MAGNETRON SPUTTERING METHOD, AND MAGNETRON SPUTTERING APPARATUS
    3.
    发明申请
    MAGNETRON SPUTTERING METHOD, AND MAGNETRON SPUTTERING APPARATUS 审中-公开
    MAGNETRON溅射方法和MAGNETRON SPUTTERING装置

    公开(公告)号:US20110186425A1

    公开(公告)日:2011-08-04

    申请号:US12999985

    申请日:2009-06-17

    IPC分类号: C23C14/35

    摘要: A sputtering method includes disposing a plurality of thin and long deposition regions such that the thin and long deposition regions each cross in a first direction a circular reference region having a diameter equal to that of a semiconductor wafer, and are arranged at predetermined intervals in a second direction perpendicular to the first direction; disposing one of the plurality of thin and long deposition regions such that one side of sides thereof extending in the first direction passes through a substantial center of the circular reference region; disposing another of the plurality of thin and long deposition regions such that one side of sides thereof extending in the first direction passes through a substantial edge of the circular reference region; setting each of widths of the plurality of thin and long deposition regions such that a value obtained by summing the widths of the plurality of thin and long deposition regions in the second direction is substantially equal to a radius of the circular reference region; disposing a plurality of thin and long targets to face the corresponding thin and long deposition regions such that sputtering particles emitted from the plurality of thin and long targets are incident on the corresponding thin and long deposition regions; disposing a semiconductor wafer, while overlapping with the circular reference region; confining a plasma generated by a magnetron discharge in the vicinity of the targets, and emitting the sputtering particles from the targets; and rotating the semiconductor wafer at a predetermined rotation speed by using a normal line passing through the center of the circular reference region as a rotation central axis, to deposit a film on a surface of the semiconductor wafer.

    摘要翻译: 溅射方法包括设置多个薄且长的沉积区域,使得薄且长的沉积区域各自在第一方向上与具有与半导体晶片的直径相等的直径的圆形参考区域交叉,并且以预定间隔布置在 第二方向垂直于第一方向; 设置所述多个薄且长的沉积区域中的一个,使得其沿着所述第一方向延伸的侧面的一侧穿过所述圆形参考区域的大致中心; 设置多个薄且长的沉积区域中的另一个,使得其沿着第一方向延伸的侧面的一侧通过圆形参考区域的实质边缘; 设置多个薄和长沉积区域的宽度,使得通过将第二方向上的多个薄沉积区域和长沉积区域的宽度求和而获得的值基本上等于圆形参考区域的半径; 设置多个薄且长的靶以面对相应的薄和长沉积区域,使得从多个薄且长的靶发射的溅射颗粒入射到相应的薄和长的沉积区域; 在与圆形参考区域重叠的同时设置半导体晶片; 限制在靶附近由磁控管放电产生的等离子体,并从靶中发射溅射粒子; 并且通过使用通过圆形基准区域的中心的法线作为旋转中心轴以预定转速旋转半导体晶片,以在半导体晶片的表面上沉积膜。

    MAGNETRON SPUTTERING APPARATUS
    5.
    发明申请
    MAGNETRON SPUTTERING APPARATUS 审中-公开
    MAGNETRON喷射装置

    公开(公告)号:US20100126848A1

    公开(公告)日:2010-05-27

    申请号:US12089331

    申请日:2006-10-06

    IPC分类号: C23C14/35

    摘要: A magnetron sputtering apparatus is provided whereby film formation speed can be improved by increasing instantaneous erosion density on a target, and the target life can be prolonged by moving an erosion region over time to prevent local wear of the target, and realize uniform wear. Multiple plate-like magnets are installed around a columnar rotating shaft, and the columnar rotating shaft is rotated, thereby forming a high-density erosion region on a target to increase film formation speed, and the erosion region is moved along with rotation of the columnar rotating shaft, thereby wearing the target uniformly.

    摘要翻译: 提供一种磁控溅射装置,通过增加目标上的瞬时侵蚀密度可以提高成膜速度,通过随时间移动侵蚀区域可以延长目标寿命,以防止目标局部磨损,并实现均匀的磨损。 多个板状磁铁安装在柱状旋转轴的周围,柱状旋转轴旋转,从而在靶上形成高密度的侵蚀区域,以增加成膜速度,并且随着柱状体的旋转而使侵蚀区域移动 旋转轴,从而均匀地佩戴目标。

    MAGNETRON SPUTTERING APPARATUS
    6.
    发明申请
    MAGNETRON SPUTTERING APPARATUS 有权
    MAGNETRON喷射装置

    公开(公告)号:US20100059368A1

    公开(公告)日:2010-03-11

    申请号:US12594676

    申请日:2008-04-04

    IPC分类号: C23C14/35

    摘要: Provided is a magnetron sputtering apparatus that increases an instantaneous plasma density on a target to improve a film forming rate. The magnetron sputtering apparatus includes a substrate to be processed, a target installed to face the substrate and a rotary magnet installed at a side opposite to the substrate across the target. In the magnetron sputtering apparatus, plasma loops are formed on a target surface. The plasma loops are generated, move and disappear in an axis direction of the rotary magnet according to a rotation of the rotary magnet.

    摘要翻译: 提供了一种磁控溅射装置,其增加靶上的瞬时等离子体密度以提高成膜速率。 磁控管溅射装置包括待加工的基板,安装成面向基板的靶材和安装在穿过靶材的基板相对侧的旋转磁体。 在磁控管溅射装置中,在目标表面上形成等离子体回路。 根据旋转磁体的旋转,等离子体回路产生,移动并沿旋转磁体的轴线方向消失。

    Camera
    10.
    外观设计
    Camera 失效

    公开(公告)号:USD304596S

    公开(公告)日:1989-11-14

    申请号:US935570

    申请日:1986-11-26

    申请人: Tetsuya Goto

    设计人: Tetsuya Goto