摘要:
Embodiments of an sequential state element (SSE) capable of providing triple modular redundant (TMR) correction is disclosed. The SSE has a setup stage and a feedback stage. The setup stage is configured to generate an output bit signal having an output bit state while a clock signal is in the first clock state. The setup stage also generates a feedback input bit signal as feedback of the output bit state. However, the feedback stage is capable of providing TMR correction without this feedback signal. Instead, the feedback stage utilizes the second feedback input bit signal and a third feedback input bit signal from two other SSEs. Since TMR correction can be provided with just the second feedback input bit signal and the third feedback input bit signal, the power and area consumed by the SSE is reduced.
摘要:
Embodiments of an sequential state element (SSE) capable of providing triple modular redundant (TMR) correction is disclosed. The SSE has a setup stage and a feedback stage. The setup stage is configured to generate an output bit signal having an output bit state while a clock signal is in the first clock state. The setup stage also generates a feedback input bit signal as feedback of the output bit state. However, the feedback stage is capable of providing TMR correction without this feedback signal. Instead, the feedback stage utilizes the second feedback input bit signal and a third feedback input bit signal from two other SSEs. Since TMR correction can be provided with just the second feedback input bit signal and the third feedback input bit signal, the power and area consumed by the SSE is reduced.
摘要:
This disclosure relates generally to radiation hardened digital circuits. In one embodiment, a radiation hardened digital circuit includes a delay network and a first Muller C element. The delay network is configured to generate a first delayed clock signal from a global clock signal such that that the first delayed clock signal is delayed with respect to the global clock signal. The first Muller C element is configured to generate a first clock input signal and set the first clock input signal to one of a set of clock states in response to the first delayed clock signal and the global clock signal each being provided in a same one of the set of clock states and is configured to hold the first clock input signal otherwise. Thus, a radiation strike is prevented from causing a soft error in the first clock input signal.
摘要:
Circuits are disclosed that may include a plurality of transistors having controllable current paths coupled between at least a first and second node, the transistors configured to generate an analog electrical output signal in response to an analog input value; wherein at least one of the transistors has a deeply depleted channel formed below its gate that includes a substantially undoped channel region formed over a relatively highly doped screen layer formed over a doped body region.
摘要:
The disclosure relates generally to triple-redundant sequential state (TRSS) machines formed as integrated circuits on a semiconductor substrate, such as CMOS, and computerized methods and systems of designing the triple-redundant sequential state machines. Of particular focus in this disclosure are sequential state elements (SSEs) used to sample and hold bit states. The sampling and holding of bits states are synchronized by a clock signal thereby allowing for pipelining in the TRSS machines. In particular, the clock signal may oscillate between a first clock state and a second clock state to synchronize the operation of the SSE according to the timing provided by the clock states. TheSSEs has a self-correcting mechanism to protect against radiation induced soft errors. The SSE may be provided in a pipeline circuit of a TRSS machine to receive and store a bit state of bit signal generated by combinational circuits within the pipeline circuit.
摘要:
A system including an integrated circuit (IC) and a power supply regulator external to the IC. The IC operates in accordance with an active mode and a lower power mode, and is configured to retain a logical state during the low power mode. The power supply regulator is configured to i) supply a first voltage potential to a first pin of the IC during the active mode, and ii) disable the first voltage potential during the low power mode. The IC is configured to provide a first feedback signal from an internal supply of the IC to the power supply regulator via the first pin.
摘要:
Embodiments of content addressable memories for internet protocol devices and operations are described herein. Other examples and related methods are also disclosed herein.
摘要:
The present invention is directed to a two-dimensional parity technique for data to be stored in one or more memory arrays, each of which has various rows and columns of cells. A row of bits in a super bundle is referred to as a row bundle. A super bundle includes numerous rows of row bundles, and corresponding bits in each of the row bundles in the super bundle are aligned in columns. A row check bit is provided for each row bundle in each super bundle. Each row check bit provides a parity bit that is derived from the k bits of the corresponding row bundle. A column check bit is provided for each column in each super bundle. Each column check bit provides a parity bit that is derived from each of the bits in the corresponding column in the super bundle.
摘要:
A Static Random Access Memory (SRAM) cell having high stability and low leakage is provided. The SRAM cell includes a pair of cross-coupled inverters providing differential storage of a data bit. Power to the SRAM cell is provided by a read word line (RWL) signal, which is also referred to herein as a read control signal. During read operations, the RWL signal is pulled to a voltage level that forces the SRAM cell to a full-voltage state. During standby, the RWL signal is pulled to a voltage level that forces the SRAM cell to a voltage collapsed state in order to reduce leakage current, or leakage power, of the SRAM cell. A read-transistor providing access to the bit stored by the SRAM cell is coupled to the SRAM cell via a gate of the read transistor, thereby decoupling the stability of the SRAM cell from the read operation.