摘要:
In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
摘要:
The disclosure relates to an optical integrator configured to produce a plurality of secondary light sources in an illumination system of a microlithographic projection exposure apparatus. The disclosure also relates to a method of manufacturing an array of elongated microlenses for use in such an illumination system. Arrays of elongated microlenses are often contained in optical integrators or scattering plates of such illumination systems.
摘要:
An optical apparatus for illuminating an object, for example an illumination system of a microlithographic exposure system, comprises a light source that generates a plurality of individual bundles that constitute an illumination bundle. A control device controls the light source in such a way that a desired form of the illumination bundle is determined by selecting an appropriate set of individual bundles.
摘要:
A zoom system for an illumination device of a microlithographic projection exposure system is configured in the form of a focal-length zoom lens. The lenses of the zoom system define an object plane (6) and an image plane (8) that is a Fourier transform of the object plane. The zoom system is characterized by a large expansion of the illuminated area in the image plane, where expansion factors (D) in excess of four are feasible and are obtained by employing lens groups (33, 36) that are movable over large moving ranges.
摘要:
The invention relates to an illuminating system of a microlithographic projection exposure arrangement having a light source (1), a first objective (7), a fly-eye-integrator (11), a diaphragm plane (13), a condenser optic (15), and an image plane (21) having a field to be illuminated. The fly-eye-integrator (11) includes at least a first one-dimensional array (39) of first cylinder lenses having first cylinder axes and a second one-dimensional array (47) of second cylinder lenses having second cylinder axes. The second cylinder axes are aligned perpendicularly to the first cylinder axes. A third one-dimensional array (35) of third cylinder lenses having third cylinder axes are mounted forward of the first array (39) to increase divergence. The third cylinder axes are aligned parallelly to the first cylinder axes and a fourth one-dimensional array (43) of fourth cylinder lenses having fourth cylinder axes is arranged forward of the second array (47) for increasing divergence. The fourth cylinder axes are aligned parallel to the second cylinder axes.
摘要:
A REMA objective 123 images an object plane 1 onto the reticle plane 33 and has a lens group 300 disposed in the half of the objective close to the reticle. The object plane 1 lies at a finite spacing. In the lens group 300, the principal ray elevations are greater in magnitude than the elevations of the peripheral rays. A scattering surface 28 is arranged in the lens group 300 having a largest magnitude of sine of the angle of incidence of the principal ray in air with respect to the surface normal (.vertline.sin (i.sub.princ).vertline.) greater than 0.35 and preferably greater than 0.5.
摘要:
The invention is directed to an illuminating arrangement for selectively providing a projection microlithographic exposure apparatus with various types of illumination including conventional illumination having an adjustable coherence factor (.sigma.), illumination via an annular aperture and symmetrically inclined illumination from two or four directions. The illuminating arrangement includes a light source for emitting light; a first light collecting device for collecting a first portion of the light in a first spatial angle region of the emitted light; a first shaping device for receiving and shaping the first portion of the light into a first shaped flux of light; a second light collecting device for collecting a second portion of the light in a second spatial angle region of the emitted light; a second shaping device for receiving and shaping the second portion of the light into a second shaped flux of light; an objective defining a pupillary plane and a reticle plane downstream of the pupillary plane; and, an imaging device for imaging images of the first and second shaped fluxes of light into sectors of the pupillary plane. The objective transmits the fluxes of light to the reticle plane and the illuminating arrangement also includes a first displacing device for operating on the first shaped flux of light so as to radially and azimuthally displace the image of the first shaped flux of light in the pupillary plane and a second displacing device for operating on the second shaped flux of light so as to radially and azimuthally displace the image of the second shaped flux of light in the pupillary plane.
摘要:
Microlithographic illumination system includes individually drivable elements to variably illuminate a pupil surface of the system. Each element deviates an incident light beam based on a control signal applied to the element. The system also includes an instrument to provide a measurement signal, and a model-based state estimator configured to compute, for each element, an estimated state vector based on the measurement signal. The estimated state vector represents: a deviation of a light beam caused by the element; and a time derivative of the deviation. The illumination system further includes a regulator configured to receive, for each element: a) the estimated state vector; and b) target values for: i) the deviation of the light beam caused by the deviating element; and ii) the time derivative of the deviation.
摘要:
An optical system for generating a light beam for treating a substrate in a substrate plane is disclosed. The light beam has a beam length in a first dimension perpendicular to the propagation direction of the light beam and a beam width in a second dimension perpendicular to the first dimension and also perpendicular to the light propagation direction.The optical system includes a mixing optical arrangement which divides the light beam in at least one of the first and second dimensions into a plurality of light paths incident in the substrate plane in a manner superimposed on one another. At least one coherence-influencing optical arrangement is present in the beam path of the light beam and acts on the light beam to at least reduce the degree of coherence of light for at least one light path distance of one light path from at least one other light path.
摘要:
An illumination system of a microlithographic projection exposure apparatus has a pupil surface and an essentially flat arrangement of desirably individually drivable beam deviating elements for variable illumination of the pupil surface. Each beam deviating element allows deviation of a projection light beam incident on it to be achieved as a function of a control signal applied to the beam deviating element. A measurement illumination instrument directs a measurement light beam, independent of the projection light beams, onto a beam deviating element. A detector instrument records the measurement light beam after deviation by the beam deviating element. An evaluation unit determines the deviation of the projection light beam from measurement signals provided by the detector instrument.