公开(公告)号：US20230324217A1

公开(公告)日：2023-10-12

申请号：US18042477

申请日：2021-08-17

Applicant: ams-OSRAM AG

Inventor： Curd TRATTLER ,  Klaus SCHMIDEGG

IPC: G01J1/42 ,  G01J1/04 ,  G01J1/02

CPC classification number: G01J1/4204 ,  G01J1/0488 ,  G01J1/0219 ,  G01J2001/4252

Abstract: A sensing system comprising a light filtering apparatus configured to pass a first wavelength of light corresponding to an emission spectrum characteristic of Mercury. The sensing system comprises a sensor configured to receive light passed by the light filtering apparatus and produce a sensor response that is indicative of the light passed by the light filtering apparatus. The sensing system comprises a processor configured to use the sensor response to distinguish between light emitted by a fluorescent light source and light emitted by a light emitting diode.

公开(公告)号：US11740123B2

公开(公告)日：2023-08-29

申请号：US17665921

申请日：2022-02-07

Applicant: Lutron Technology Company LLC

Inventor： Kuo-Lih Chang ,  Mickey Malone ,  Horace C. Ho

IPC: G01J1/02 ,  G01J3/46 ,  G01J3/50 ,  G01J3/02 ,  G01J1/32 ,  H05B45/20 ,  H05B45/46 ,  H05B47/19 ,  G01J1/44 ,  G01J1/42 ,  H05B47/195

CPC classification number: G01J1/0252 ,  G01J1/32 ,  G01J3/0286 ,  G01J3/465 ,  G01J3/502 ,  H05B45/20 ,  H05B45/46 ,  H05B47/19 ,  G01J2001/4252 ,  G01J2001/444 ,  H05B47/195

Abstract: An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

公开(公告)号：US20180340985A1

公开(公告)日：2018-11-29

申请号：US15887551

申请日：2018-02-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong Hoon JUNG ,  Dae Sik KIM ,  Sung Yeol KIM ,  Seung Yong SHIN

IPC: G01R31/44 ,  G01J1/44

CPC classification number: G01R31/44 ,  G01J1/42 ,  G01J1/44 ,  G01J3/505 ,  G01J2001/4252 ,  G01R1/07314 ,  G01R31/2635

Abstract: Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.

公开(公告)号：US10012520B2

公开(公告)日：2018-07-03

申请号：US14949089

申请日：2015-11-23

Applicant: Henry Ip ,  Michael A. Tischler ,  Chi Wai Ho

Inventor： Henry Ip ,  Michael A. Tischler ,  Chi Wai Ho

IPC: G01J1/42 ,  G01D5/34 ,  G01J3/46 ,  G01J3/50 ,  G01J3/28

CPC classification number: G01D5/34 ,  G01J1/42 ,  G01J3/465 ,  G01J3/505 ,  G01J2001/4252 ,  G01J2003/2813

Abstract: In accordance with certain embodiments, multiple light-emitting elements of a light-emitting device are tested via imaging and image analysis.

公开(公告)号：US09952090B2

公开(公告)日：2018-04-24

申请号：US13608288

申请日：2012-09-10

Applicant: Ching-Cherng Sun ,  Yeh-Wei Yu ,  Yen-Lin Chen ,  Wei-Hsin Chen

Inventor： Ching-Cherng Sun ,  Yeh-Wei Yu ,  Yen-Lin Chen ,  Wei-Hsin Chen

IPC: G01J1/04 ,  G01J1/02 ,  G01J1/42

CPC classification number: G01J1/0403 ,  G01J1/0266 ,  G01J1/0474 ,  G01J2001/4247 ,  G01J2001/4252

Abstract: A detecting apparatus for detecting an object includes at least a screen, at least a detecting unit and at least a holding unit. The screen is partial light-permeable and has a first surface and an opposite second surface. The object is disposed adjacent to the first surface of the screen. The detecting unit is disposed corresponding to the object and located adjacent to the second surface of the screen. The holding unit holds the relative distances between the screen, the object and the detecting unit. The detecting unit captures the image of the second surface of the screen so as to calculate the optical field distribution of the object. The detecting apparatus can measure the optical field distribution of an object quickly and has the advantages of low cost and high accuracy.

公开(公告)号：US09795006B2

公开(公告)日：2017-10-17

申请号：US15068607

申请日：2016-03-13

Applicant: Yvette Seifert Hirth

Inventor： Yvette Seifert Hirth

IPC: H05B39/00 ,  H05B37/02 ,  F21V29/77 ,  H05B33/08 ,  F21V3/04 ,  F21S9/02 ,  F21V29/67 ,  F21V25/02 ,  A01G7/04 ,  A01G9/20 ,  A01G31/02 ,  F21Y115/10

CPC classification number: H05B37/0227 ,  A01G7/045 ,  A01G9/20 ,  A01G31/02 ,  F21S9/02 ,  F21V25/02 ,  F21V29/67 ,  F21V29/77 ,  F21Y2115/10 ,  G01J1/0247 ,  G01J1/0271 ,  G01J1/0403 ,  G01J1/30 ,  G01J1/32 ,  G01J1/4204 ,  G01J1/44 ,  G01J2001/4252 ,  H04L67/12 ,  H05B33/0809 ,  H05B33/0851 ,  H05B33/0854 ,  H05B33/089 ,  H05B37/0218 ,  H05B37/0254

Abstract: A low-voltage alternating current-based LED light with built-in cooling and automatic or manual dimming. As it is self-cooled with fan failure protection, the light can be safely run in conditions that are near-hostile to its operation, with little possibility of damage. The light is movable along the XY axes of a grid system and can be either fixed in position in the Z axis or can be movable up and down the Z axis. The light can be equipped with either manual dimming using a standard potentiometer, or with automatic dimming via sensors and local network connectivity. The device prevents line-voltage electric shocks as the input voltage is low-voltage AC; in embodiments, about the same voltage as a doorbell, and the input current is 3 A. The device is also self-cooled, and will shut down if its fan is not running so as to prevent thermal overloads.

公开(公告)号：US09763760B2

公开(公告)日：2017-09-19

申请号：US14859546

申请日：2015-09-21

Applicant: Ivoclar Vivadent AG

Inventor： Bruno Senn ,  Wolfgang Plank ,  Gottfried Rohner

IPC: A61C19/00 ,  A61C13/15 ,  A61B1/24 ,  A61B5/00 ,  A61C1/00 ,  A61B1/06 ,  G01B11/02 ,  G01N21/55 ,  G01J1/02 ,  G01J1/42

CPC classification number: A61C19/004 ,  A61B1/0684 ,  A61B1/24 ,  A61B5/0088 ,  A61B5/7246 ,  A61B5/7445 ,  A61C1/0015 ,  G01B11/026 ,  G01J1/0247 ,  G01J1/4228 ,  G01J2001/4252 ,  G01N21/55 ,  G01N2201/062

Abstract: The invention relates to an apparatus for irradiating an object, in particular for light-curing a dental object by means of a first radiation, the apparatus comprising at least one radiation source for emitting the first radiation, the apparatus further comprising at least one radiation sensor for measuring at least a second radiation, and the apparatus further comprising a housing. The second radiation is the first radiation reelected by the object.

公开(公告)号：US09702757B2

公开(公告)日：2017-07-11

申请号：US14804613

申请日：2015-07-21

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Joon Sub Lee ,  Seung Won Park

IPC: G01J1/04 ,  G01J1/42 ,  G01J3/02 ,  G01J1/58

CPC classification number: G01J1/42 ,  G01J1/58 ,  G01J3/0254 ,  G01J2001/0481 ,  G01J2001/4252

Abstract: A light measuring system including an integrating sphere having an aperture configured by opposing reflectors selectively aligned with complementary reflectors of at least one light source mounting block having a light source mounting region for mounting a light source thereon.

公开(公告)号：US09671280B2

公开(公告)日：2017-06-06

申请号：US14587332

申请日：2014-12-31

Applicant: Ka Yee Mak ,  Sai Kit Wong ,  Xiao Lan Liu ,  Jian Jun Ju

Inventor： Ka Yee Mak ,  Sai Kit Wong ,  Xiao Lan Liu ,  Jian Jun Ju

IPC: G01J1/04 ,  G01J1/42 ,  G01N21/27

CPC classification number: G01J1/42 ,  G01J1/0437 ,  G01J2001/0481 ,  G01J2001/4252 ,  G01N21/274 ,  G01N2201/0622 ,  G01N2201/0623 ,  G09G2320/045

Abstract: Method of generating a correction function for a light-emitting diode (LED) testing process, including: detecting light emitted by a reference LED and reflected from inactive LEDs on a panel within a field of view of a detector; varying a number of the inactive LEDs to derive uncorrected values of an optical parameter as a function of the number of inactive LEDs; detecting light emitted by the reference LED, or by an active LED having identical optical properties, in the absence of any other LEDs, to determine at least one reference value for each optical parameter; and calculating differences between the uncorrected values and each reference value to generate the correction function, the correction function being based on the number of inactive LEDs which are arranged within the field of view of the detector in the light detecting step.

公开(公告)号：US20170105260A1

公开(公告)日：2017-04-13

申请号：US15388607

申请日：2016-12-22

Applicant: Ketra, Inc.

Inventor： Horace Ho ,  Jason E. Lewis ,  David J. Knapp

IPC: H05B33/08 ,  G01R31/44 ,  G01J3/50 ,  H05B37/02 ,  G01J1/42 ,  G01J3/46

CPC classification number: H05B33/0851 ,  G01J1/0252 ,  G01J1/32 ,  G01J1/42 ,  G01J3/0286 ,  G01J3/465 ,  G01J3/505 ,  G01J2001/4252 ,  G01J2001/444 ,  G01R31/44 ,  H05B33/0866 ,  H05B33/0869 ,  H05B37/02 ,  H05B37/0227

Abstract: An illumination device and method is provided herein for calibrating individual LEDs in the illumination device, so as to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.