摘要:
A synchronous semiconductor memory device includes an output control signal generating circuit that generates a data output control signal in response to an internal clock signal, an output control clock signal and a CAS latency signal. The output control signal generating circuit successively shifts read information signals in response to the internal clock signal and the output control clock signal, both source clocks of which are identical, and generates one of the shifted read information signals as an output control signal for indicating a data output period in response to the CAS latency signal. The synchronous semiconductor memory device can synchronize the source clocks of the clock signals used in the output control signal generating circuit thereby reducing the influence of clock jitter.
摘要:
A delay locked loop (DLL) is provided that includes a phase detector configured to detect a phase error between an internal clock signal and the external clock signal and output a phase error signal. A low pass filter is configured to output a predetermined control signal in response to the phase error signal. A variable delay circuit is configured to change a delay time in response to the predetermined control signal, delay the phase of the external clock signal with respect to the changed delay time, lock the delayed external clock signal and output the internal clock signal. A compensation delay circuit is configured to receive a control voltage based on a delay time introduced by a data output circuit and delay a phase of the internal clock signal for a first delay time based on the control voltage and output the delayed internal clock signal to the phase detector. Methods of compensating a delay for a DLL are also provided.
摘要:
A circuit for generating a write data mask signal in a synchronous semiconductor memory device includes an output unit and a reset control unit. The output unit controls a write data mask operation of the synchronous semiconductor memory device, latches a write data mask signal, and outputs an internal write data mask signal, in response to an internal clock signal. The reset control unit generates a reset signal for resetting the internal write data mask signal, in response to a write column disable signal indicating an activation end point of a column selection line signal generated when a write operation including the write data mask operation is performed. While the synchronous semiconductor memory device performs a gapless write data mask operation included in a gapless write operation, the reset signal is deactivated so that the write data mask signal is not reset.
摘要:
Integrated circuit devices having signal buffers therein include first and second storage devices that are electrically coupled in series and configured so that data can be loaded into the first storage device in-sync with a first clock signal (e.g., external clock signal) and then passed and loaded into the second storage device in-sync with a second clock signal (e.g., internal clock signal). The second clock signal is derived from the first clock signal and may be a delayed version of the first clock signal having an equivalent duty cycle. The buffer also comprises an integrated circuit that operates synchronously with the second clock signal and a transfer device that passes an output of the second storage device to the integrated circuit in-sync with the second clock signal. In this manner, data can be loaded into the integrated circuit in-sync with the same clock signal used to control the integrated circuit even though the data is originally transferred in-sync with another clock signal.
摘要:
A circuit for generating a write data mask signal in a synchronous semiconductor memory device includes an output unit and a reset control unit. The output unit controls a write data mask operation of the synchronous semiconductor memory device, latches a write data mask signal, and outputs an internal write data mask signal, in response to an internal clock signal. The reset control unit generates a reset signal for resetting the internal write data mask signal, in response to a write column disable signal indicating an activation end point of a column selection line signal generated when a write operation including the write data mask operation is performed. While the synchronous semiconductor memory device performs a gapless write data mask operation included in a gapless write operation, the reset signal is deactivated so that the write data mask signal is not reset.
摘要:
An output control signal generating circuit in a synchronous semiconductor memory device preferably comprises 1) a plurality of selectable clock signal transfer circuits for selectively delaying an applied clock signal in order to generate an output control clock signal in response to a predetermined CAS latency signal, wherein each one of the plurality of selectable clock signal transfer circuits inserts one or more time delays into the output control clock signal, 2) a sampling circuit for generating a plurality of output signals from a read master signal, and 3) a selection circuit for selecting one of plurality of output signals, thereby indicating a valid data output time interval. A method for operating the output control signal generating circuit causes a clock signal to be delayed by a selectable number of additional clock cycles, thereby insuring the outputting of a data signal only at a time when the data is valid.
摘要:
Integrated circuit memory devices according to the present invention include a current sense amplifier having first and second cross-coupled sensing transistors. First and second data lines are electrically coupled to the source of the first sensing transistor and the source of the second sensing transistor, respectively. The current sense amplifier includes a first load transistor that has a source electrically connected to a drain of the first sensing transistor and a gate of the second sensing transistor and a second load transistor is included that has a source electrically connected to a drain of the second sensing transistor and a gate of the first sensing transistor. A switching transistor is responsive to an enable signal and has a source electrically coupled to a drain of the first load transistor and a drain of said second load transistor. A first load circuit provides a variable impedance across the source and the drain of the first load transistor in response to at least a first sense signal.
摘要:
A semiconductor memory device includes a plurality of memory cell blocks including a first memory cell block having bit lines, an edge sense amplifier block including edge sense amplifiers coupled to a portion of the bit lines of the first memory cell block, and a balancing capacitor unit coupled to the edge sense amplifiers.
摘要:
An output control signal generating circuit in a synchronous semiconductor memory device preferably comprises 1) a plurality of selectable clock signal transfer circuits for selectively delaying an applied clock signal in order to generate an output control clock signal in response to a predetermined CAS latency signal, wherein each one of the plurality of selectable clock signal transfer circuits inserts one or more time delays into the output control clock signal, 2) a sampling circuit for generating a plurality of output signals from a read master signal, and 3) a selection circuit for selecting one of plurality of output signals, thereby indicating a valid data output time interval. A method for operating the output control signal generating circuit causes a clock signal to be delayed by a selectable number of additional clock cycles, thereby insuring the outputting of a data signal only at a time when the data is valid.