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公开(公告)号：US20240118314A1
公开(公告)日：2024-04-11
申请号：US18480457
申请日：2023-10-03
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , David M. Ediger , Daniel G. Knierim , David Thomas Engquist
CPC classification number: G01R1/06755 , H01B7/04 , H01B9/006 , H01B9/02
Abstract: A cable assembly has a connector to receive a signal, a cable connected to the connector, the cable having a length and one or more conductors along at least part of the length to conduct the signal, a magnetic material external to the one or more conductors, and an elastomer material external to the one or more conductors. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, one or more discrete magnetic components spaced along the length of the cable, and one or more elastomer components next to at least one of the one or more magnetic components. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, an elastomer material at least partially enclosing the cable, and a magnetic material at least partially enclosing the cable.
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公开(公告)号：US20230408424A1
公开(公告)日：2023-12-21
申请号：US18457630
申请日：2023-08-29
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US20230375596A1
公开(公告)日：2023-11-23
申请号：US18198800
申请日：2023-05-17
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Julie A. Campbell , David M. Ediger
CPC classification number: G01R15/146 , G01R19/10
Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.
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公开(公告)号：US11815548B2
公开(公告)日：2023-11-14
申请号：US17379940
申请日：2021-07-19
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
CPC classification number: G01R31/2886 , G01R29/26
Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
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公开(公告)号：US11619697B2
公开(公告)日：2023-04-04
申请号：US17220857
申请日：2021-04-01
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
Abstract: A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
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Patent Agency Ranking
公开(公告)号：US11619657B2
公开(公告)日：2023-04-04
申请号：US17099701
申请日：2020-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
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公开(公告)号：US11454651B2
公开(公告)日：2022-09-27
申请号：US17114468
申请日：2020-12-07
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20210318361A1
公开(公告)日：2021-10-14
申请号：US17227215
申请日：2021-04-09
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett
IPC: G01R19/00 , G01R31/319 , G01R31/30
Abstract: An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.
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公开(公告)号：US20210255118A1
公开(公告)日：2021-08-19
申请号：US17307989
申请日：2021-05-04
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US11002764B2
公开(公告)日：2021-05-11
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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