STACKED DRAM DEVICE AND METHOD OF MANUFACTURE

    公开(公告)号:US20190295604A1

    公开(公告)日:2019-09-26

    申请号:US16256887

    申请日:2019-01-24

    Applicant: Rambus Inc.

    Inventor: Thomas Vogelsang

    Abstract: A memory device includes a first dynamic random access memory (DRAM) integrated circuit (IC) chip including first memory core circuitry, and first input/output (I/O) circuitry. A second DRAM IC chip is stacked vertically with the first DRAM IC chip. The second DRAM IC chip includes second memory core circuitry, and second I/O circuitry. Solely one of the first DRAM IC chip or the second DRAM IC chip includes a conductive path that electrically couples at least one of the first memory core circuitry or the second memory core circuitry to solely one of the first I/O circuitry or the second I/O circuitry, respectively.

    Dual temperature band integrated circuit device

    公开(公告)号:US10378967B1

    公开(公告)日:2019-08-13

    申请号:US15794280

    申请日:2017-10-26

    Applicant: Rambus Inc.

    Abstract: During operation of an IC component within a first range of temperatures, a first bias voltage is applied to a first substrate region disposed adjacent a first plurality of transistors to effect a first threshold voltage for the first plurality of transistors. During operation of the IC component within a second range of temperatures that is distinct from and lower than the first range of temperatures, a second bias voltage is applied to the first substrate region to effect a second threshold voltage for the first plurality of transistors that is at least as low as the first threshold voltage.

    Testing through-silicon-vias
    55.
    发明授权

    公开(公告)号:US10262750B2

    公开(公告)日:2019-04-16

    申请号:US15393634

    申请日:2016-12-29

    Applicant: RAMBUS INC.

    Abstract: Embodiments generally relate to integrated circuit devices having through silicon vias (TSVs). In one embodiment, an integrated circuit (IC) device includes a field of TSVs and an address decoder that selectably couples at least one of the TSVs to at least one of a test input and a test evaluation circuit. In another embodiment, a method includes selecting one or more TSVs from a field of TSVs in at least one IC device, and coupling each selected TSV to at least one of a test input and a test evaluation circuit.

    Memory component having internal read-modify-write operation

    公开(公告)号:US10248358B2

    公开(公告)日:2019-04-02

    申请号:US15990211

    申请日:2018-05-25

    Applicant: RAMBUS INC.

    Abstract: An memory component includes a memory bank and a command interface to receive a read-modify-write command, having an associated read address indicating a location in the memory bank and to either access read data from the location in the memory bank indicated by the read address after an adjustable delay period transpires from a time at which the read-modify-write command was received or to overlap multiple read-modify-write commands. The memory component further includes a data interface to receive write data associated with the read-modify-write command and an error correction circuit to merge the received write data with the read data to form a merged data and write the merged data to the location in the memory bank indicated by the read address.

    Reduced transport energy in a memory system

    公开(公告)号:US10199089B2

    公开(公告)日:2019-02-05

    申请号:US15876539

    申请日:2018-01-22

    Applicant: Rambus Inc.

    Abstract: A memory stack comprises at least two memory components. The memory components have a first data link interface and are to transmit signals on a data link coupled to the first data link interface at a first voltage level. A buffer component has a second data link interface coupled to the data link. The buffer component is to receive signals on the second data link interface at the first voltage level. A level shifting latch produces a second voltage level in response to receiving the signals at the second data link interface, where the second voltage level is higher than the first voltage level.

Patent Agency Ranking