Integrated driver system architecture for light emitting diodes (LEDS)
    61.
    发明申请
    Integrated driver system architecture for light emitting diodes (LEDS) 有权
    用于发光二极管(LEDS)的集成驱动器系统架构

    公开(公告)号:US20110084607A1

    公开(公告)日:2011-04-14

    申请号:US12925078

    申请日:2010-10-13

    Abstract: A method includes forming one or more capacitors over a substrate. The method also includes forming a transformer at least partially over the substrate. The transformer is adjacent to at least one of the one or more capacitors. At least a portion of the transformer is formed at a same level over the substrate as the one or more capacitors. The method further includes coupling the one or more capacitors and the transformer to at least one embedded integrated circuit die. The one or more capacitors, the transformer, and the at least one embedded integrated circuit die form at least part of a light emitting diode (LED) driver.

    Abstract translation: 一种方法包括在衬底上形成一个或多个电容器。 该方法还包括至少部分地在衬底上形成变压器。 变压器与一个或多个电容器中的至少一个相邻。 所述变压器的至少一部分与所述一个或多个电容器形成在与所述衬底相同的电平上。 该方法还包括将一个或多个电容器和变压器耦合到至少一个嵌入式集成电路管芯。 一个或多个电容器,变压器和至少一个嵌入式集成电路管芯形成发光二极管(LED)驱动器的至少一部分。

    On-chip power inductor
    62.
    发明授权
    On-chip power inductor 有权
    片上功率电感

    公开(公告)号:US07875955B1

    公开(公告)日:2011-01-25

    申请号:US11713921

    申请日:2007-03-05

    Abstract: An on-chip inductor structure for a DC-DC power regulator circuit merges the switching transistor metallization with the inductor. Thick top level conductor metal that is used to strap the transistor array and to lower its on-state resistance is also used to extend the power inductor into the transistor array. Thus, the structure includes three basic components: a power inductor that spirals around the transistor array, the transistor array itself, and the transistor array metallization that is used to form a distributed inductance situated over the transistor array.

    Abstract translation: 用于DC-DC功率调节器电路的片上电感器结构将开关晶体管金属化与电感器并入。 用于绑定晶体管阵列并降低其导通电阻的厚顶级导体金属也用于将功率电感器扩展到晶体管阵列中。 因此,该结构包括三个基本部件:围绕晶体管阵列螺旋的功率电感器,晶体管阵列本身以及用于形成位于晶体管阵列上方的分布式电感器的晶体管阵列金属化。

    Magnetic MEMS switching regulator
    63.
    发明授权
    Magnetic MEMS switching regulator 有权
    磁性MEMS开关调节器

    公开(公告)号:US07839242B1

    公开(公告)日:2010-11-23

    申请号:US11893535

    申请日:2007-08-16

    CPC classification number: H02M3/34

    Abstract: A MEMS magnetic flux switch is fabricated as a ferromagnetic core. The core includes a center cantilever that is fabricated as a free beam that can oscillate at a resonant frequency that is determined by its mechanical and material properties. The center cantilever is moved by impulses applied by an associated motion oscillator, which can be magnetic or electric actuators.

    Abstract translation: MEMS磁通开关被制造为铁磁芯。 芯包括中心悬臂,其被制造为可以以其机械和材料性质确定的共振频率振荡的自由梁。 中心悬臂由相关运动振荡器施加的脉冲移动,运动振荡器可以是磁性或电动执行器。

    ESD protection device with controllable triggering characteristics using driver circuit related to power supply
    64.
    发明授权
    ESD protection device with controllable triggering characteristics using driver circuit related to power supply 有权
    具有可控触发特性的ESD保护器件使用与电源相关的驱动电路

    公开(公告)号:US07800127B1

    公开(公告)日:2010-09-21

    申请号:US11503593

    申请日:2006-08-14

    CPC classification number: H01L29/7436 H01L27/0262 H01L29/87

    Abstract: In an ESD device for fast switching applications based on a BSCR or NLDMOS-SCR, an anode junction control electrode is provided by not connecting the anode electrode to the collector of the BSCR or to the drain of the NLDMOS-SCR, and a cathode junction control electrode is provided by forming an additional n+ region in the BSCR or an additional p+ region in the p-well of the NLDMOS-SCR. The triggering voltage of the ESD device is adjusted after a time delay by controlling one or both of the control electrodes using an RC-timer-driver circuit.

    Abstract translation: 在用于基于BSCR或NLDMOS-SCR的快速切换应用的ESD装置中,阳极结控制电极通过不将阳极电极连接到BSCR的集电极或NLDMOS-SCR的漏极而提供,并且阴极结 通过在BSCR中的附加n +区域或NLDMOS-SCR的p阱中的附加p +区域形成控制电极。 通过使用RC定时器驱动器电路控制一个或两个控制电极,在延迟之后调整ESD装置的触发电压。

    ESD high frequency diodes
    65.
    发明授权
    ESD high frequency diodes 有权
    ESD高频二极管

    公开(公告)号:US07795102B1

    公开(公告)日:2010-09-14

    申请号:US11654735

    申请日:2007-01-17

    CPC classification number: H01L29/8611 H01L27/0255 H01L29/161 H01L29/66128

    Abstract: In a SiGe BJT process, a diode is formed by defining a p-n junction between the BJT collector and BJT internal base, blocking the external gate regions of the BJT and doping the emitter poly of the BJT with the same dopant type as the internal base thereby using the emitter contact to define the contact to the internal base. Electrical contact to the collector is established through a sub-collector or by means of a second emitter poly and internal base both doped with the same dopant type as the collector.

    Abstract translation: 在SiGe BJT工艺中,通过限定BJT集电极和BJT内部基极之间的pn结,形成二极管,阻挡BJT的外部栅极区域,并以与内部基底相同的掺杂剂类型掺杂BJT的发射极多晶, 使用发射极接触来定义与内部基座的接触。 通过子集电极或通过掺杂与收集器相同的掺杂剂类型的第二发射极多晶硅和内部基极建立与集电极的电接触。

    Method of forming high lateral voltage isolation structure involving two separate trench fills
    66.
    发明申请
    Method of forming high lateral voltage isolation structure involving two separate trench fills 有权
    形成高横向电压隔离结构的方法,涉及两个单独的沟槽填充

    公开(公告)号:US20100144116A1

    公开(公告)日:2010-06-10

    申请号:US12315934

    申请日:2008-12-08

    CPC classification number: H01L21/76283

    Abstract: In a SOI process, a high lateral voltage isolation structure is formed by providing at least two concentric dielectric filled trenches, removing the semiconductor material between the dielectric filled trenches and filling the resultant gap with dielectric material to define a single wide dielectric filled trench.

    Abstract translation: 在SOI工艺中,通过提供至少两个同心的电介质填充的沟槽来形成高横向电压隔离结构,去除介电填充的沟槽之间的半导体材料,并用电介质材料填充所得的间隙以限定单个宽的电介质填充的沟槽。

    Method and system for measuring film stress in a wafer film
    68.
    发明申请
    Method and system for measuring film stress in a wafer film 有权
    用于测量晶片薄膜中薄膜应力的方法和系统

    公开(公告)号:US20100141292A1

    公开(公告)日:2010-06-10

    申请号:US12315933

    申请日:2008-12-08

    Inventor: Peter J. Hopper

    CPC classification number: G01L1/14 G01B7/345 G01B2210/56 H01F5/003

    Abstract: In a MEMS wafer, film stresses are measured by placing an inductor array over or under the wafer and measuring inductance variations across the array to obtain a map defining the amount of bowing of the wafer.

    Abstract translation: 在MEMS晶片中,通过将电感器阵列放置在晶片上方或下方并测量阵列上的电感变化来测量膜应力,以获得限定晶片弯曲量的映射。

    MID-SIZE NVM CELL AND ARRAY UTILIZING GATED DIODE FOR LOW CURRENT PROGRAMMING
    69.
    发明申请
    MID-SIZE NVM CELL AND ARRAY UTILIZING GATED DIODE FOR LOW CURRENT PROGRAMMING 有权
    用于低电流编程的中等尺寸NVM单元和阵列利用栅极二极管

    公开(公告)号:US20090296493A1

    公开(公告)日:2009-12-03

    申请号:US12539872

    申请日:2009-08-12

    CPC classification number: G11C16/10 H01L27/11558 H01L29/66825 H01L29/7881

    Abstract: A method of operating a non-volatile memory (NVM) cell structure that utilizes gated diode is provided. The cell architecture, utilizing about 4-10 um2 per bit, includes gated diodes that are used to program the cells while consuming low programming current. The cell architecture also allows a large number of cells to be programmed at the same time, thereby reducing the effective programming time per bit. Erase and read mode bias conditions are also provided.

    Abstract translation: 提供了一种操作使用门控二极管的非易失性存储器(NVM)单元结构的方法。 该单元架构使用大约4-10 um2每位,包括门控二极管,用于对单元进行编程,同时消耗低编程电流。 单元架构还允许在同一时间编程大量单元,从而减少每位的有效编程时间。 还提供擦除和读取模式偏置条件。

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