Semiconductor manufacturing method and apparatus
    1.
    发明授权
    Semiconductor manufacturing method and apparatus 失效
    半导体制造方法和装置

    公开(公告)号:US06800803B1

    公开(公告)日:2004-10-05

    申请号:US09551910

    申请日:2000-04-19

    申请人: Mitsuji Marumo

    发明人: Mitsuji Marumo

    IPC分类号: H05K900

    摘要: A semiconductor manufacturing apparatus includes a leakage preventing device for preventing outward leakage of electromagnetic waves through an opening defined when a pod having a substrate accommodated therein is mounted on the semiconductor manufacturing apparatus. The leakage preventing device includes at least one electromagnetic wave shielding plate and is provided at the semiconductor manufacturing apparatus side. The apparatus also includes a first electromagnetic wave shielding plate, which is openable and closable so that an opening defined when a carrier in the standard mechanical interface pod is moved downwardly is closed by the plate, and a second electromagnetic wave shielding plate, which has an openable and closable slit provided between an indexer for moving the carrier in the standard mechanical interface pod downwardly and a conveyance robot for conveying the substrate.

    摘要翻译: 半导体制造装置包括防漏装置,用于防止电磁波向外泄漏通过其中容纳有衬底的容器的盒子被安装在半导体制造装置上时限定的开口。 防漏装置包括至少一个电磁波屏蔽板,并设置在半导体制造装置侧。 该装置还包括第一电磁波屏蔽板,该第一电磁波屏蔽板可打开和关闭,使得当标准机械接口盒中的载体向下移动时限定的开口被该板关闭;以及第二电磁波屏蔽板,其具有 设置在用于将标准机械接口容器中的托架向下移动的分度器和用于输送基板的输送机器人之间设置的可开闭切口。

    Substrate holding apparatus and a system using the same
    5.
    发明授权
    Substrate holding apparatus and a system using the same 失效
    基板保持装置及使用其的系统

    公开(公告)号:US5436693A

    公开(公告)日:1995-07-25

    申请号:US119395

    申请日:1993-09-13

    申请人: Mitsuji Marumo

    发明人: Mitsuji Marumo

    CPC分类号: H01L21/6838 B25B11/005

    摘要: A substrate holding apparatus includes a pump, serving as a suction source, a conveying chuck for holding a wafer substrate by suction, a connection arrangement, including parallel lines intermediate the connection arrangement, for conneting the pump to the chuck, and a valve arrangement including at least one valve provided in at least one of the parallel lines. By selecting one of the parallel lines by controlling opening/closing of these valves, the conductance of the connection line is adjusted, whereby the optimum suction pressure for the chuck is set.

    摘要翻译: 基板保持装置包括作为吸引源的泵,用于通过抽吸保持晶片基板的输送卡盘,包括连接装置中间的平行线的连接装置,用于将泵连接到卡盘;以及阀装置,包括 至少一个阀,设置在至少一条平行线上。 通过控制这些阀的打开/关闭来选择平行线之一,调节连接线的电导,由此设定卡盘的最佳吸入压力。

    PROCESSING APPARATUS AND DEVICE MANUFACTURING METHOD
    7.
    发明申请
    PROCESSING APPARATUS AND DEVICE MANUFACTURING METHOD 有权
    处理装置和装置制造方法

    公开(公告)号:US20100026980A1

    公开(公告)日:2010-02-04

    申请号:US12512939

    申请日:2009-07-30

    IPC分类号: G03B27/58 H01L21/677 G05D3/00

    摘要: A processing apparatus of the present invention processes for a wafer 9. The processing apparatus includes an XY stage 6 which includes a wafer chuck 8 which holds the wafer 9 and an elevating device which rises relative to the wafer chuck 8 to hold the wafer 9, and a wafer conveying robot hand 14 which conveys the wafer 9 from the XY stage 6 at a wafer transfer position 18. The XY stage 6 moves to change a direction at an angle between 30 degree and 120 degree via the wafer transfer position 18 in a state where the elevating device rises relative to the wafer chuck 8. The wafer conveying robot hand 14 has a shape which does not interfere with the XY stage 6 which moves to change the direction at the angle when the wafer conveying hand 14 is positioned at the wafer transfer position 18.

    摘要翻译: 本发明的处理装置处理晶片9.处理装置包括XY台6,XY台6包括保持晶片9的晶片卡盘8和相对于晶片卡盘8上升以保持晶片9的升降装置, 以及晶片传送机械手14,其在晶片传送位置18处从XY平台6传送晶片9. XY台6移动以通过晶片传送位置18以30度至120度的角度改变方向 升降装置相对于晶片卡盘8上升的状态。晶片输送机械手14具有不干涉XY台6的形状,XY台6移动以当晶片输送手14位于该位置时以角度改变方向 晶片转印位置18。

    Vacuum attraction type substrate holding device
    8.
    发明授权
    Vacuum attraction type substrate holding device 失效
    真空吸引式基板保持装置

    公开(公告)号:US5203547A

    公开(公告)日:1993-04-20

    申请号:US798812

    申请日:1991-11-27

    申请人: Mitsuji Marumo

    发明人: Mitsuji Marumo

    IPC分类号: H01L21/683

    CPC分类号: H01L21/6838

    摘要: A vacuum attraction type substrate holding system includes a vacuum source; a distributor for distributing a vacuum from the vacuum source into plural vacuum lines; a plurality of vacuum attraction type substrate holding portions corresponding to the vacuum lines, respectively, each of the substrate holding portions having a valve which is openable and closable for control of the supply of vacuum to the corresponding substrate holding portions, wherein the opening or closing of each valve is influential to control attraction or release of a substrate to or from a corresponding substrate holding portion; and a plurality of restriction valves each being disposed between the distributor and corresponding one of the valves, for serving as a resistance to a gas flowing from the corresponding valve.

    Processing apparatus and device manufacturing method
    9.
    发明授权
    Processing apparatus and device manufacturing method 有权
    加工装置及装置的制造方法

    公开(公告)号:US08441614B2

    公开(公告)日:2013-05-14

    申请号:US12512939

    申请日:2009-07-30

    IPC分类号: G03B27/58

    摘要: A processing apparatus of the present invention processes for a wafer 9. The processing apparatus includes an XY stage 6 which includes a wafer chuck 8 which holds the wafer 9 and an elevating device which rises relative to the wafer chuck 8 to hold the wafer 9, and a wafer conveying robot hand 14 which conveys the wafer 9 from the XY stage 6 at a wafer transfer position 18. The XY stage 6 moves to change a direction at an angle between 30 degree and 120 degree via the wafer transfer position 18 in a state where the elevating device rises relative to the wafer chuck 8. The wafer conveying robot hand 14 has a shape which does not interfere with the XY stage 6 which moves to change the direction at the angle when the wafer conveying hand 14 is positioned at the wafer transfer position 18.

    摘要翻译: 本发明的处理装置处理晶片9.处理装置包括XY台6,XY台6包括保持晶片9的晶片卡盘8和相对于晶片卡盘8上升以保持晶片9的升降装置, 以及晶片传送机械手14,其在晶片传送位置18处从XY平台6传送晶片9. XY台6移动以通过晶片传送位置18以30度至120度的角度改变方向 升降装置相对于晶片卡盘8上升的状态。晶片输送机械手14具有不干涉XY台6的形状,XY台6移动以当晶片输送手14位于该位置时以角度改变方向 晶片转印位置18。

    MINI-ENVIRONMENT POD DEVICE, AN EXPOSURE APPARATUS AND A DEVICE MANUFACTURING METHOD USING THE SAME
    10.
    发明申请
    MINI-ENVIRONMENT POD DEVICE, AN EXPOSURE APPARATUS AND A DEVICE MANUFACTURING METHOD USING THE SAME 审中-公开
    微环境装置,曝光装置及使用其的装置制造方法

    公开(公告)号:US20070175838A1

    公开(公告)日:2007-08-02

    申请号:US11674283

    申请日:2007-02-13

    申请人: Mitsuji MARUMO

    发明人: Mitsuji MARUMO

    IPC分类号: B65D85/00

    CPC分类号: H01L21/67772

    摘要: A pod attachable to an outside surface of a grounded electromagnetic-shielded chamber. The chamber has a door and a flange portion, around the door, on the outside surface and contains a micro-device manufacturing apparatus. The pod includes walls configured to contain a substrate and having an opening, the walls including a flange portion configured to contact the flange portion of the chamber, and a lid configured to openably close the opening, the substrate being transferred between the pod and the chamber through the opening. Also included is an electromagnetic shield member. The electromagnetic shield member is arranged over the walls and on the flange portion of the walls. The electromagnetic shield member on the flange portion of the walls is configured to contact the grounded flange portion of the chamber while the pod is attached to the outside surface.

    摘要翻译: 一个可以连接到接地电磁屏蔽室的外表面的吊舱。 该室在外表面上具有门和围绕门的凸缘部分并且包含微型装置制造装置。 所述荚包括构造成容纳基底并具有开口的壁,所述壁包括构造成接触所述腔室的凸缘部分的凸缘部分和被构造成可打开地关闭所述开口的盖子,所述基底在所述荚壳和所述腔室之间转移 通过开放。 还包括电磁屏蔽构件。 电磁屏蔽构件布置在壁的壁上和壁的凸缘部分上。 壁的凸缘部分上的电磁屏蔽构件被构造成在容器附接到外表面的同时接触室的接地法兰部分。