Aircraft sensor pod assembly
    1.
    发明申请
    Aircraft sensor pod assembly 有权
    飞机传感器组件

    公开(公告)号:US20070205327A1

    公开(公告)日:2007-09-06

    申请号:US11368838

    申请日:2006-03-06

    CPC classification number: B64D47/08

    Abstract: The invention is sensor pod assembly for mounting sensor systems for an aircraft, the aircraft having a fuselage with a longitudinal axis. In detail the sensor pod includes an elongated pod having front and rear ends, the pod removable mountable to the underside of the fuselage of the aircraft aligned with the longitudinal axis. A mounting system is includes to mount at least one container capable of being pressurized in a plurality of locations within the pod along the longitudinal axis, the at least one container including means to mount the sensor systems there within.

    Abstract translation: 本发明是用于安装用于飞行器的传感器系统的传感器盒组件,该飞机具有具有纵向轴线的机身。 详细地,传感器盒包括具有前端和后端的细长的盒,可拆卸地安装到飞行器的机身的下侧的荚可以与纵向轴线对齐。 安装系统包括安装至少一个能够沿着纵向轴线在容器内的多个位置加压的容器,所述至少一个容器包括用于将传感器系统安装在其中的装置。

    Biomedical electrodes and biomedical electrodes for electrostimulation
    7.
    发明申请
    Biomedical electrodes and biomedical electrodes for electrostimulation 失效
    生物医用电极和电刺激生物医学电极

    公开(公告)号:US20060183989A1

    公开(公告)日:2006-08-17

    申请号:US11332767

    申请日:2006-01-13

    Applicant: James Healy

    Inventor: James Healy

    CPC classification number: A61B5/04087 A61B5/04 A61B2562/0209 A61N1/0492

    Abstract: A biomedical electrode for transmitting and/or receiving electrical signals to/from a patient is disclosed. The electrode includes a metallized fabric, wherein metallization of the fabric is connected at least on a top side and a bottom side of the fabric so as to uniformly transmit or receive the electrical signals. A conductive gel adhesive in contact with the metallized fabric. The electrode can be fabricated using a continuous web process, thereby reducing the cost of manufacturing the electrode.

    Abstract translation: 公开了一种用于向/从患者发送和/或接收电信号的生物医学电极。 电极包括金属化织物,其中织物的金属化至少连接到织物的顶侧和底侧,以均匀地传输或接收电信号。 与金属化织物接触的导电凝胶粘合剂。 可以使用连续卷材工艺制造电极,从而降低制造电极的成本。

    Semiconductor substrate surface preparation using high temperature convection heating
    8.
    发明授权
    Semiconductor substrate surface preparation using high temperature convection heating 失效
    半导体衬底表面制备采用高温对流加热

    公开(公告)号:US07063992B2

    公开(公告)日:2006-06-20

    申请号:US10637447

    申请日:2003-08-08

    CPC classification number: H01L21/67253 H01L21/67109 Y10S438/928

    Abstract: A method of processing a semiconductor wafer includes utilizing a heated gas to heat at least one part of a semiconductor wafer by convection whereupon at least one contaminant is desorbed therefrom. A stream of cooling gas is caused to pass over the one part of the semiconductor wafer in the absence of heated gas to cool the one part of the semiconductor wafer. A metrology tool is then caused to measure at least one part of the semiconductor wafer to determine at least one characteristic thereof.

    Abstract translation: 一种处理半导体晶片的方法包括利用加热的气体来通过对流加热至少一部分半导体晶片,因此至少一种污染物从其脱离。 在没有加热气体的情况下使冷却气体流过半导体晶片的一部分,以冷却半导体晶片的一部分。 然后使计量工具测量半导体晶片的至少一部分,以确定其至少一个特性。

    Semiconductor substrate surface preparation using high temperature convection heating
    9.
    发明申请
    Semiconductor substrate surface preparation using high temperature convection heating 失效
    半导体衬底表面制备采用高温对流加热

    公开(公告)号:US20050028836A1

    公开(公告)日:2005-02-10

    申请号:US10637447

    申请日:2003-08-08

    CPC classification number: H01L21/67253 H01L21/67109 Y10S438/928

    Abstract: A method of processing a semiconductor wafer includes utilizing a heated gas to heat at least one part of a semiconductor wafer by convection whereupon at least one contaminant is desorbed therefrom. A stream of cooling gas is caused to pass over the one part of the semiconductor wafer in the absence of heated gas to cool the one part of the semiconductor wafer. A metrology tool is then caused to measure at least one part of the semiconductor wafer to determine at least one characteristic thereof.

    Abstract translation: 一种处理半导体晶片的方法包括利用加热的气体来通过对流加热至少一部分半导体晶片,因此至少一种污染物从其脱离。 在没有加热气体的情况下,使冷却气体流过半导体晶片的一部分,以冷却半导体晶片的一部分。 然后使计量工具测量半导体晶片的至少一部分,以确定其至少一个特性。

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