Circuit for protection against negative overvoltages across the power
supply of an integrated circuit comprising a power device with related
control circuit
    641.
    发明授权
    Circuit for protection against negative overvoltages across the power supply of an integrated circuit comprising a power device with related control circuit 失效
    用于防止跨过集成电路的电源的负过电压的电路,包括具有相关控制电路的功率器件

    公开(公告)号:US5210675A

    公开(公告)日:1993-05-11

    申请号:US928670

    申请日:1992-08-17

    Applicant: Sergio Palara

    Inventor: Sergio Palara

    CPC classification number: H02H9/047

    Abstract: Circuits are provided for protecting against negative overvoltages of a power supply in an integrated circuit including a power device (P). The protection circuits include a voltage limiting device (T4) interposed between supply and control terminals of the power device, as well as a switching device (T6). The switching device is interposed between a control terminal of the voltage limiting means and ground. The switching means is controlled by the power supply to cause conduction of the voltage limiting means for firing the power device if a positive overvoltage on the supply terminal (CL) of the power device is combined with a negative overvoltage of the power supply (Vb). In some embodiments the switching device and the voltage limiting device are both NPN transistors. In other embodiments the the switching device and the voltage limiting device are both MOS transistors.

    Abstract translation: 提供电路用于防止包括功率器件(P)的集成电路中的电源的负过电压。 保护电路包括插在功率器件的供电和控制端子之间的电压限制装置(T4)以及开关装置(T6)。 开关装置插在电压限制装置的控制端子和地之间。 如果电力设备的电源端子(CL)上的正过压与电源(Vb)的负过压组合,则开关装置由电源控制,以引起用于点火功率器件的电压限制装置的导通, 。 在一些实施例中,开关装置和限压装置都是NPN晶体管。 在其他实施例中,开关器件和限压器件都是MOS晶体管。

    Reference voltage generator with programmable thermal drift
    642.
    发明授权
    Reference voltage generator with programmable thermal drift 失效
    具有可编程热量驱动器的参考电压发生器

    公开(公告)号:US5208527A

    公开(公告)日:1993-05-04

    申请号:US811261

    申请日:1991-12-19

    CPC classification number: G05F1/463 G05F3/30 Y10S323/907

    Abstract: The generator comprises a first generator of voltage with thermal drift of zero, a second generator of voltage with given thermal drift, first means for applying a given load to the voltage generated by the first generator, second means for applying a given load to the voltage generated by the second generator, subtracting means for subtracting one from the other the loaded voltages generated by said first and second generator of voltage.

    Abstract translation: 发电机包括具有热漂移为零的电压的第一发生器,具有给定热漂移的电压的第二发生器,用于将给定负载施加到由第一发电机产生的电压的第一装置,用于将给定负载施加到电压的第二装置 由所述第二发电机产生的减法装置,用于从所述第一和第二发电机产生的负载电压中减去一个电压。

    Control circuit for an oscillator
    643.
    发明授权
    Control circuit for an oscillator 失效
    振荡器的控制电路

    公开(公告)号:US5187452A

    公开(公告)日:1993-02-16

    申请号:US813154

    申请日:1991-12-23

    CPC classification number: H03K3/017 H03K3/2821

    Abstract: A control circuit for an oscillator comprising a multivibrator with transistors having their emitters connected in common and being supplied corresponding currents on respective legs, comprises a circuit structure adapted to produce on output terminals, on the one side, a current which is proportional to a reference current according to a predetermined parameter, and on the other side, a second current in turn correlated to the reference current as a function of said parameter, thereby to modify the oscillator duty cycle for a given operating frequency.

    Abstract translation: 一种用于振荡器的控制电路,包括多谐振荡器,其具有晶体管,其晶体管具有共同连接的发射极,并且在相应的支路上提供相应的电流,包括适于在输出端子上产生与参考电压成比例的电流的电路结构 电流,另一方面,第二电流又作为所述参数的函数与参考电流相关,从而修改给定工作频率的振荡器占空比。

    Negative overvoltage protection circuit, in particular for output stages
    644.
    发明授权
    Negative overvoltage protection circuit, in particular for output stages 失效
    负极过电压保护电路,特别是输出级

    公开(公告)号:US5182470A

    公开(公告)日:1993-01-26

    申请号:US593430

    申请日:1990-10-05

    CPC classification number: H02H9/047

    Abstract: An output stage with a protection circuit against negative overvoltage at its output terminal, having a transistor with collector output and with the emitter connected to a reference voltage line; a diode for protection against negative overvoltages present on the output is arranged between the collector and the output of the stage. In order to give the output of the stage a presettable minimum voltage level, the reference voltage line is set to a preset voltage which differs from the ground voltage. For this purpose, the circuit comprises an operational amplifier in a voltage-follower configuration, the output whereof is connected to the reference voltage line, a diode which is connected between the ground and the non-inverting terminal of the operational amplifier, and a current source which is connected between the non-inverting input of the operational amplifier and a negative supply line.

    Reset device for microprocessor, particularly for automotive applications
    645.
    发明授权
    Reset device for microprocessor, particularly for automotive applications 失效
    微处理器的复位装置,特别适用于汽车应用

    公开(公告)号:US5180927A

    公开(公告)日:1993-01-19

    申请号:US794939

    申请日:1991-11-20

    Applicant: Vanni Poletto

    Inventor: Vanni Poletto

    CPC classification number: G06F1/24

    Abstract: A microprocessor reset device comprising a first comparator which, when the input signal of the device falls below a first threshold, closes a switch controlling discharging of a condenser. A second comparator connected to the condenser enables the reset signal when its input signal, correlated with the voltage of the condenser, falls below a seond threshold. For enabling of the reset signal to be dependent on both the duration of the reduction in the input signal below the first threshold, as measured by the voltage present at the terminals of the condenser, as well as on the amount of reduction, the input signal of the second comparator consists of a linear combination of the input signal and the voltage of the condenser, effected by an adding element.

    Matrix of EPROM memory cells with a tablecloth structure having an
improved capacitative ratio and a process for its manufacture
    648.
    发明授权
    Matrix of EPROM memory cells with a tablecloth structure having an improved capacitative ratio and a process for its manufacture 失效
    具有具有改进的电容比的桌布结构的EPROM存储器单元的矩阵及其制造方法

    公开(公告)号:US5160986A

    公开(公告)日:1992-11-03

    申请号:US759203

    申请日:1991-09-11

    Applicant: Orio Bellezza

    Inventor: Orio Bellezza

    CPC classification number: H01L27/11521 H01L27/115

    Abstract: The matrix of EPROM memory cells comprises on a semiconductor substrate lines of source and drain parallel and alternated one to another, floating gate areas interposed in a checkerboard pattern between said source and drain lines and control gate lines parallel to one another and perpendicular to said source and drain lines in a superimposed condition with intermediate dielectric and aligned with respect to said floating gate areas. Field oxide areas are provided for, formed on the substrate between one and the other of said control gate lines and side fins of the floating gate areas and of the control gate lines superimposed over said field oxide areas.

    Abstract translation: EPROM存储单元的矩阵包括在源极和漏极平行并交替的半导体衬底上,彼此交替布置在所述源极和漏极线之间的棋盘图案中的浮动栅极区域和彼此平行并垂直于所述源极的控制栅极线 以及具有中间电介质并且相对于所述浮动栅区对准的叠加状态的漏极线。 提供场氧化物区域,用于形成在衬底上的所述控制栅极线和浮栅区域的侧鳍之间以及叠加在所述场氧化物区域上的控制栅极线的侧鳍之间。

    Quantitative assessment of the geometrical distortion suffered by the
profile of a semiconductor wafer
    649.
    发明授权
    Quantitative assessment of the geometrical distortion suffered by the profile of a semiconductor wafer 失效
    由半导体滤波器轮廓引起的几何失真的定量评估

    公开(公告)号:US5152168A

    公开(公告)日:1992-10-06

    申请号:US631018

    申请日:1990-12-21

    CPC classification number: H01L21/681 G01B7/28 H01L22/12

    Abstract: A method for the quantitative assessment of the degree of geometrical deformation undergone by a surface profile of a wafer following the formation of a conformal surface layer employs a simple mechanical profilometer, whose stylus is run over a target morphological detail comprising at least two mutually parallel ridges or reliefs which rise above the plane of the surface of the wafer for a height of between 0.1 and 0.5 .mu.m, and which enclose between them a depression of a width of between 2 and 4 .mu.m, in order to determine the elevation of the bottom of the valley between the two ridges relative to the plane of the surface of the wafer from which the ridges rise following the formation of one or more similar surface layers. The vertical measurement of the elevation undergone by the bottom of the valley in itself represents a quantitative index of the vertical and horizontal geometrical deformation undergone by the details of the surface profile of the wafer. In order to determine characteristics of automatic alignability by a particular apparatus employing said target details for automatic alignment, it is possible to establish a maximum value for said distortion index, determined as above, above which the automatic alignment capability is lost.

    Detection circuit of the current in an MOS type power transistor
    650.
    发明授权
    Detection circuit of the current in an MOS type power transistor 失效
    MOS型功率晶体管中的电流检测电路

    公开(公告)号:US5144172A

    公开(公告)日:1992-09-01

    申请号:US605271

    申请日:1990-10-30

    CPC classification number: G05F3/22 G01R31/2621

    Abstract: A circuit for detecting the current in an MOS type power transistor comprises a detection transistor (T2) connected with its drain and gate in common to the power transistor (T1) and having characteristics such that the current flowing through it is equal to a fraction of the current (I1) flowing through the power transistor (T1). Downstream from the detection transistor (T2) is a comparison transistor (T6, T13) for comparing a first current (I3), which is equal to a fraction of the current flowing through the detection transistor, with a second or reference current (Ig1) having a pre-set value. The comparison transistor (T6, T13) produces a detection signal of the value of the current in the power transistor (I1) in relation to the difference between the first current (I3) and the reference current (Ig1).

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