，并且当高度数据的改变检测到第二物体上的旋转物体的摩擦时 超过阈值。 还提供了一种用于涡轮机的摩擦检测系统和具有摩擦检测的涡轮发动机系统。

公开(公告)号：US08121813B2

公开(公告)日：2012-02-21

申请号：US12361469

申请日：2009-01-28

申请人： Zhiyuan Ren ,  Wayne Charles Hasz ,  Emad Andarawis Andarawis ,  David So Keung Chan ,  David Mulford Shaddock ,  John Harry Down ,  Samhita Dasgupta ,  William Lee Herron ,  Cheryl Lynn Herron, legal representative ,  David Walter Parry ,  David Richard Esler ,  Mahadevan Balasubramaniam

发明人： Zhiyuan Ren ,  Wayne Charles Hasz ,  Emad Andarawis Andarawis ,  David So Keung Chan ,  David Mulford Shaddock ,  John Harry Down ,  Samhita Dasgupta ,  William Lee Herron ,  David Walter Parry ,  David Richard Esler ,  Mahadevan Balasubramaniam

IPC分类号： G06F11/00

CPC分类号： G01B7/14 ,  F01D21/003

摘要： A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.

摘要翻译： 用于旋转机器中的间隙估计的处理系统包括一个或多个传感器和用于计算估计间隙的一个或多个数字信号处理器。 处理系统可以包括用于获得实时清除率估计的技术和用于获得平均清除率估计的技术。 处理系统的方面还可以包括根据旋转机器的操作条件在实时间隙估计和平均间隙估计之间切换的方法。 处理系统的其他方面包括使用两个数字信号处理器：第一数字信号处理器，被配置为从间隙传感器接收信号并执行第一组高速处理任务;以及第二数字信号处理器，被配置为从 第一数字信号处理器并执行第二组较低速处理任务。

公开(公告)号：US20100142881A1

公开(公告)日：2010-06-10

申请号：US12329183

申请日：2008-12-05

申请人： David William Vernooy ,  Samhita Dasgupta

发明人： David William Vernooy ,  Samhita Dasgupta

IPC分类号： G02B6/12 ,  H01L21/02

CPC分类号： G02B6/43 ,  G02B6/138 ,  G02B6/4214 ,  G02B2006/12073 ,  H05K1/0274 ,  H05K1/147 ,  H05K1/148 ,  H05K1/189 ,  H05K2201/10121 ,  H05K2201/10189 ,  H05K2201/10446

摘要： A circuit includes a flexible circuit having an optical waveguide embedded therein, a first device attached to the flexible circuit and configured to convert a first electrical signal to an optical signal, the first device positioned to emit the optical signal to an input end of the optical waveguide, and a second device attached to the flexible circuit and configured to convert the optical signal into a second electrical signal, the second device positioned to receive the optical signal from an output end of the optical waveguide.

摘要翻译： 电路包括具有嵌入其中的光波导的柔性电路，附接到柔性电路并被配置为将第一电信号转换为光信号的第一装置，第一装置被定位成将光信号发射到光学输入端 波导和连接到柔性电路并被配置为将光信号转换成第二电信号的第二装置，第二装置被定位成从光波导的输出端接收光信号。

公开(公告)号：US07722310B2

公开(公告)日：2010-05-25

申请号：US11015258

申请日：2004-12-17

申请人： Mahadevan Balasubramaniam ,  Emad Andarawis Andarawis ,  James Anthony Ruud ,  Samhita Dasgupta ,  Minesh Ashok Shah

发明人： Mahadevan Balasubramaniam ,  Emad Andarawis Andarawis ,  James Anthony Ruud ,  Samhita Dasgupta ,  Minesh Ashok Shah

IPC分类号： F01D11/20

CPC分类号： G01B7/14

摘要： A system for measuring clearance between a first object and a second object is provided. The system includes a sensor configuration to generate a first signal representative of a first sensed parameter and a second signal representative of a second sensed parameter. The system also includes a clearance measurement unit configured to process the first and second signals based upon a ratiometric technique to calculate clearance between the first and second objects.

摘要翻译： 提供了一种用于测量第一物体和第二物体之间的间隙的系统。 该系统包括用于产生表示第一感测参数的第一信号和表示第二感测参数的第二信号的传感器配置。 该系统还包括间隙测量单元，其被配置为基于比例技术来处理第一和第二信号以计算第一和第二物体之间的间隙。

公开(公告)号：US07527742B2

公开(公告)日：2009-05-05

申请号：US11167719

申请日：2005-06-27

申请人： Steven Alfred Tysoe ,  Steven Francis LeBoeuf ,  Mark Philip D'Evelyn ,  Venkat Subramaniam Venkataramani ,  Vinayak Tilak ,  Jeffrey Bernard Fortin ,  Charles Adrian Becker ,  Stephen Daley Arthur ,  Samhita Dasgupta ,  Kanakasabapathi Subramanian ,  Robert John Wojnarowski ,  Abasifreke Udo Ebong

发明人： Steven Alfred Tysoe ,  Steven Francis LeBoeuf ,  Mark Philip D'Evelyn ,  Venkat Subramaniam Venkataramani ,  Vinayak Tilak ,  Jeffrey Bernard Fortin ,  Charles Adrian Becker ,  Stephen Daley Arthur ,  Samhita Dasgupta ,  Kanakasabapathi Subramanian ,  Robert John Wojnarowski ,  Abasifreke Udo Ebong

IPC分类号： C03C15/00 ,  C03C25/68

CPC分类号： H01L21/31111

摘要： An etchant including a halogenated salt, such as Cryolite (Na3AlF6) or potassium tetrafluoro borate (KBF4), is provided. The salt may be present in the etchant in an amount sufficient to etch a substrate and may have a melt temperature of greater than about 200 degrees Celsius. A method of wet etching may include contacting an etchant to at least one surface of a support layer of a multi-layer laminate, wherein the support layer may include aluminum oxide; or contacting an etchant to at least one surface of a support layer of a multi-layer laminate, wherein the etchant may include Cryolite (Na3AlF6), potassium tetrafluoro borate (KBF4), or both; and etching at least a portion of the support layer. The method may provide a laminate produced by growing a crystal onto an aluminum oxide support layer, and chemically removing at least a portion of the support layer by wet etch. An electronic device, optical device or combined device including the laminate is provided.

摘要翻译： 提供包括卤化盐的蚀刻剂，例如冰晶石（Na 3 AlF 6）或四氟硼酸钾（KBF 4）。 盐可以以足以蚀刻基材的量存在于蚀刻剂中，并且可以具有大于约200摄氏度的熔体温度。 湿蚀刻的方法可以包括使蚀刻剂与多层层压体的支撑层的至少一个表面接触，其中所述支撑层可以包括氧化铝; 或使蚀刻剂与多层层压体的支撑层的至少一个表面接触，其中所述蚀刻剂可以包括冰晶石（Na 3 AlF 6），四氟硼酸钾（KBF 4）或两者; 并蚀刻所述支撑层的至少一部分。 该方法可以提供通过将结晶生长到氧化铝载体层上并通过湿蚀刻化学去除至少一部分载体层而制备的层压体。 提供了包括层压板的电子设备，光学设备或组合设备。

公开(公告)号：US07404331B2

公开(公告)日：2008-07-29

申请号：US11528236

申请日：2006-09-27

申请人： James Anthony Ruud ,  Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Minesh Ashok Shah ,  Mahadevan Balasubramaniam

发明人： James Anthony Ruud ,  Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Minesh Ashok Shah ,  Mahadevan Balasubramaniam

IPC分类号： G01L9/10

CPC分类号： H01F17/03 ,  H01F17/0006 ,  H01F17/0013 ,  H01F27/2804 ,  H01F41/041

摘要： A sensor assembly is provided. The sensor assembly includes a sensor configured to measure an impedance value representative of a sensed parameter and a transformer coupled to the sensor. The transformer includes at least one ceramic substrate and at least one electrically conductive line disposed on the ceramic substrate to form at least one winding. The electrically conductive line includes an electrically conductive material.

公开(公告)号：US20080072681A1

公开(公告)日：2008-03-27

申请号：US11528236

申请日：2006-09-27

申请人： James Anthony Ruud ,  Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Minesh Ashok Shah ,  Mahadevan Balasubramaniam

发明人： James Anthony Ruud ,  Emad Andarawis Andarawis ,  Samhita Dasgupta ,  Minesh Ashok Shah ,  Mahadevan Balasubramaniam

IPC分类号： G01L9/10

CPC分类号： H01F17/03 ,  H01F17/0006 ,  H01F17/0013 ,  H01F27/2804 ,  H01F41/041

摘要： A sensor assembly is provided. The sensor assembly includes a sensor configured to measure an impedance value representative of a sensed parameter and a transformer coupled to the sensor. The transformer includes at least one ceramic substrate and at least one electrically conductive line disposed on the ceramic substrate to form at least one winding. The electrically conductive line includes an electrically conductive material.

摘要翻译： 提供传感器组件。 传感器组件包括被配置为测量表示感测参数的阻抗值的传感器和耦合到传感器的变压器。 变压器包括至少一个陶瓷衬底和设置在陶瓷衬底上以形成至少一个绕组的至少一个导电线。 导电线包括导电材料。

公开(公告)号：US07333913B2

公开(公告)日：2008-02-19

申请号：US11167434

申请日：2005-06-27

申请人： Emad Andarawis Andarawis ,  Mahadevan Balasubramaniam ,  Todd Alan Anderson ,  Samhita Dasgupta ,  David Mulford Shaddock ,  Shobhana Mani ,  Jie Jiang

发明人： Emad Andarawis Andarawis ,  Mahadevan Balasubramaniam ,  Todd Alan Anderson ,  Samhita Dasgupta ,  David Mulford Shaddock ,  Shobhana Mani ,  Jie Jiang

IPC分类号： G01B5/14

CPC分类号： G01B7/144

摘要： A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.

摘要翻译： 提供了间隙测量系统。 间隙测量系统包括设置在具有另外连续的表面几何形状的第一物体上的参考几何形状和设置在第二物体上的传感器，其中传感器被配置为产生表示来自第一物体的第一感测参数的第一信号，以及 第二信号表示来自参考几何的第二感测参数。 间隙测量系统还包括处理单元，其被配置为基于第一和第二感测参数之间的测量差异来处理第一和第二信号以估计第一和第二对象之间的间隙。