Fungicides
    62.
    发明授权
    Fungicides 失效
    杀菌剂

    公开(公告)号:US4007279A

    公开(公告)日:1977-02-08

    申请号:US544895

    申请日:1975-01-28

    IPC分类号: C07D339/08

    CPC分类号: C07D339/08

    摘要: A fungicidal compound having a general structure corresponding to a member selected from the group of 2,3-dicyano-5,6-dihydro-p-dithiin and its 5-alkyl derivatives, as expressed by the following general formula: ##STR1## wherein R stands for H or an alkyl radical of C.sub.1 - C.sub.6.

    摘要翻译: 具有对应于选自2,3-二氰基-5,6-二氢 - 对 - 二硫杂及其5-烷基衍生物的成员的一般结构的杀真菌化合物,由以下通式表示:其中 R代表H或C1-C6的烷基。

    Method for producing Group III nitride compound semiconductor
    64.
    发明授权
    Method for producing Group III nitride compound semiconductor 有权
    生产III族氮化物化合物半导体的方法

    公开(公告)号:US07112243B2

    公开(公告)日:2006-09-26

    申请号:US10200586

    申请日:2002-07-23

    IPC分类号: C30B29/38 H01L21/36

    摘要: The present invention provides a method for producing a Group III nitride compound semiconductor, which method permits only minimal reaction of the semiconductor with a hetero-substrate during epitaxial growth and induces no cracks in the Group III nitride compound semiconductor even when the semiconductor is cooled to room temperature. The method includes a buffer layer formation step for forming a gas-etchable buffer layer on the hetero-substrate, and a semiconductor formation step for epitaxially growing the Group III nitride compound semiconductor on the buffer layer through a vapor phase growth method, wherein at least a portion of the buffer layer is gas-etched during or after the semiconductor formation step.

    摘要翻译: 本发明提供了一种制造III族氮化物化合物半导体的方法,该方法在外延生长期间仅允许半导体与异质衬底的反应最小,并且即使当半导体被冷却到第三族氮化物半导体时也不引起裂纹 室内温度。 该方法包括用于在异质衬底上形成气体可蚀刻缓冲层的缓冲层形成步骤,以及用于通过气相生长法在缓冲层上外延生长III族氮化物半导体的半导体形成步骤,其中至少 在半导体形成步骤期间或之后,缓冲层的一部分被气蚀刻。

    Light-emitting aluminum gallium indium nitride compound semiconductor device having an improved luminous intensity
    65.
    发明授权
    Light-emitting aluminum gallium indium nitride compound semiconductor device having an improved luminous intensity 失效
    具有改善的发光强度的发光铝镓铟氮化物半导体器件

    公开(公告)号:US07001790B2

    公开(公告)日:2006-02-21

    申请号:US09783035

    申请日:2001-02-15

    IPC分类号: H01L21/00

    摘要: A light-emitting semiconductor device (10) consecutively includes a sapphire substrate (1), an AlN buffer layer (2), a silicon (Si) doped GaN n+-layer (3) of high carrier (n-type) concentration, a Si-doped (Alx3Ga1-x3)y3In1-y3N n+-layer (4) of high carrier (n-type) concentration, a zinc (Zn) and Si-doped (Alx2Ga1-x2)y2In1-y2N emission layer (5), and a Mg-doped (Alx1Ga1-x1)y1In1-y1N p-layer (6). The AlN layer (2) has a 500 Å thickness. The GaN n+-layer (3) has about a 2.0 μm thickness and a 2×1018/cm3 electron concentration. The n+-layer (4) has about a 2.0 μm thickness and a 2×1018/cm3 electron concentration. The emission layer (5) has about a 0.5 μm thickness. The p-layer 6 has about a 1.0 μm thickness and a 2×1017/cm3 hole concentration. Nickel electrodes (7, 8) are connected to the p-layer (6) and n+-layer (4), respectively. A groove (9) electrically insulates the electrodes (7, 8). The composition ratio of Al, Ga, and In in each of the layers (4, 5, 6) is selected to meet the lattice constant of GaN in the n+-layer (3). The LED (10) is designed to improve luminous intensity and to obtain purer blue color.

    摘要翻译: 发光半导体器件(10)连续地包括蓝宝石衬底(1),AlN缓冲层(2),高载体的硅(Si)掺杂GaN n + +层(3) (n型)浓度,Si掺杂(Al x3 Ga 1-x 3)y 3在1-y 3中, 具有高载流子(n型)浓度的氮(Zn)和Si掺杂(Al 2 x 2 Ga 2) 1-x2 Y2在1-y2 N发射层(5)中,以及Mg掺杂(Al x1 Ga) 在1-y1 N p层(6)中。 AlN层(2)的厚度为500埃。 GaN n + +(3)具有约2.0μm厚度和2×10 18 / cm 3电子浓度。 n + +层(4)具有约2.0μm厚度和2×10 18 / cm 3电子浓度。 发射层(5)的厚度约为0.5μm。 p层6具有约1.0μm厚度和2×10 17 / cm 3孔浓度。 镍电极(7,8)分别连接到p层(6)和n + +层(4)。 一个凹槽(9)使电极(7,8)电绝缘。 选择各层(4,5,6)中的Al,Ga和In的组成比以满足n +层(3)中的GaN的晶格常数。 LED(10)被设计为提高发光强度并获得更纯的蓝色。

    Gallium nitride group compound semiconductor
    66.
    发明授权
    Gallium nitride group compound semiconductor 失效
    氮化镓族化合物半导体

    公开(公告)号:US06472690B1

    公开(公告)日:2002-10-29

    申请号:US09677789

    申请日:2000-10-02

    IPC分类号: H01L3300

    摘要: Disclosed herein are (1) a light-emitting semiconductor device that uses a gallium nitride compound semiconductor (AlxGa1−xN) in which the n-layer of n-type gallium nitride compound semiconductor (AlxGa1−xN) is of double-layer structure including an n-layer of low carrier concentration and an n+-layer of high carrier concentration, the former being adjacent to the i-layer of insulating gallium nitride compound semiconductor (AlxGa1−xN); (2) a light-emitting semiconductor device of similar structure as above in which the i-layer is of double-layer structure including an iL-layer of low impurity concentration containing p-type impurities in comparatively low concentration and an iH-layer of high impurity concentration containing p-type impurities in comparatively high concentration, the former being adjacent to the n-layer; (3) a light-emitting semiconductor device having both of the above-mentioned features and (4) a method of producing a layer of an n-type gallium nitride compound semiconductor (AlxGa1−xN) having a controlled conductivity from an organometallic compound by vapor phase epitaxy, by feeding a silicon-containing gas and other raw material gases together at a controlled mixing ratio.

    摘要翻译: 这里公开的是(1)使用其中n型氮化镓化合物半导体(Al x Ga 1-x N)的n层是双层结构的氮化镓化合物半导体(Al x Ga 1-x N)的发光半导体器件,包括 低载流子浓度的n层和高载流子浓度的n +层,前者与绝缘的氮化镓化合物半导体(Al x Ga 1-x N)的i层相邻; (2)具有上述类似结构的发光半导体器件,其中i层是双层结构,其包括含有较低浓度的p型杂质的低杂质浓度的iL层和iH层 含有较高浓度的p型杂质的高杂质浓度,前者与n层相邻; (3)具有上述特征的发光半导体器件和(4)由有机金属化合物具有受控导电性的n型氮化镓系化合物半导体(Al x Ga 1-x N)的层的制造方法, 通过以受控的混合比将含硅气体和其它原料气体一起供给到气相外延。

    Probe for measuring periodontal pocket depth
    67.
    发明授权
    Probe for measuring periodontal pocket depth 失效
    探头测量牙周袋深度

    公开(公告)号:US5897509A

    公开(公告)日:1999-04-27

    申请号:US880677

    申请日:1997-06-23

    IPC分类号: A61C19/04 A61B5/103

    CPC分类号: A61C19/043

    摘要: A probe for measuring a depth of a periodontal pocket includes an emitting device for emitting, from a position at a distance from the periodontal pocket, a light beam toward the periodontal pocket, a receiving device for receiving, at a position at another distance from the periodontal pocket, the light beam after being reflected on a bottom of the periodontal pocket, and an analyzing device for displaying the depth of the periodontal pocket after a calculation thereof on the basis of an analysis of the light beam received at the receiving device.

    摘要翻译: 用于测量牙周袋深度的探针包括一个发射装置,用于从与牙周袋一定距离处的一个位置发射朝向牙周袋的光束;一个接收装置,用于在与 在牙周袋的底部反射后的光束,以及分析装置,用于根据在接收装置接收的光束的分析,计算出牙周袋的深度。

    Light-emitting semiconductor device using gallium nitride group compound
with double layer structures for the n-layer and/or the i-layer
    68.
    发明授权
    Light-emitting semiconductor device using gallium nitride group compound with double layer structures for the n-layer and/or the i-layer 失效
    使用具有用于n层和/或i层的双层结构的氮化镓基化合物的发光半导体器件

    公开(公告)号:US5278433A

    公开(公告)日:1994-01-11

    申请号:US926022

    申请日:1992-08-07

    IPC分类号: H01L33/00 H01L33/02 H01L33/32

    摘要: Disclosed herein are (1) a light-emitting semiconductor device that uses a gallium nitride compound semiconductor (Al.sub.x Ga.sub.1-x N) in which the n-layer of n-type gallium nitride compound semiconductor (Al.sub.x Ga.sub.1-x N) is of double-layer structure including an n-layer of low carrier concentration and an n.sup.+ -layer of high carrier concentration, the former being adjacent to the i-layer of insulating gallium nitride compound semiconductor (Al.sub.x Ga.sub.1-x N); (2) a light-emitting semiconductor device of similar structure as above in which the i-layer is of double-layer structure including an i.sub.L -layer of low impurity concentration containing p-type impurities in comparatively low concentration and an i.sub.H -layer of high impurity concentration containing p-type impurities in comparatively high concentration, the former being adjacent to the n-layer; (3) a light-emitting semiconductor device having both of the above-mentioned features and (4) a method of producing a layer of an n-type gallium nitride compound semiconductor (Al.sub.x Ga.sub.1-x N) having a controlled conductivity from an organometallic compound by vapor phase epitaxy, by feeding a silicon-containing gas and other raw material gases together at a controlled mixing ratio.

    摘要翻译: 这里公开的是(1)使用其中n型氮化镓化合物半导体(Al x Ga 1-x N)的n层是双层结构的氮化镓化合物半导体(Al x Ga 1-x N)的发光半导体器件,包括 低载流子浓度的n层和高载流子浓度的n +层,前者与绝缘的氮化镓化合物半导体(Al x Ga 1-x N)的i层相邻; (2)具有上述类似结构的发光半导体器件,其中i层是双层结构,其包括含有较低浓度的p型杂质的低杂质浓度的iL层和iH层 含有较高浓度的p型杂质的高杂质浓度,前者与n层相邻; (3)具有上述特征的发光半导体器件和(4)由有机金属化合物具有受控导电性的n型氮化镓系化合物半导体(Al x Ga 1-x N)的层的制造方法, 通过以受控的混合比将含硅气体和其它原料气体一起供给到气相外延。

    N-substituted-3-(substituted hydrazino)benzenesulfonamide derivatives,
and herbicidal compositions
    69.
    发明授权
    N-substituted-3-(substituted hydrazino)benzenesulfonamide derivatives, and herbicidal compositions 失效
    N-取代-3-(取代肼基)苯磺酰胺衍生物和除草组合物

    公开(公告)号:US5151114A

    公开(公告)日:1992-09-29

    申请号:US667132

    申请日:1991-03-11

    摘要: Disclosed herein are N-substituted-3-(substituted hydrazino)benzenesulfonamide derivatives of the formula (I): ##STR1## wherein R.sup.1 is CF.sub.3, COOH or CCl.dbd.CClCOOH, R.sup.2 is H, Cl, C.sub.1 -C.sub.3 alkyl or C.sub.1 -C.sub.4 alkoxycarbonyl; Z is CH or N; X.sup.1 is C.sub.1 -C.sub.3 alkyl, C.sub.1 -C.sub.3 alkoxyl or Cl; and X.sup.2 is C.sub.1 -C.sub.3 alkyl or C.sub.1 -C.sub.3 alkoxyl, a process for the preparation thereof, and herbicidal compositions containing the N-substituted-3-(substituted hydrazino)benzenesulfonamide derivatives as active ingredients.

    摘要翻译: 本文公开了式(I)的N-取代-3-(取代肼基)苯磺酰胺衍生物:其中R 1是CF 3,COOH或CCl = CClCOOH,R 2是H,Cl,C 1 -C 3烷基或 C1-C4烷氧基羰基; Z是CH或N; X1是C1-C3烷基,C1-C3烷氧基或C1; X2是C1-C3烷基或C1-C3烷氧基,其制备方法和含有N-取代-3-取代的肼基苯磺酰胺衍生物作为活性成分的除草组合物。