RANK-MODULATION REWRITING CODES FOR FLASH MEMORIES
    1.
    发明申请
    RANK-MODULATION REWRITING CODES FOR FLASH MEMORIES 有权
    用于闪存存储器的排序调试代码

    公开(公告)号:US20150324253A1

    公开(公告)日:2015-11-12

    申请号:US14728749

    申请日:2015-06-02

    IPC分类号: G06F11/10 G11C29/52 G11C16/34

    摘要: Rank modulation has been recently proposed as a scheme for storing information in flash memories. Three improved aspects are disclosed. In one aspect the minimum push-up scheme, for storing data in flash memories is provided. It aims at minimizing the cost of changing the state of the memory. In another aspect, multi-cells, used for storing data in flash memories is provided. Each transistor is replaced with a multi-cell of mm transistors connected in parallel. In yet another aspect, multi-permutations, are provided. The paradigm of representing information with permutations is generalized to the case where the number of cells in each level is a constant greater than one. In yet another aspect, rank-modulation rewriting schemes which take advantage of polar codes, are provided for use with flash memory.

    摘要翻译: 近来已经提出了等级调制作为用于将信息存储在闪速存储器中的方案。 公开了三个改进的方面。 在一个方面,提供了用于将数据存储在闪速存储器中的最小上推方案。 它旨在最大限度地减少改变记忆状态的成本。 在另一方面,提供了用于将数据存储在闪存中的多单元。 每个晶体管被并联连接的mm晶体管的多单元电池代替。 在另一方面,提供了多重排列。 代表具有置换的信息的范例被推广到每个级别中的单元的数量是大于1的常数的情况。 在另一方面,提供利用极性码的秩调制重写方案用于闪速存储器。

    NAND FLASH RELIABILITY WITH RANK MODULATION
    7.
    发明申请
    NAND FLASH RELIABILITY WITH RANK MODULATION 有权
    NAND FLASH可靠性与RANK调制

    公开(公告)号:US20160170672A1

    公开(公告)日:2016-06-16

    申请号:US14965869

    申请日:2015-12-10

    IPC分类号: G06F3/06

    摘要: The reliability of NAND flash memory decreases rapidly as density increases, preventing the wide adoptions of flash-based storage systems. A novel data representation scheme named rank modulation (RM) is discussed for improving NAND flash reliability. RM encodes data using the relative orders of memory cell voltages, which is inherently resilient to asymmetric errors. For studying the effectiveness of RM in flash, RM is adapted to make it simple to implement with existing flash memories. The implementation is evaluated under different types of noise of 20 nm flash memory. Results show that RM offers significantly lower cell error rates compared to the current data representation in flash at typical P/E cycles. RM is applied to flash-based archival storage and shows that RM brings up to six times longer data retention time for 16 nm flash memory.

    摘要翻译: 随着密度的增加,NAND闪存的可靠性迅速下降,从而阻止了基于闪存的存储系统的广泛采用。 讨论了一种名为秩调制(RM)的新型数据表示方案,用于提高NAND闪存可靠性。 RM使用存储单元电压的相对次序对数据进行编码,这本身就适用于非对称误差。 为了研究RM在闪存中的有效性,RM适用于使用现有闪存实现简单。 在20nm闪存的不同类型的噪声下评估实现。 结果表明,与典型市盈率周期中闪存中的当前数据表示相比,RM提供了显着更低的单元错误率。 RM适用于基于闪存的存档,并显示RM为16nm闪存提供高达六倍的数据保留时间。

    FLASH MEMORIES USING MINIMUM PUSH UP, MULTI-CELL AND MULTI-PERMUTATION SCHEMES FOR DATA STORAGE
    8.
    发明申请
    FLASH MEMORIES USING MINIMUM PUSH UP, MULTI-CELL AND MULTI-PERMUTATION SCHEMES FOR DATA STORAGE 有权
    使用最小推送,数据存储的多细胞和多变数方案的闪存记忆

    公开(公告)号:US20130268723A1

    公开(公告)日:2013-10-10

    申请号:US13791856

    申请日:2013-03-08

    IPC分类号: G11C16/04 G06F12/02

    摘要: Rank modulation has been recently proposed as a scheme for storing information in flash memories. Three improved aspects are disclosed. In one aspect the minimum push-up scheme, for storing data in flash memories is provided. It aims at minimizing the cost of changing the state of the memory. In another aspect, multi-cells, used for storing data in flash memories is provided. Each transistor is replaced with a multi-cell of mm transistors connected in parallel. In yet another aspect, multi-permutations, are provided. The paradigm of representing information with permutations is generalized to the case where the number of cells in each level is a constant greater than one.

    摘要翻译: 近来已经提出了等级调制作为用于将信息存储在闪速存储器中的方案。 公开了三个改进的方面。 在一个方面,提供了用于将数据存储在闪速存储器中的最小上推方案。 它旨在最大限度地减少改变记忆状态的成本。 在另一方面,提供了用于将数据存储在闪存中的多单元。 每个晶体管被并联连接的mm晶体管的多单元电池代替。 在另一方面,提供了多重排列。 代表具有置换的信息的范例被推广到每个级别中的单元的数量是大于1的常数的情况。