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公开(公告)号:US20240004547A1
公开(公告)日:2024-01-04
申请号:US18369079
申请日:2023-09-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Prasun Gera , Dimin Niu , Hongzhong Zheng
CPC classification number: G06F3/0605 , G06F15/785 , G06F3/0611 , G06F3/0625 , G06F3/0635 , G06F3/0659 , G06F3/0673 , G06F9/30196 , Y02D10/00
Abstract: A 3D-stacked memory device including: a base die including a plurality of switches to direct data flow and a plurality of arithmetic logic units (ALUs) to compute data; a plurality of memory dies stacked on the base die; and an interface to transfer signals to control the base die.
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公开(公告)号:US11789610B2
公开(公告)日:2023-10-17
申请号:US17353393
申请日:2021-06-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Mu-Tien Chang , Prasun Gera , Dimin Niu , Hongzhong Zheng
CPC classification number: G06F3/0605 , G06F3/0611 , G06F3/0625 , G06F3/0635 , G06F3/0659 , G06F3/0673 , G06F9/30196 , G06F15/785 , Y02D10/00
Abstract: A 3D-stacked memory device including: a base die including a plurality of switches to direct data flow and a plurality of arithmetic logic units (ALUs) to compute data; a plurality of memory dies stacked on the base die; and an interface to transfer signals to control the base die.
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公开(公告)号:US11625296B2
公开(公告)日:2023-04-11
申请号:US17319844
申请日:2021-05-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dimin Niu , Mu-Tien Chang , Hongzhong Zheng , Hyun-Joong Kim , Won-hyung Song , Jangseok Choi
Abstract: A method of correcting a memory error of a dynamic random-access memory module (DRAM) using a double data rate (DDR) interface, the method includes conducting a memory transaction including multiple bursts with a memory controller to send data from data chips of the DRAM to the memory controller, detecting one or more errors using an ECC chip of the DRAM, determining a number of the bursts having the errors using the ECC chip of the DRAM, determining whether the number of the bursts having the errors is greater than a threshold number, determining a type of the errors, and directing the memory controller based on the determined type of the errors, wherein the DRAM includes a single ECC chip per memory channel.
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公开(公告)号:US11568920B2
公开(公告)日:2023-01-31
申请号:US15713587
申请日:2017-09-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng
IPC: G06F3/00 , G11C11/408 , G06F3/06 , G11C11/4094 , G11C5/02 , G11C11/403 , G11C11/4097 , G11C11/4076 , G11C7/10 , G11C5/04
Abstract: A memory device includes an array of 2T1C DRAM cells and a memory controller. The DRAM cells are arranged as a plurality of rows and columns of DRAM cells. The memory controller is internal to the memory device and is coupled to the array of DRAM cells. The memory controller is capable of receiving commands input to the memory device and is responsive to the received commands to control row-major access and column-major access to the array of DRAM cells. In one embodiment, each transistor of a memory cell includes a terminal directly coupled to a storage node of the capacitor. In another embodiment, a first transistor of a memory cell includes a terminal directly coupled to a storage node of the capacitor, and a second transistor of the 2T1C memory cell includes a gate terminal directly coupled to the storage node of the capacitor.
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公开(公告)号:US11556476B2
公开(公告)日:2023-01-17
申请号:US17121488
申请日:2020-12-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Krishna T. Malladi , Dimin Niu , Hongzhong Zheng
IPC: G06F12/0875 , G06F13/16 , G06F13/12 , G06F9/30
Abstract: A method of processing in-memory commands in a high-bandwidth memory (HBM) system includes sending a function-in-HBM instruction to the HBM by a HBM memory controller of a GPU. A logic component of the HBM receives the FIM instruction and coordinates the instructions execution using the controller, an ALU, and a SRAM located on the logic component.
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公开(公告)号:US11513965B2
公开(公告)日:2022-11-29
申请号:US17156362
申请日:2021-01-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Krishna T. Malladi , Mu-Tien Chang , Dimin Niu , Hongzhong Zheng
IPC: G06F12/08 , G06F12/0879 , G11C11/417
Abstract: A high bandwidth memory system. In some embodiments, the system includes: a memory stack having a plurality of memory dies and eight 128-bit channels; and a logic die, the memory dies being stacked on, and connected to, the logic die; wherein the logic die may be configured to operate a first channel of the 128-bit channels in: a first mode, in which a first 64 bits operate in pseudo-channel mode, and a second 64 bits operate as two 32-bit fine-grain channels, or a second mode, in which the first 64 bits operate as two 32-bit fine-grain channels, and the second 64 bits operate as two 32-bit fine-grain channels.
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公开(公告)号:US11175853B2
公开(公告)日:2021-11-16
申请号:US15669851
申请日:2017-08-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng , Heehyun Nam , Youngjin Cho , Sun-Young Lim
IPC: G06F3/00 , G06F12/00 , G06F3/06 , G06F12/0895 , G06F12/0868 , G06F13/16 , G06F12/02
Abstract: A memory module includes a memory controller including: a host layer; a media layer coupled to a non-volatile memory; and a logic core coupled to the host layer, the media layer, and a volatile memory, the logic core storing a first write group table including a plurality of rows, and the logic core being configured to: receive a persistent write command including a cache line address and a write group identifier; receive data associated with the persistent write command; write the data to the volatile memory at the cache line address; store the cache line address in a selected buffer of a plurality of buffers in a second write group table, the selected buffer corresponding to the write group identifier; and update a row of the first write group table to identify locations of the selected buffer containing valid entries, the row corresponding to the write group identifier.
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公开(公告)号:US11100193B2
公开(公告)日:2021-08-24
申请号:US16388860
申请日:2019-04-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Peng Gu , Krishna Malladi , Hongzhong Zheng , Dimin Niu
IPC: G06F17/16 , G06F12/0877 , G06F12/0802 , G06N3/063 , G06N3/00 , G06N3/04 , G06N3/08
Abstract: A general matrix-matrix multiplication (GEMM) dataflow accelerator circuit is disclosed that includes a smart 3D stacking DRAM architecture. The accelerator circuit includes a memory bank, a peripheral lookup table stored in the memory bank, and a first vector buffer to store a first vector that is used as a row address into the lookup table. The circuit includes a second vector buffer to store a second vector that is used as a column address into the lookup table, and lookup table buffers to receive and store lookup table entries from the lookup table. The circuit further includes adders to sum the first product and a second product, and an output buffer to store the sum. The lookup table buffers determine a product of the first vector and the second vector without performing a multiply operation. The embodiments include a hierarchical lookup architecture to reduce latency. Accumulation results are propagated in a systolic manner.
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公开(公告)号:US10908993B2
公开(公告)日:2021-02-02
申请号:US16411122
申请日:2019-05-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dimin Niu , Mu-Tien Chang , Hongzhong Zheng , Hyun-Joong Kim , Won-Hyung Song , Jangseok Choi
IPC: G06F11/10 , G11C29/52 , G11C11/4093
Abstract: A memory controller is disclosed. The memory controller may include read circuitry to request a value at an address stored in a plurality of data chips, parity circuitry to calculate a parity from original data received from the plurality of the data chips, pollution pattern analysis circuitry to compare the parity with a plurality of pollution patterns programmed into the plurality of the data chips to identify a data chip with an error, and error correction circuitry to correct the error in the original data received from the identified data chip with the error.
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90.
公开(公告)号:US20200272479A1
公开(公告)日:2020-08-27
申请号:US16407064
申请日:2019-05-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dongyan Jiang , Dimin Niu , Hongzhong Zheng
Abstract: An adaptive matrix multiplier. In some embodiments, the matrix multiplier includes a first multiplying unit a second multiplying unit, a memory load circuit, and an outer buffer circuit. The first multiplying unit includes a first inner buffer circuit and a second inner buffer circuit, and the second multiplying unit includes a first inner buffer circuit and a second inner buffer circuit. The memory load circuit is configured to load data from memory, in a single burst of a burst memory access mode, into the first inner buffer circuit of the first multiplying unit; and into the first inner buffer circuit of the second multiplying unit.
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