公开(公告)号：US20150362365A1

公开(公告)日：2015-12-17

申请号：US14763890

申请日：2014-02-06

Applicant: ASAHI KASEI MICRODEVICES CORPORATION

Inventor： Toshiaki FUKUNAKA ,  Edson Gomes CAMARGO ,  Sosuke NISHIDA ,  Yuta TAKAGI

IPC: G01J3/12 ,  G02B3/00 ,  G01J3/28

CPC classification number: G01J3/12 ,  G01J1/0403 ,  G01J1/0407 ,  G01J1/0488 ,  G01J3/28 ,  G01J5/0205 ,  G01J5/04 ,  G01J5/045 ,  G01J5/046 ,  G01J5/0803 ,  G01J5/0862 ,  G01J2003/1213 ,  G01J2003/1282 ,  G02B3/0012 ,  H01L31/02325 ,  H01L31/09 ,  H01L2224/48091 ,  H01L2224/73265 ,  H01L2924/00014

Abstract: An infrared-sensor filter member includes an optical filter disposed in an opening portion of a second member and a first member. The infrared-sensor filter member includes a recess portion formed from a light-incident surface of the optical filter and the first member. At least a part of a bottom surface of the recess portion is formed by the light-incident surface and side walls of the recess portion, which are formed by the first member.

Abstract translation: 红外线传感器过滤器构件包括设置在第二构件的开口部分中的滤光器和第一构件。 红外线传感器滤波器构件包括由滤光器的光入射表面和第一构件形成的凹部。 所述凹部的底面的至少一部分由所述凹部的光入射面和所述第一部件形成的侧壁形成。

公开(公告)号：US20180287005A1

公开(公告)日：2018-10-04

申请号：US15911697

申请日：2018-03-05

Applicant: ASAHI KASEI MICRODEVICES CORPORATION

Inventor： Edson Gomes CAMARGO ,  Toshiaki FUKUNAKA

IPC: H01L31/12 ,  H01L27/14 ,  H01L27/15 ,  H01L33/52 ,  H01L31/0216 ,  H01L31/0236 ,  H01L33/20 ,  H01L21/48

CPC classification number: H01L31/12 ,  H01L21/4803 ,  H01L21/4846 ,  H01L27/14 ,  H01L27/15 ,  H01L27/153 ,  H01L31/0203 ,  H01L31/0216 ,  H01L31/02366 ,  H01L33/20 ,  H01L33/52 ,  H01L33/62 ,  H01L2933/005 ,  Y02E10/50

Abstract: PROBLEM TO BE SOLVED: To reduce an influence on an optical device caused by stress variation on a resin sealing body due to an environmental change and similar change.SOLUTION: An optical device includes a substrate 11, a semiconductor lamination portion formed on the substrate 11 and configured to receive or emit a light, a protective layer 3 that has a shape to cover an entire surface of the semiconductor lamination portion, a mold resin 6 configured to seal the protective layer 3 and the substrate 11 excluding a surface of the substrate 11 on an opposite side of a surface on which the semiconductor lamination portion is formed. The light is entered or emitted from a side of the substrate 11, and the mold resin 6 includes a through hole 61 configured to pass through from a top surface of the mold resin 6 to the protective layer 3. A deformation of the mold resin 6 is reduced by the protective layer 3 and the through hole 61. Then, stress variation acting on an active portion 12 including the semiconductor lamination portion can be reduced.

公开(公告)号：US20200011788A1

公开(公告)日：2020-01-09

申请号：US16503533

申请日：2019-07-04

Applicant: Asahi Kasei Microdevices Corporation

Inventor： Toshiaki FUKUNAKA ,  Edson Gomes CAMARGO

IPC: G01N21/3504 ,  G01N21/359 ,  G02B6/136

Abstract: A gas detection apparatus (100) includes a first layer (1) and a second layer (2) disposed opposite the first layer (1) in a predetermined direction (z-axis direction). The first layer (1) includes a light emitter that emits light and a light receiver that receives the light after the light passes through a waveguide. The second layer (2) includes a light input unit of the waveguide opposite the light emitter in the predetermined direction (z-axis direction) and a light output unit of the waveguide opposite the light receiver in the predetermined direction (z-axis direction). The gas detection apparatus (100) can be miniaturized.

公开(公告)号：US20240053262A1

公开(公告)日：2024-02-15

申请号：US18495152

申请日：2023-10-26

Applicant: Asahi Kasei Microdevices Corporation

Inventor： Edson Gomes CAMARGO ,  Shota ISSHIKI

IPC: G01N21/3504 ,  G01N21/31 ,  G01N21/35

CPC classification number: G01N21/3504 ,  G01N21/314 ,  G01N21/35 ,  G01N2201/0627

Abstract: A gas sensor comprises first and second light emitting parts, first and second light receiving parts, and first and second optical path regions, wherein the optical path regions have a common region, a first light receiving part has a larger rate of change of an output signal with respect to a first gas than a second light receiving part, the second light receiving part has a larger rate of change of an output signal with respect to an second gas than the first light receiving part, the first light receiving part has a sensitivity peak wavelength closer to a first wavelength in an absorption wavelength band of the first gas than the second light receiving part, and the second light receiving part has a sensitivity peak wavelength closer to a second wavelength in an absorption wavelength band of the second gas than the first light receiving part.

公开(公告)号：US20220113248A1

公开(公告)日：2022-04-14

申请号：US17494924

申请日：2021-10-06

Applicant: ASAHI KASEI MICRODEVICES CORPORATION

Inventor： Edson Gomes CAMARGO ,  Hiroyuki KATO

IPC: G01N21/3504 ,  G01K13/00 ,  G01N33/00

Abstract: An object is to provide a signal output apparatus and a concentration measurement system capable of correcting a deviation caused by a characteristic variation of each apparatus and realizing concentration measurement with high accuracy.
The signal output apparatus provides a signal output apparatus including a support unit, a light receiving unit provided at the support unit, and configured to receive infrared rays emitted to a measurement target substance, and output a detection signal according to the received infrared rays, a storage unit provided at the support unit, and configured to store a parameter according to a characteristic of at least one of a plurality of components including the light receiving unit, the parameter being used for concentration computation of the measurement target substance, as a calibration parameter, and an interface unit provided at the support unit, and configured to output an output signal including a calibration parameter signal according to the calibration parameter input from the storage unit and a signal based on the detection signal input from the light receiving unit to a signal computation processing unit externally provided, without executing the concentration computation.

公开(公告)号：US20220307976A1

公开(公告)日：2022-09-29

申请号：US17656923

申请日：2022-03-29

Applicant: Asahi Kasei Microdevices Corporation

Inventor： Shota ISSHIKI ,  Edson Gomes CAMARGO

IPC: G01N21/3504 ,  G01N33/00

Abstract: The optical concentration measuring device 1 includes: a first optical filter 41; a second optical filter 42; and an operation part 60, wherein a difference between a peak wavelength of the first effective sensitivity spectrum based on the first transmission band in the first light receiving part 51 and a peak wavelength of the second effective sensitivity spectrum based on the second transmission band in the second light receiving part 52 is ±0.2 times or more and ±0.8 times or less the full width at half maximum of the first effective sensitivity spectrum, wherein the operation part removes an attenuation amount of the first intensity by the interference gas and an attenuation amount of the second intensity by the interference gas.

公开(公告)号：US20220307975A1

公开(公告)日：2022-09-29

申请号：US17655789

申请日：2022-03-22

Applicant: Asahi Kasei Microdevices Corporation

Inventor： Edson Gomes CAMARGO ,  Shota ISSHIKI

IPC: G01N21/3504

Abstract: Provided is a gas sensor comprising first and second light emitting parts, first and second light receiving parts, a first optical path region and a second optical path region, wherein the optical path regions have a common region, an optical path length of the first optical path region is longer than that of the second optical path region, a rate of change of an output signal with respect to a gas to be measured of the first light receiving part is larger than that of the second light receiving part, a rate of change of an output signal with respect to an interference gas of the second light receiving part is larger than that of the first light receiving part, and a sensitivity peak wavelength of the second light receiving part overlaps with an absorption wavelength of water vapor.

公开(公告)号：US20190072489A1

公开(公告)日：2019-03-07

申请号：US16059278

申请日：2018-08-09

Applicant: ASAHI KASEI MICRODEVICES CORPORATION

Inventor： Edson Gomes CAMARGO ,  Satoshi TAKEHARA

IPC: G01N21/61 ,  H01L31/167 ,  H01L31/0304 ,  G01N21/3504 ,  G01N21/03

CPC classification number: G01N21/61 ,  G01N21/0303 ,  G01N21/031 ,  G01N21/3504 ,  G01N2201/062 ,  G01N2201/068 ,  G01N2201/12 ,  H01L31/0304 ,  H01L31/167

Abstract: A small-size reliable gas sensor that can reduce a measurement error can be provided. The gas sensor includes a first light source; a first sensor unit and a second sensor unit disposed to receive light output from the first light source; a first substrate having a first principal surface on which the first light source and the first sensor unit are provided; and a second substrate having a first principal surface on which the second sensor unit is provided. The first sensor unit is disposed at a location where light output from the first light source and reflected on the second principal surface strikes the first principal surface of the first substrate.

公开(公告)号：US20160231244A1

公开(公告)日：2016-08-11

申请号：US15022976

申请日：2014-09-26

Applicant: ASAHI KASEI MICRODEVICES CORPORATION

Inventor： Edson Gomes CAMARGO ,  Satoshi TAKEHARA

IPC: G01N21/61 ,  H01L31/167 ,  H01L31/0304 ,  G01N21/3504

CPC classification number: G01N21/61 ,  G01N21/0303 ,  G01N21/031 ,  G01N21/3504 ,  G01N2201/062 ,  G01N2201/068 ,  G01N2201/12 ,  H01L31/0304 ,  H01L31/167

Abstract: A small-size reliable gas sensor that can reduce a measurement error can be provided. The gas sensor includes: a first light source (20); a first sensor unit (31) and a second sensor unit (32) disposed to receive light output from the first light source (20); a first substrate (41) having a first principal surface (411) on which the first light source (20) and the first sensor unit (31) are provided; and a second substrate (42) having a first principal surface (422) on which the second sensor unit (32) is provided. The first sensor unit (31) is disposed at a location where light output from the first light source (20) and reflected on the second principal surface (412) strikes the first principal surface (422) of the first substrate (41).

Abstract translation: 可以提供可以减少测量误差的小尺寸可靠的气体传感器。 气体传感器包括：第一光源（20）; 设置为接收从第一光源（20）输出的光的第一传感器单元（31）和第二传感器单元（32）。 具有设置有第一光源（20）和第一传感器单元（31）的第一主面（411）的第一基板（41） 以及具有第一主表面（422）的第二基板（42），所述第二传感器单元（32）设置在所述第一主表面上。 第一传感器单元（31）设置在从第一光源（20）输出并在第二主表面（412）上反射的光照射到第一基板（41）的第一主表面（422）的位置处。