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公开(公告)号：US10656012B2
公开(公告)日：2020-05-19
申请号：US16229355
申请日：2018-12-21
IPC分类号： G01J3/44 , G01J3/02 , G01J3/10 , G01J3/28 , G01J3/18 , G01N21/65 , G01J1/42 , G01J3/433 , G02B6/293
摘要： In swept source Raman (SSR) spectroscopy, a swept laser beam illuminates a sample, which inelastically scatters some of the incident light. This inelastically scattered light is shifted in wavelength by an amount called the Raman shift. The Raman-shifted light can be measured with a fixed spectrally selective filter and a detector. The Raman spectrum can be obtained by sweeping the wavelength of the excitation source and, therefore, the Raman shift. The resolution of the Raman spectrum is determined by the filter bandwidth and the frequency resolution of the swept source. An SSR spectrometer can be smaller, more sensitive, and less expensive than a conventional Raman spectrometer because it uses a tunable laser and a fixed filter instead of free-space propagation for spectral separation. Its sensitivity depends on the size of the collection optics. And it can use a nonlinearly swept laser beam thanks to a wavemeter that measures the beam's absolute wavelength during Raman spectrum acquisition.
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2.发明授权High performance CCD-based thermoreflectance imaging using stochastic resonance 失效使用随机共振的高性能CCD基热反射成像公开(公告)号：US07429735B2
公开(公告)日：2008-09-30
申请号：US11376722
申请日：2006-03-15
IPC分类号： G01N21/17
CPC分类号： G01J5/0003 , G01K11/125 , G01N21/1717 , G01N21/55 , G01N25/18 , G01N2021/1731
摘要： The invention is directed to systems and methods of digital signal processing and in particular to systems and methods for measurements of thermoreflectance signals, even when they are smaller than the code width of a digital detector used for detection. For example, in some embodiments, the number of measurements done is selected to be sufficiently large so as to obtain an uncertainty less than the code width of the detector. This allows for obtaining images having an enhanced temperature resolution. The invention is also directed to methods for predicting the uncertainty in measurement of the signal based on one or more noise variables associated with the detection process and the number of measurement iterations.
摘要翻译： 本发明涉及数字信号处理的系统和方法，特别涉及用于测量热反射信号的系统和方法，即使它们小于用于检测的数字检测器的代码宽度。 例如，在一些实施例中，完成的测量数量被选择为足够大，以便获得小于检测器的代码宽度的不确定性。 这允许获得具有增强的温度分辨率的图像。 本发明还涉及用于基于与检测过程相关联的一个或多个噪声变量和测量迭代次数来预测信号测量的不确定性的方法。
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公开(公告)号：US06921195B2
公开(公告)日：2005-07-26
申请号：US10365101
申请日：2003-02-12
申请人： Kevin P. Pipe , Rajeev J. Ram
发明人： Kevin P. Pipe , Rajeev J. Ram
摘要： A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
摘要翻译： 提出了一种用于执行设备表征的方法和装置。 通过在器件的第一位置获得第一温度测量值，获得第二温度测量值，计算温度测量值之间的差值，并使用温度和/或温度差异来确定器件的特性来确定器件的特性 设备确定。
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公开(公告)号：US06834134B2
公开(公告)日：2004-12-21
申请号：US09816937
申请日：2001-03-23
申请人： James F. Brennan, III , Patrick C. Chou , Harry L. T. Lee , Rajeev J. Ram , Hermann A. Haus , Erich P. Ippen
发明人： James F. Brennan, III , Patrick C. Chou , Harry L. T. Lee , Rajeev J. Ram , Hermann A. Haus , Erich P. Ippen
IPC分类号： G02B634
CPC分类号： H01S5/0622 , G02B6/2932 , H01S5/1212 , H01S5/146
摘要： A method and apparatus are provided for generating short (e.g., picosecond) pulses using a 2 section 1553 nm DBR laser without gain switching nor external modulation. The center wavelength of the DBR section is modulated at 0.5 GHz to generate a constant amplitude frequency modulated optical wave Large group velocity dispersion is then applied with a chirped fiber Bragg grating to convert the FM signal to a pulse stream.
摘要翻译： 提供了一种使用2部分1553nm DBR激光器在没有增益切换或外部调制的情况下产生短（例如，皮秒）脉冲的方法和装置。 DBR部分的中心波长被调制在0.5GHz，以产生恒定幅度的调频光波，然后用啁啾光纤布拉格光栅施加大群速度色散，以将FM信号转换成脉冲流。
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公开(公告)号：US20210389612A1
公开(公告)日：2021-12-16
申请号：US17227457
申请日：2021-04-12
申请人： Rajeev J. Ram , Marc De Cea Falco , Jin Xue
发明人： Rajeev J. Ram , Marc De Cea Falco , Jin Xue
摘要： Semiconductor optical modulators are described that utilize bipolar junction transistor (BJT) structure within the optical modulator. The junctions within the BJT can be designed and biased to increase modulator efficiency and speed. An optical mode may be located in a selected region of the BJT structure to improve modulation efficiency. The BJT structure can be included in optical waveguides of interferometers and resonators to form optical modulators.
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公开(公告)号：US08408786B2
公开(公告)日：2013-04-02
申请号：US12115201
申请日：2008-05-05
CPC分类号： G01K11/125
摘要： In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.
摘要翻译： 一方面，本发明提供了用于光子器件和/或电路的光学表征的技术和装置。 作为示例，这些技术可用于识别光子集成电路中的损坏设备。 在一些实施例中，热成像被用作诊断工具，用于表征所研究的装置/电路。 例如，在一个实施例中，可以使用来自一个放大器的放大的自发发射作为热调制输入到另一个放大器来表征集成级联半导体放大器。 第二放大器的反射反射图像可以显示缺陷（如果存在）。 此外，在一些实施例中，可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。
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公开(公告)号：US07249881B2
公开(公告)日：2007-07-31
申请号：US11119093
申请日：2005-04-29
申请人： Kevin P. Pipe , Rajeev J. Ram
发明人： Kevin P. Pipe , Rajeev J. Ram
摘要： A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
摘要翻译： 提出了一种用于执行设备表征的方法和装置。 通过在器件的第一位置获得第一温度测量值，获得第二温度测量值，计算温度测量值之间的差值，并使用温度和/或温度差异来确定器件的特性来确定器件的特性 设备确定。
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8.发明授权公开(公告)号：US07130494B2
公开(公告)日：2006-10-31
申请号：US10748358
申请日：2003-12-30
申请人： Rajeev J. Ram , Tauhid Zaman , Xiaoyun Guo
发明人： Rajeev J. Ram , Tauhid Zaman , Xiaoyun Guo
CPC分类号： G02F1/0955 , G02B6/2746 , G02B2006/12157 , G02F1/0036 , G02F2202/101 , G02F2202/102 , G02F2203/15
摘要： A magneto-optical device includes a waveguide structure that has at least one cladding region and core region. The cladding region and core region comprise semiconductor alloy materials. Either the at least one cladding region or the core region is doped with ferromagnetic materials so as to increase the magneto-optical activity of the device.
摘要翻译： 磁光装置包括具有至少一个包层区域和芯区域的波导结构。 包层区域和芯区域包括半导体合金材料。 所述至少一个包覆区域或芯区域中的任一个都掺杂有铁磁材料，以增加该器件的磁光活性。
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公开(公告)号：US06587492B2
公开(公告)日：2003-07-01
申请号：US09797188
申请日：2001-03-01
申请人： Steven G. Patterson , Rajeev J. Ram
发明人： Steven G. Patterson , Rajeev J. Ram
IPC分类号： H01S500
CPC分类号： B82Y20/00 , H01S5/2004 , H01S5/3095 , H01S5/34 , H01S5/4043 , H01S5/423
摘要： A bipolar cascade-ARROW laser includes a plurality of core regions, at least one spacer disposed between each the plurality of core regions with each of the at least one spacers provided from a material having an index of refraction which is higher than an index of refraction of a material from which the core regions are provided. The bipolar cascade-ARROW laser further includes an anti-reflector disposed against each of the outermost ones of the core regions and at least one quantum well disposed in each of the plurality of core regions.
摘要翻译： 双极性级联-ARROW激光器包括多个芯区域，至少一个间隔物设置在每个多个芯区域之间，其中至少一个间隔物中的每一个由具有高于折射率的折射率的材料提供 提供芯区域的材料。 双极级联-ARROW激光器还包括针对核心区域中的最外侧核心区域中的每一个设置的反射器和设置在多个核心区域中的每一个中的至少一个量子阱。
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公开(公告)号：US20090245322A1
公开(公告)日：2009-10-01
申请号：US12115201
申请日：2008-05-05
IPC分类号： G01N25/00
CPC分类号： G01K11/125
摘要： In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.
摘要翻译： 一方面，本发明提供了用于光子器件和/或电路的光学表征的技术和装置。 作为示例，这些技术可用于识别光子集成电路中的损坏设备。 在一些实施例中，热成像被用作诊断工具，用于表征所研究的装置/电路。 例如，在一个实施例中，可以使用来自一个放大器的放大的自发发射作为热调制输入到另一个放大器来表征集成级联半导体放大器。 第二放大器的反射反射图像可以显示缺陷（如果存在）。 此外，在一些实施例中，可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。
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