CVD plasma reactor
    5.
    发明授权
    CVD plasma reactor 失效
    CVD等离子体反应器

    公开(公告)号:US4632057A

    公开(公告)日:1986-12-30

    申请号:US762231

    申请日:1985-08-05

    CPC分类号: C23C16/5096 C23C16/481

    摘要: Chemical vapor deposition on a semiconductor wafer is obtained in a plasma reactor having a plurality of lamps for radiantly heating the wafer. Calibrated temperature sensing means remote from the wafer is used to control the heating of the wafer. Gases are supplied by way of a plurality of tubes extending radially inwardly from the sides of the chamber. A baffle is provided to form an antechamber which aids in the uniformity of the deposition. The plasma is ignited for less than the whole deposition cycle for deposition of tungsten disilicide.

    摘要翻译: 在具有用于辐射加热晶片的多个灯的等离子体反应器中获得在半导体晶片上的化学气相沉积。 使用远离晶片的校准温度感测装置来控制晶片的加热。 气体通过从腔室的侧面径向向内延伸的多个管道供给。 提供挡板以形成有助于沉积的均匀性的前室。 等离子体点火少于整个沉积循环以沉积二硅化钨。

    Tungsten disilicide CVD
    8.
    发明授权
    Tungsten disilicide CVD 失效
    二硅化钨CVD

    公开(公告)号:US4966869A

    公开(公告)日:1990-10-30

    申请号:US519538

    申请日:1990-05-04

    摘要: Tungsten disilicide (WSi.sub.x) films are deposited onto doped or undoped polysilicon by reducing WF.sub.6 with a mixture of dichlorosilane (SiH.sub.2 Cl.sub.2) and disilane (Si.sub.2 H.sub.6). The addition of disilane provides a mechanism for increasing the resistivity (silicon to tungsten ratio) of the film without adversely affecting the uniformity or deposition rate of the film. A high silicon to tungsten ratio prevents degradation of the silicide film and the underlaying polysilicon film during subsequent growth of an oxide (SiO.sub.2) dielectric. The excess silicon in the film also provides desirable etching and annealing characteristics.

    摘要翻译: 通过用二氯硅烷(SiH 2 Cl 2)和乙硅烷(Si 2 H 6)的混合物还原WF 6,将二硅化钨(WSix)膜沉积到掺杂或未掺杂的多晶硅上。 添加乙硅烷提供了提高膜的电阻率(硅与钨比)的机理,而不会不利地影响膜的均匀性或沉积速率。 高硅比可以防止在氧化物(SiO 2)电介质的后续生长期间硅化物膜和底层多晶硅膜的劣化。 膜中的多余的硅还提供了理想的蚀刻和退火特性。

    Plasma enhanced thermal treatment apparatus
    9.
    发明授权
    Plasma enhanced thermal treatment apparatus 失效
    等离子体增强热处理装置

    公开(公告)号:US4870245A

    公开(公告)日:1989-09-26

    申请号:US718751

    申请日:1985-04-01

    IPC分类号: H01J37/32

    摘要: Apparatus for the nitridiation of a silicon-bearing substrate is disclosed. The apparatus includes a double walled reaction vessel having first and second concentric walls bounding a reaction volume. Temperature of the reaction volume is controlled by resistance heaters located outside the outermost of the two concentric tubes. Plasma electrodes are positioned about the reaction volume and between the two concentric tubes. The ambient between the two tubes is controlled to protect the electrodes from oxidation at the high temperatures to which they are exposed. An rf generator is coupled to the plasma electrodes and is controllable independently from the resistance heaters.

    摘要翻译: 公开了一种用于氮化含硅衬底的装置。 该装置包括具有界定反应体积的第一和第二同心壁的双壁反应容器。 反应体积的温度由位于两个同心管最外面的电阻加热器控制。 等离子体电极围绕反应体积和两个同心管之间定位。 控制两个管之间的环境以保护电极在它们暴露的高温下免于氧化。 rf发生器耦合到等离子体电极并且可独立于电阻加热器控制。