Abstract:
An in-situ on-line detection device and detection method for a long-distance metallurgical liquid metal component. The detection device comprises a front-end high-temperature resistant probe, a middle-end optical sensing device and a back-end control platform, wherein the head of the front-end high-temperature resistant probe is placed in a liquid metal, the tail thereof is coaxially connected to the middle-end optical sensing device, and an optical window is arranged in the connection position; and the middle-end optical sensing device is connected to the back-end control platform through a signal line. The detection device and detection method can provide a timely and valid message for quality control and a melting end, so that the detection time is greatly shortened, the detection distance can he adjusted extensively, the measurement result is accurate, and it can be achieved to measure components that are difficult to measure such as carbon, sulfur, phosphorous, etc.
Abstract:
The present invention relates to the technical field of display, and particularly relates to a substrate damage inspection apparatus, a production system and an inspection method. The substrate damage inspection apparatus comprises a drive unit, support rods, sensors and a controller, wherein the drive unit is connected with the support rods so as to drive the support rods to ascend or descend below a substrate to be detected; and the sensors are disposed on the support rods and communicatively connect with the controller, so as to emit light beams to the substrate to be detected, receive the light beams reflected by the substrate to be detected, and feed them back to the controller. By means of the drive unit and the support rods with the sensors, the substrate damage inspection apparatus realizes damage inspection for the substrate to be detected in a vertical direction. That is, a technical solution provided by the present invention allows for damage inspection for the substrate to be detected when it vertically moves. In addition, the substrate damage inspection apparatus is simple in structure and convenient to operate, thereby having strong utility value and significance of generalization.
Abstract:
The present invention relates to the technical field of display, and particularly relates to a substrate damage inspection apparatus, a production system and an inspection method. The substrate damage inspection apparatus comprises a drive unit, support rods, sensors and a controller, wherein the drive unit is connected with the support rods so as to drive the support rods to ascend or descend below a substrate to be detected; and the sensors are disposed on the support rods and communicatively connect with the controller, so as to emit light beams to the substrate to be detected, receive the light beams reflected by the substrate to be detected, and feed them back to the controller. By means of the drive unit and the support rods with the sensors, the substrate damage inspection apparatus realizes damage inspection for the substrate to be detected in a vertical direction. That is, a technical solution provided by the present invention allows for damage inspection for the substrate to be detected when it vertically moves. In addition, the substrate damage inspection apparatus is simple in structure and convenient to operate, thereby having strong utility value and significance of generalization.
Abstract:
A multipoint detection fiber sensor including a plurality of sensing parts at a plurality of positions is provided. The sensing parts are able to detect curve amounts respectively. The multipoint detection fiber sensor includes a plurality of optical fibers arranged in an overall effective detection area that is an extent in which the multipoint detection fiber sensor detects curve amounts. Each of the optical fibers includes the plurality of sensing parts. The multipoint detection fiber sensor also includes a light source which supplies light to the optical fibers and a light receiver which receives light emitted through the optical fibers to which light is supplied. Furthermore, an insertion apparatus into which the multipoint detection fiber sensor is incorporated is provided.
Abstract:
The invention concerns a device (100) for the detection and/or quantitative analysis of hydrogen, intended for monitoring an installation (1). Said device (100) comprises a first measuring optical fiber (10) intended to equip the installation (1), and an optical system (20) optically connected to the first measuring optical fiber (10) and adapted to measure the variation in at least one parameter of the first measuring optical fiber (10). The optical system (20) is adapted to measure the parameter along the first optical fiber (10) according to the principle of Brillouin measurement. The invention also concerns a method using such a device (100).
Abstract:
A fiber optic sensor interrogation system with inbuilt passive power limiting capability based on stimulated Brillouin scattering that provides improved safety performance for use in explosive atmospheres.
Abstract:
A bonded structure (10) includes a laminate (12A), a laminate (12B), an adhesive (14) that bonds together the laminate (12A) and the laminate (12B), and an optical fiber (16) sandwiched between the laminate (12A) and the laminate (12B). When a pressure is applied to the optical fiber (16) only from a predetermined direction, the sectional shape of the optical fiber (16) changes to an elliptical shape, so that birefringence occurs, whereby the shape of the light spectrum changes so as to have multiple (e.g., two) peaks. The optical fiber (16) is used as a sensor for detecting the bonding condition between the laminate (12A) and the laminate (12B) based on this birefringence. Thus, with the bonded structure 10, it is possible to determine whether members are bonded together appropriately.
Abstract:
An optical sensor for detecting hydrogen in a fluid in physical contact with the sensor is provided. The sensor includes an optical fiber, wherein an end portion of the optical fiber is coated with a multilayer including: a sensing layer, including a film of an alloy, the alloy including Mg, Ni, and M, wherein M is at least one of Zr, Ta, and Hf, and wherein the alloy has the composition MgxNiyMz, and wherein x is from 40 to 60, y is from 10 to 40, and z is from 10 to 40, and a catalyst layer including Pd. Further, a detection system for hydrogen, including such an optical sensor, and an electrical device having such a detection system are provided.
Abstract translation:提供一种用于检测与传感器物理接触的流体中的氢的光学传感器。 所述传感器包括光纤,其中所述光纤的端部涂覆有多层,所述多层包括:感测层,包括合金膜,所述合金包括Mg,Ni和M,其中M是至少一种 Zr,Ta和Hf,并且其中所述合金的组成为Mg x Ni y M z,并且其中x为40至60,y为10至40,z为10至40,以及包含Pd的催化剂层。 此外,提供了包括这种光学传感器的氢检测系统和具有这种检测系统的电气装置。
Abstract:
An invention for making productive uses of normally undesirable whiskers is provided. Embodiments of the invention include a variety of apparatuses and methods associated with forming and using whiskers as well as forming whisker compounds is disclosed. For example, whisker detection modules can be created which provide a whisker surveillance capability. The whisker detection modules can further be coupled with a whisker response system such as an alarm or insulating material dispersing system. Another aspect of the invention is providing a variety of environments or microenvironments with regard to a whisker forming structure to affect whisker creation such as maximizing whisker formation. Another example includes provision of a variety of embodiments for manufacturing compounds of whiskers of various metal and metal alloys, including structures and methods is provided. Whisker compounds produced using various embodiments of the invention can be used for various applications.
Abstract:
A nanoscale structure fabricated on a planar end facet of an optic fiber is described, to enable detection of molecules by surface-enhanced Raman scattering. The nanoscale structure may comprise an array of nanopillars. The nanoscale structure may also comprise a non periodic, or random, surface-relief structure. The nanoscale structure may be coated in a metal, comprising, for example, silver, gold, aluminum, iridium, platinum, palladium, copper, or a combination of the same. The nanoscale structure may be fabricated on a planar end facet of an optical fiber by interference lithography.