摘要:
In a device and method for processing and presenting x-ray images, an x-ray image of a subject is acquired with an x-ray acquisition cone simultaneously with the acquisition of an optical exposure of the examination subject with an optical acquisition cone that is congruent with the x-ray acquisition cone. The subject in the optical exposure is subjected to segmentation and/or edge extraction, and the extracted optical exposure and the x-ray image are additively combined so that the subject edges from the optical exposure are inserted into the x-ray image.
摘要:
In a device and method for processing and presenting x-ray images, an x-ray image of a subject is acquired with an x-ray acquisition cone simultaneously with the acquisition of an optical exposure of the examination subject with an optical acquisition cone that is congruent with the x-ray acquisition cone. The subject in the optical exposure is subjected to segmentation and/or edge extraction, and the extracted optical exposure and the x-ray image are additively combined so that the subject edges from the optical exposure are inserted into the x-ray image.
摘要:
A swivel-arm with a gripper in a wire-processing machine transfers a processed wire to a collection tray. The collection tray and an unloading tray have a channel-like shape. The swivel-arm swivels the processed, trailing wire-end over the collection tray, whereby the wire, with the aid of the conveyor belt that runs in the direction of the arrow, falls into the collection tray. The collection tray serves as temporary store and collects a specified number of completed processed wires that corresponds to a production lot, and transfers the production lot to the unloading tray.
摘要:
In a device for tissue extraction from a breast, a needle mount accommodating a biopsy needle can be placed by a connection element such that no regions of the breast that are to be examined by x-rays are occluded by parts of the device during an x-ray image acquisition.
摘要:
A method and device for testing the tensile stress in tension elements of a tension element cord utilizes a measuring gage which is clamped between two tension elements of the tension element cord. The gage establishes a reference point relative to a fixed point stationary with respect to the tension element cord. The gage extends horizontally between two vertically extending length portions of the two tension elements. Then it is determined whether the reference point of the measuring gage is shifted with respect to the fixed point in the horizontal direction, wherein such a shift is dependent on a difference in the tension stresses in the two tension elements.
摘要:
In an imaging system having a number of subsystems and a control device that controls the subsystems in a coordinated manner to implement a measurement sequence and an operating method therefor, sequence control data that define different functional sub-sequences of the measurement sequence are transmitted to the control device. Different active volumes are associated with the functional sub-sequences. In addition to the sequence control data, active volume position data are provided to the control device that define bearing and extent of the active volumes associated with the different functional sub-sequences. Control signals to implement the measurement sequence for the different subsystems are generated automatically by the control device based on the sequence control data and the active volume position data so that the individual functional sub-sequences are locally optimized at least with regard to a sub-region of their associated active volume.
摘要:
An elevator drive for driving and holding an elevator car includes a traction wheel providing a driving and a holding force to the elevator car, a motor driving the traction wheel, a braking arrangement for holding the traction wheel, and a drive shaft connecting the traction wheel, the motor and the braking arrangement together. The braking arrangement includes at least two braking devices arranged, on opposite sides of the traction wheel on the drive shaft. A monitoring logic system ascertains whether an activated one of the braking devices alone can maintain the elevator car at standstill during a brief time the other of the one of the braking devices is released for issuing fault information to an elevator control.
摘要:
Damaged surface areas of low-k dielectric materials may be efficiently repaired by avoiding the saturation of dangling silicon bonds after a reactive plasma treatment on the basis of OH groups, as is typically applied in conventional process strategies. The saturation of the dangling bond may be accomplished by directly initiating a chemical reaction with appropriate organic species, thereby providing superior reaction conditions, which in turn results in a more efficient restoration of the dielectric characteristics.
摘要:
By using powerful data analysis techniques, such as PCR, PLS, CLS and the like, in combination with measurement techniques providing structural information, gradually varying material characteristics may be determined during semiconductor fabrication, thereby also enabling the monitoring of complex manufacturing sequences. For instance, the material characteristics of sensitive dielectric materials, such as ULK material, may be detected, for instance with respect to an extension of a damage zone, in order to monitor the quality of metallization systems of sophisticated semiconductor devices. The inline measurement data may be obtained on the basis of infrared spectroscopy, for instance using FTIR and the like, which may even allow directly obtaining the measurement data at process chambers, substantially without affecting the overall process throughput.
摘要:
During the patterning of via openings in sophisticated metallization systems of semiconductor devices, the opening may extend through a conductive cap layer and an appropriate ion bombardment may be established to redistribute material of the underlying metal region to exposed sidewall portions of the conductive cap layer, thereby establishing a protective material. Consequently, in a subsequent wet chemical etch process, the probability for undue material removal of the conductive cap layer may be greatly reduced.