摘要:
Multistage configuration and power setting for a processor includes an on-die configuration signal fuse block programmed during manufacturing, configuration signal Control and I/O circuitry, a configuration change control signal output indicating when the configuration signals are going to change, and voltage regulators and clock generators that rely on the configuration change control signal to begin the system configuration change and boot sequences. The processor actively drives its configuration signal states. Multistage configuration and power setting also enables the processor to change its configuration states during operation.
摘要:
A dynamic processor configuration and power-up programs a processor's fuse block with configuration signals during processor manufacturing. The processor configuration signals include a core voltage identifier and a system bus frequency identifier. When power is applied to the platform, a control signal is used to prevent power-up of the platform's processor related circuitry. While the platform awaits full power-up, the fuse block is powered up. When the fuse block is powered up, the control signal is used to allow the configuration signals to be read from the fuse block. The processor is configured with core voltage and system bus frequency based on the values read from the fuse block. The platform then performs its boot-up sequence.
摘要:
An apparatus, a method, and a system for a fuse cell array are disclosed herein. A plurality of fuse cells are arranged in an array. One or more fuse cells include a pair of fuse devices to output a pair of voltages, respectively, wherein the pair of fuse devices are redundantly programmed. A sense amplifier is coupled to the plurality of fuse cells to read the pair of voltage outputs from each of the plurality of fuse cells, respectively. A comparator circuit is coupled to the sense amplifier to compare the pair of voltage outputs for each of the plurality of fuse cells and to output the compared result.
摘要:
A driver/receiver circuit for use at one end of a simultaneous bi-directional differential signal line while being driven at the other end by a similar circuit. The driver/receiver circuit includes a differential driver, a differential receiver, an isolation circuit and an offset generator. The differential driver drives differential signal lines as a function of an output signal. The differential amplifier detects the differential voltage across the differential signal lines via the isolation circuit. The offset generator circuit receives the output signal and, in response, adds an offset to the input terminals of the differential amplifier. The offset cancels at least a portion of the differential voltage across the input terminals of the differential amplifier that results from the DOUT signal. The isolation circuit prevents the offset from significantly affecting the voltage across the differential signal lines.
摘要:
An apparatus and method for detecting and measuring internal clock jitter is disclosed. In one embodiment, a reference clock generator generates a reference clock signal based on an instantaneous clock signal. The reference clock signal includes the instantaneous clock signal delayed for an average duration. A phase comparing element receives both the instantaneous clock signal and the reference clock signal such that the phase comparing element measures a phase difference between the instantaneous clock signal and the reference clock signal. The magnitude and direction of the phase difference is indicated by one of a number of distinct phase difference bins in the phase comparing element.
摘要:
An apparatus that efficiently delivers electrical power and lowers the inductance to an integrated circuit. In one embodiment, the present invention includes an apparatus for delivering electrical power to an integrated circuit comprising two planes, substantially parallel to one another, having many ground and power traces. The ground and power traces of the separate planes are connected together and connected to the integrated circuit, thereby providing power to the integrated circuit. In each individual plane, the ground and power traces are substantially parallel to each other, one array of traces in one plane substantially perpendicular to another array of traces in another plane. The apparatus being electrically coupled to a printed circuit board having at least one decoupling capacitor with first and second electrodes coupled to at least two of the ground and power connections, respectively, of the integrated circuit through the printed circuit board, and the first and second ground and power planes.
摘要:
A highly reliable, large fan-in, high speed, BiCMOS circuit. The amount of MOS transistor parasitic capacitance appearing on the output line of the circuit is reduced by adding only emitter capacitance of bipolar transistors to the output line for each input to the basic logic circuit. Circuitry is provided to raise the base voltage of a reverse biased bipolar transistors to reduce or eliminate the reverse bias.
摘要:
Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.
摘要:
Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC bias degraded oscillating signal. A compare circuit coupled to the reliability oscillators compares the oscillating signals and generates a frequency compensation signal if the comparison determines that there is frequency degradation greater than a predetermined threshold.