Damping and muffling structure for EL cell
    4.
    发明申请
    Damping and muffling structure for EL cell 审中-公开
    EL电池的阻尼和消音结构

    公开(公告)号:US20050012693A1

    公开(公告)日:2005-01-20

    申请号:US10621421

    申请日:2003-07-18

    IPC分类号: G09G3/30

    CPC分类号: H05B33/22

    摘要: Damping and muffling structure for EL cell includes a transparent substrate, a front electrode layer and a lighting layer. The front electrode layer and lighting layer are sequentially overlaid on the substrate. An inducing layer and at least one conductive layer are laid on the lighting layer. A back electrode layer is laid on the inducing layer. The conductive layer is laid on the lighting layer in such a position as not to affect light emitting of the lighting region. The conductive layer is also laid on at least one side between both the lighting layer and the inducing layer and connected with the back electrode layer to electrically connect the inducing layer with the back electrode layer. The back electrode layer is connected to a grounding electrode, whereby the conductive layer can quickly remove the charge accumulating on the inducing layer.

    摘要翻译: 用于EL电池的阻尼和消音结构包括透明基板,前电极层和照明层。 前电极层和发光层顺序地覆盖在基板上。 诱导层和至少一个导电层铺设在照明层上。 背面电极层铺设在诱导层上。 导电层在不影响照明区域的发光的位置上被放置在照明层上。 导电层也被放置在发光层和感应层之间的至少一个侧面上,并与背面电极层连接,以将感应层与背面电极层电连接。 背面电极层连接到接地电极,由此导电层可以快速去除累积在感应层上的电荷。

    Thin film probe card
    5.
    发明申请
    Thin film probe card 失效
    薄膜探针卡

    公开(公告)号:US20070108999A1

    公开(公告)日:2007-05-17

    申请号:US11595943

    申请日:2006-11-13

    IPC分类号: G01R31/02

    CPC分类号: G01R31/2889 G09G3/006

    摘要: A thin film probe card includes a plate and a plurality of wires on the plate, each of which is electrically connected with at least a thin film probe. A plurality of elastic members are provided between the probes, which absorbs the force of the probes in the test to protect the probes from wear and extend the product life of the probe card.

    摘要翻译: 薄膜探针卡包括板和板上的多根电线,每根电线与至少一个薄膜探针电连接。 在探针之间设置有多个弹性构件,其在测试中吸收探针的力以保护探针免受磨损并延长探针卡的产品寿命。

    Thin film probe card
    6.
    发明授权
    Thin film probe card 失效
    薄膜探针卡

    公开(公告)号:US07573277B2

    公开(公告)日:2009-08-11

    申请号:US11595943

    申请日:2006-11-13

    IPC分类号: G01R31/02

    CPC分类号: G01R31/2889 G09G3/006

    摘要: A thin film probe card includes a plate and a plurality of wires on the plate, each of which is electrically connected with at least a thin film probe. A plurality of elastic members are provided between the probes, which absorbs the force of the probes in the test to protect the probes from wear and extend the product life of the probe card.

    摘要翻译: 薄膜探针卡包括板和板上的多根电线,每根电线与至少一个薄膜探针电连接。 在探针之间设置有多个弹性构件,其在测试中吸收探针的力以保护探针免受磨损并延长探针卡的产品寿命。