Vapor phase chemical infiltration process of a material into a porous
substrate at controlled surface temperature
    2.
    发明授权
    Vapor phase chemical infiltration process of a material into a porous substrate at controlled surface temperature 失效
    将材料的气相化学渗透过程控制在表面温度下进入多孔基材

    公开(公告)号:US5652030A

    公开(公告)日:1997-07-29

    申请号:US635933

    申请日:1996-04-25

    摘要: The substrate (10) is placed in an enclosure (12) and is heated so as to establish therein a temperature gradient such that the substrate has a higher temperature in portions that are remote from its exposed surfaces than at its exposed surfaces. A reaction gas constituting a precursor for the material to be infiltrated is admitted into the enclosure, with formation of the material being enhanced in those portions of the substrate that are at higher temperature. At the beginning of the infiltration process, and at least during the major portion thereof, substrate heating is controlled in such a manner as to maintain the temperature of its exposed surfaces at a value that is no greater than the minimum temperature for the reaction gas to deposit the material that is to be infiltrated, while portions of the substrate that are remote from its exposed surfaces are at a temperature that is greater than the minimum temperature for deposition.

    摘要翻译: PCT No.PCT / FR94 / 01090 Sec。 371日期:1996年4月25日 102(e)日期1996年4月25日PCT 1994年9月20日PCT公布。 公开号WO95 / 11868 日期1995年5月4日将衬底(10)放置在外壳(12)中并被加热以便在其中建立温度梯度,使得衬底在远离其暴露表面的部分中比在其暴露表面处具有更高的温度 。 构成待渗透材料的前体的反应气体被允许进入外壳,在衬底的处于较高温度的部分中材料的形成被增强。 在渗透过程开始时,并且至少在其主要部分期间,基板加热被控制为将其暴露表面的温度保持在不大于反应气体的最低温度的值 沉积要渗透的材料,而远离其暴露表面的基底的部分处于大于沉积最低温度的温度。

    Method of densifying porous substrates by chemical vapor infiltration of
silicon carbide
    8.
    发明授权
    Method of densifying porous substrates by chemical vapor infiltration of silicon carbide 失效
    通过化学气相渗透碳化硅致密化多孔基材的方法

    公开(公告)号:US5738908A

    公开(公告)日:1998-04-14

    申请号:US656347

    申请日:1996-06-14

    摘要: A reaction gas containing methyltrichlorosilane (MTS) and hydrogen is injected into the infiltration chamber (30) in which the substrate is placed and where predetermined infiltration temperature and pressure conditions obtain. The gas entering the infiltration chamber is preheated (by plates 46) so as to bring it up to temperature before coming into contact with the substrate. The residual gas containing the remainder of the reaction gas together with gaseous reaction products is extracted from the chamber. Infiltration is performed at a temperature lying in the range 960.degree. C. to 1050.degree. C., and preferably in the range 1000.degree. C. to 1030.degree. C., under a total pressure of not more than 25 kPa, and preferably equal to 7 kPa to 12 kPa, and the concentration of silicon-containing species in the residual gas is lowered at the outlet from the infiltration chamber, e.g. by injecting an inert gas (via 70).

    摘要翻译: PCT No.PCT / FR94 / 01453第 371日期1996年6月14日第 102(e)1996年6月14日PCT 1994年12月13日PCT PCT。 WO95 / 16803 PCT出版物 日期:1995年6月22日将含有甲基三氯硅烷(MTS)和氢的反应气体注入到其中放置基材的浸渗室(30)中并且获得预定的渗透温度和压力条件。 进入渗透室的气体被预热(通过板46),以便在与基底接触之前使其达到温度。 将含有剩余反应气体的残余气体与气体反应产物一起从室中提取出来。 渗透在960℃至1050℃的温度下进行,优选在1000℃至1030℃的范围内,总压力不超过25kPa,优选等于 7kPa至12kPa,并且残留气体中的含硅物质的浓度在渗透室的出口处降低,例如 通过注入惰性气体(通孔70)。