Abstract:
A flat filter layer is received between upper and lower mold portions of a mold for packaging an integrated circuit sensor device, held by the mold over and in contact with the integrated circuit's sensing surface, in light compression between the sensing surface and a mold surface. The filter layer includes slots allowing passage of injected encapsulating material to cover the integrated circuit die, with overlap portions embedded in the encapsulating material, while preventing such encapsulating material from flowing onto the sensing surface. The filter layer may be, for example, a liquid and/or light filter, and may include a protective or supportive backing. The filter is thus affixed to the packaged integrated circuit sensor device, while mold residue is reduced and mold life extended.
Abstract:
In linear arrays of charge coupled device photosensors, sensor integrated circuits are contained in surface mountable packaging allowing individual segments to be soldered into place within the array. For solder-mountable packaging, unencapsulated sensor circuits are mounted onto a lead frame strip with the space between the circuits equaling the width of a singulation saw. After die mounting and wire bonding, a continuous strip of plastic or resin molding covers the wire bonds on one side and the edge of the silicon on the other, protecting the lead frame strip and other parts, leaving the active sensor area exposed. The lead frame is then trimmed and formed in a conventional manner, and the packaged sensor circuits are separated with a singulation saw cutting between the circuits. The resulting self-contained device may then be surface mounted within a linear array with solder rather than depending on Chip On Board technology. Leads are preferably soldered to the board on only one side, with the other side floating freely over the appropriate contacts for ease of mechanical adjustment. Individual sensor segments within the array may be readily removed and replaced in the event of a defect.
Abstract:
The invention disclosed herein is a device and method in which a heat sink (22) is attached to support leads (18) of a leadframe (10) via a welding or mechanical joining technique. The method is performed prior to semiconductor device packaging and is usually performed after the leadframe is etched or stamped, and before it is cut into strips.
Abstract:
A socketed integrated circuit packaging system, including a packaged integrated circuit and a socket therefor, is disclosed. The integrated circuit package includes a device circuit board to which a thermally conductive slug is mounted; the underside of the device circuit board has a plurality of lands arranged in an array. The integrated circuit chip is mounted to the slug, through a hole in the device circuit board, and is wire-bonded to the device circuit board and thus to the lands on the underside. The socket is a molded frame, having a hole therethrough to receive the conductive slug of the integrated circuit package; the socket may also have its own thermally conductive slug disposed within the hole of the frame. The socket has spring contact members at locations matching the location of the lands on the device circuit board. The integrated circuit package may be inserted into the socket frame, held there by a metal or molded clip. A low profile, low cost, and high thermal conductivity package and socket combination, is thus produced.
Abstract:
An apparatus and method for controlling the height of packaging above an integrated circuit package (30) comprising, a substrate (12), a silicon chip (16) and a signal wire (20), one or more height detection wires (32) extending above the top surface (26) of the silicon chip (16) and the signal wire (20) and a detector electrically connected to the height detection wire (32), wherein the height detection wire (32) and the detector form an electric circuit that is affected when a polisher of encapsulant (40) is in proximity to the height detection wire (32), is disclosed.
Abstract:
A contact for a semiconductor device or passive substrate is made up of an array of conductive balls, the individual balls of the contact being a compressible material coated with a metal conductive material. The balls in the array are compressed while being bonded to the contact area to provide a larger bond area between the ball and the contact area to which it is bonded.
Abstract:
An interconnection system and method of testing and performing burn-in of semiconductor devices prior to separation from the semiconductor wafer on which the devices are formed includes forming interconnection layers of contacts and conductors over the devices and then testing and performing burn-in on the devices. Faulty devices are disconnected from the conductors prior to performing additional test and burn-in. The interconnections are removed prior to separating the device on the wafer, and prior to further possible tests and packaging.
Abstract:
The invention is to a three dimensional circuit module constructed around a heat sink 10. A large integrated circuit component 21 such as a Micro Processing Unit for a computer is mounted over contact pads 27 on a printed wiring board 20. Also mounted to contact pads 27 on the printed wiring board are submodules 11, 12, 24, 25 that have wiring patterns interconnected to other circuit components 13-17, such as high power memory devices. The printed circuit submodules are mounted on the sides of the heat sink.
Abstract:
A leadframe has a bus bar extending between two lead fingers on the leadframe. The bus bar and lead fingers are etched to reduce the thickness thereof, and the bus bar is folded under the lead finger, but insulated therefrom by a strip of insulating material. An adhesive is applied to the bus bar to attached it and the leadframe to the surface of a semiconductor chip.
Abstract:
An electronic device (10) includes a package (16) having two posts (30) suitable for insertion in PCB holes. Package (16) presents a lengthwise molding plane (32) along which the upper portion (42) and bottom portion (44) of package (16) are mated during the molding process. Posts (30) are disposed substantially exclusively in bottom portion (44) so that posts (30) are asymmetric about lengthwise molding plane (32). Thus, even if a top mold (42a) and a bottom mold (44a) are misaligned there will be no effect on the dimensional tolerance of posts (30) and thus the tolerance of post (30) can be closely matched with a PCB hole (20) tolerance to insure a snug fit. Thus, device (10) is mounted edgewise on a PCB (18) by insertion of posts (30) into PCB holes (20) so that tips (24) of lead fingers (14) can be connected to PCB (18) by surfacing-mounting techniques or the like.