NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    61.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 审中-公开
    非易失性半导体存储器件

    公开(公告)号:US20070206399A1

    公开(公告)日:2007-09-06

    申请号:US11682478

    申请日:2007-03-06

    IPC分类号: G11C5/02 G11C5/06

    摘要: A nonvolatile semiconductor memory device having a first memory cell array including a plurality of electrical reprogramming and erasable nonvolatile semiconductor memory cells formed in a first area of a semiconductor substrate, a second memory cell array including a plurality of electrical reprogramming and erasable nonvolatile semiconductor memory cells formed in a second area different from said first area of said semiconductor substrate, said first and second memory cell arrays being arranged in a first direction, and a first pad section for inputting data to and outputting data from said first memory cell array and said second memory cell array, said first pad section having a plurality of pads arranged between said first memory cell array and said second memory cell array along a second direction perpendicular to said first direction.

    摘要翻译: 一种具有第一存储单元阵列的非易失性半导体存储器件,包括形成在半导体衬底的第一区域中的多个电重新编程和可擦除非易失性半导体存储单元,第二存储单元阵列包括多个电重编程和可擦除非易失性半导体存储单元 形成在与所述半导体衬底的所述第一区域不同的第二区域中,所述第一和第二存储单元阵列沿第一方向布置;以及第一焊盘区段,用于向所述第一存储单元阵列和所述第二存储单元阵列输入数据并输出数据 所述第一焊盘部分具有沿垂直于所述第一方向的第二方向布置在所述第一存储单元阵列和所述第二存储单元阵列之间的多个焊盘。

    Synchronous semiconductor memory
    62.
    发明授权

    公开(公告)号:US07120078B2

    公开(公告)日:2006-10-10

    申请号:US10948818

    申请日:2004-09-23

    IPC分类号: G11C7/00

    CPC分类号: G11C11/406 G11C11/4076

    摘要: In an FCRAM having a late write function, when a first command signal indicates “write active”, whether a write operation or an auto-refresh operation is to be performed is determined on the basis of a second command signal. For example, when the second command signal indicates “write”, a write operation for a memory cell is performed by a late write scheme. When the second command signal indicates “auto-refresh”, an auto-refresh operation is performed. In the last write cycle of a write operation immediately preceding this auto-refresh operation, addresses for selecting a memory cell as an object of auto-refresh are predetermined. After data write to a memory cell is completed in the last write cycle, row precharge for auto-refresh is performed. After that, an auto-refresh operation (i.e., a data read operation and a data restore operation) is performed for the selected memory cell.

    Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the same
    63.
    发明授权
    Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the same 失效
    具有多个存储体的同步半导体存储器件及其控制方法

    公开(公告)号:US06885606B2

    公开(公告)日:2005-04-26

    申请号:US10353271

    申请日:2003-01-28

    摘要: A synchronous semiconductor memory device includes a plurality of memory banks which read data from memory cells and write data into the memory cells, a command decoder circuit which receives a command, detects whether the command is a read command or a write command, and, when detecting a read command or a write command, outputs a first control signal that enables a read operation or a write operation in the plurality of memory banks, bank select circuits which activate a second control signal to activate each of the memory banks, and bank timer circuits which deactivate the activated second control signal and perform control in such a manner that the timing with which the second control signal is deactivated in a test mode differs from that in a normal mode.

    摘要翻译: 同步半导体存储器件包括从存储器单元读取数据并将数据写入存储单元的多个存储器组,接收命令的命令解码器电路,检测该命令是读命令还是写命令,以及何时 检测读取命令或写入命令,输出启用多个存储体中的读取操作或写入操作的第一控制信号,激活第二控制信号的存储体选择电路以激活每个存储体,以及存储体定时器 电路,其使激活的第二控制信号去激活并执行控制,使得在测试模式中第二控制信号被去激活的定时与正常模式不同。

    Clock synchronous circuit
    65.
    发明授权

    公开(公告)号:US06545941B2

    公开(公告)日:2003-04-08

    申请号:US09966664

    申请日:2001-09-27

    IPC分类号: G11C800

    摘要: A clock synchronous circuit is stopped or started in accordance with the situation. More specifically, the clock synchronous circuit is stopped when no synchronous clock is necessary or in modes, such as a standby mode, bank active mode, refresh mode, and write mode, other than a read mode. In the read mode, the clock synchronous circuit is operated because a synchronous clock is necessary to output data. In the read mode, the number of clocks, i.e., CL, required from the time a read command is input to the time data is actually output, is 3 or more, when restarting and preamble of the clock synchronous circuit are taken into consideration.

    Semiconductor integrated circuit device
    66.
    发明授权
    Semiconductor integrated circuit device 失效
    半导体集成电路器件

    公开(公告)号:US06226204B1

    公开(公告)日:2001-05-01

    申请号:US09141450

    申请日:1998-08-27

    IPC分类号: G11C1604

    摘要: The data output circuit in a clock synchronous DRAM comprises a first data transfer circuit to which the data read from a memory is input and which transfers the input data to the output side in synchronization with an internal clock, an equalizing circuit to which the output of the first data transfer circuit is input during a read operation by a burst operation and to which high-impedance data is input after the read operation, a second data transfer circuit connected to the equalizing circuit, and an output buffer to which the output of the second data transfer circuit is input. The second data transfer circuit transfers all the data to the output buffer in synchronization with an output clock. This eliminates the dependence of the data access time and data hold time on data item and/or cycle and facilitates the timing control of the output control signal.

    摘要翻译: 时钟同步DRAM中的数据输出电路包括第一数据传输电路,从存储器读取的数据被输入到该第一数据传输电路,并且将输入数据与内部时钟同步地传送到输出端;均衡电路, 第一数据传送电路在读操作期间通过脉冲串操作输入,并且在读操作之后输入高阻数据,连接到均衡电路的第二数据传输电路和输出缓冲器 第二数据传输电路被输入。 第二数据传输电路与输出时钟同步地将所有数据传送到输出缓冲器。 这消除了数据访问时间和数据保持时间对数据项和/或周期的依赖性,并且便于输出控制信号的定时控制。

    Semiconductor memory device with testable spare columns and rows
    67.
    发明授权
    Semiconductor memory device with testable spare columns and rows 失效
    半导体存储器件具有可测试的备用列和行

    公开(公告)号:US6046955A

    公开(公告)日:2000-04-04

    申请号:US271468

    申请日:1999-03-17

    CPC分类号: G11C8/12

    摘要: A synchronous dynamic random access memory has spare columns which can be tested before shipping. In the memory, a mode set register outputs a multibank write signal in the test mode. A CBS latch circuit generates not only a signal for selecting the spare column decoders in banks and in the test mode but also signals for selecting the column decoders. Write driving circuits write the data onto the column lines selected by the column decoders and onto the spare column lines selected by the spare column decoders.

    摘要翻译: 同步动态随机存取存储器有备用列,可在发货前进行测试。 在存储器中,模式设置寄存器在测试模式下输出多存储器写入信号。 CBS锁存电路不仅产生用于在存储体和测试模式中选择备用列解码器的信号,而且还生成用于选择列解码器的信号。 写驱动电路将数据写入由列解码器选择的列线上,并将其写入由备用列解码器选择的备用列线上。

    Semiconductor memory device having a plurality of banks
    68.
    发明授权
    Semiconductor memory device having a plurality of banks 失效
    具有多个存储体的半导体存储器件

    公开(公告)号:US5818785A

    公开(公告)日:1998-10-06

    申请号:US764886

    申请日:1996-12-16

    申请人: Shigeo Ohshima

    发明人: Shigeo Ohshima

    IPC分类号: G11C7/10 G11C8/12 G11C8/00

    CPC分类号: G11C7/10 G11C7/1051 G11C8/12

    摘要: A semiconductor memory device having a plurality of banks of memory cells is provided. The device has a data line provided in each of the banks for coupling to one of the memory cells in the corresponding bank. A common data line is shared by the banks, and is selectively coupled to one of the data lines through switches. Additionally, an amplifier is coupled to the common data line to amplify data read from a selected memory cell, and an I/O line is coupled to the amplifier to transmit the amplified data to an outer section. In the device, one of the banks of memory cells is selected by a bank select signal. Therefore, the amplifier is shared by the banks. Further the length of the I/O line can be shortened so that the load on the amplifier can be reduced. Accordingly, chip area is decreased and the speed of the memory device is improved.

    摘要翻译: 提供具有多个存储单元组的半导体存储器件。 该设备具有在每个存储体中提供的数据线,用于耦合到相应存储体中的一个存储单元。 公共数据线由存储体共享,并且通过开关选择性地耦合到数据线之一。 此外,放大器耦合到公共数据线以放大从所选择的存储器单元读取的数据,并且I / O线耦合到放大器以将放大的数据传输到外部部分。 在器件中,存储单元组之一由存储体选择信号选择。 因此,放大器由银行共享。 此外,可以缩短I / O线的长度,从而可以减小放大器的负载。 因此,芯片面积减小,存储器件的速度提高。

    Semiconductor memory circuit equipped with a column addressing circuit
having a shift register
    69.
    发明授权
    Semiconductor memory circuit equipped with a column addressing circuit having a shift register 失效
    配备有具有移位寄存器的列寻址电路的半导体存储器电路

    公开(公告)号:US5777946A

    公开(公告)日:1998-07-07

    申请号:US770404

    申请日:1996-12-20

    CPC分类号: G11C8/04

    摘要: The present invention provides a semiconductor memory circuit capable of high-speed access to a predetermined column portion by a simplified high-speed addressing circuit. The memory circuit in a DRAM is such that a portion of a column addressing circuit normally comprising a counter constitutes a shift register in a column addressing circuit at a preceding stage of a column address buffer so that a plurality of address signal wrappings are realized for accessing the predetermined column portion.

    摘要翻译: 本发明提供一种能够通过简化的高速寻址电路高速访问预定列部分的半导体存储器电路。 DRAM中的存储器电路使得通常包括计数器的列寻址电路的一部分在列地址缓冲器的前级构成列寻址电路中的移位寄存器,从而实现多个地址信号包装以进行访问 预定列部分。

    Semiconductor integrated circuit
    70.
    发明授权
    Semiconductor integrated circuit 失效
    半导体集成电路

    公开(公告)号:US5703381A

    公开(公告)日:1997-12-30

    申请号:US557731

    申请日:1995-11-13

    CPC分类号: H01L22/34 G01R31/2884

    摘要: A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.

    摘要翻译: 半导体集成电路包括具有主表面的矩形半导体芯片,形成在半导体芯片的主表面的周边部分中的多个焊盘,用于连接到外部连接构件,多个集成电路的电路元件形成在 除了形成多个焊盘的区域之外的主表面的区域,以及至少一个特征评估电路元件,其通过共享形成的杂质掺杂区域而与集成电路的多个电路元件中的至少一个连接 所述至少一个电路元件的一部分与所述集成电路的所述至少一个电路元件在所述主表面的除了形成所述多个焊盘的外围部分之外的区域中。