Carrier head with controllable pressure and loading area for chemical mechanical polishing
    89.
    发明授权
    Carrier head with controllable pressure and loading area for chemical mechanical polishing 有权
    承载头具有可控的压力和加载区域进行化学机械抛光

    公开(公告)号:US06422927B1

    公开(公告)日:2002-07-23

    申请号:US09470820

    申请日:1999-12-23

    申请人: Steven M. Zuniga

    发明人: Steven M. Zuniga

    IPC分类号: B24B500

    CPC分类号: B24B37/32 B24B37/30 B24B49/16

    摘要: A carrier head for a chemical mechanical polishing apparatus a flexible membrane that applies a load to a substrate in a loading area with a controllable size. One pressurizable chamber in the carrier head controls the size of the loading area, and another chamber controls the pressure applied to the substrate in the loading area.

    摘要翻译: 一种用于化学机械抛光装置的载体头,该柔性膜在具有可控尺寸的装载区域中对基底施加载荷。 载体头中的一个可加压室控制装载区域的尺寸,另一个室控制在装载区域中施加到基板的压力。

    Carrier head with a substrate sensor
    90.
    发明授权
    Carrier head with a substrate sensor 有权
    载体头与基底传感器

    公开(公告)号:US06398621B1

    公开(公告)日:2002-06-04

    申请号:US09296942

    申请日:1999-04-22

    IPC分类号: B24B4900

    摘要: A carrier head for a chemical mechanical polishing system includes a flexible membrane with a substrate receiving surface, a sensor mechanism to determine if a substrate is properly attached to the carrier head, and means for preventing fluid that may be located between the substrate and the flexible membrane from interfering with the substrate detection mechanism.

    摘要翻译: 用于化学机械抛光系统的载体头包括具有基底接收表面的柔性膜,用于确定基底是否适当地附接到载体头的传感器机构,以及用于防止可能位于基底和柔性体之间的流体的装置 膜干扰基板检测机制。