SIGNAL BASED SAMPLE PREPARATION
    3.
    发明申请
    SIGNAL BASED SAMPLE PREPARATION 审中-公开
    基于信号的样品制备

    公开(公告)号:US20140147832A1

    公开(公告)日:2014-05-29

    申请号:US14085653

    申请日:2013-11-20

    Applicant: FEI COMPANY

    Abstract: Described is a system and method for detecting whether a biological event has occurred in a cellular sample, and then activating a fluidics system to fix the cell at the point in time with the event occurred. In one example, a sample preparation system includes a camera linked to a confocal microscope that is interrogating a cellular sample. Once a detectable event, such as a binding event, has occurred, the sample preparation system releases a fixative to fix the cell at the point in time when the event was detected.

    Abstract translation: 描述了用于检测细胞样品中是否已经发生生物学事件,然后激活流体系统以在发生事件的时间点固定细胞的系统和方法。 在一个示例中,样品制备系统包括连接到询问细胞样品的共焦显微镜的照相机。 一旦发生了可检测的事件,例如结合事件,样品制备系统释放固定剂,以在检测到事件的时间点固定细胞。

    Computational scanning microscopy with improved resolution
    4.
    发明授权
    Computational scanning microscopy with improved resolution 有权
    计算扫描显微镜具有改进的分辨率

    公开(公告)号:US09478393B2

    公开(公告)日:2016-10-25

    申请号:US14752570

    申请日:2015-06-26

    Applicant: FEI Company

    Abstract: A method of imaging a specimen comprises directing a beam to irradiate a specimen; detecting radiation emanating from the specimen; scanning the beam along a path; for each sample point in said path, recording a measurement set M={(Dn, Pn)}, where Dn is the detector output as a function of value Pn of measurement parameter P; deconvolving M and spatially resolving it into a set representing depth-resolved imagery of the specimen, whereby, at point pi within the specimen, in a first probing session, irradiating, in a first beam configuration, pi with Point Spread Function F1, whereby said beam configuration is different to P; in at least a second probing session, irradiating, in a second beam configuration, pi with Point Spread Function F2 which overlaps partially with F1 in a zone Oi in which pi is located; sing an Independent Component Analysis algorithm to perform spatial resolution in Oi.

    COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION
    5.
    发明申请
    COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION 审中-公开
    具有改进分辨率的计算扫描显微镜

    公开(公告)号:US20160013015A1

    公开(公告)日:2016-01-14

    申请号:US14752570

    申请日:2015-06-26

    Applicant: FEI Company

    Abstract: A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps: Directing a beam of radiation from a source through an illuminator so as to irradiate a surface S of the specimen; Using a detector to detect a flux of radiation emanating from the specimen in response to said irradiation; Causing said beam to follow a scan path relative to said surface; For each of a set of sample points in said scan path, recording an output Dn of the detector as a function of a value Pn of a selected measurement parameter P, thus compiling a measurement set M={(Dn, Pn)}, where n is a member of an integer sequence; Using computer processing apparatus to automatically deconvolve the measurement set M and spatially resolve it so as to produce reconstructed imagery of the specimen, wherein, considered at a given point pi within the specimen, the method comprises the following steps: In a first probing session, employing a first beam configuration B1 to irradiate the point pi with an associated first Point Spread Function F1, whereby said beam configuration is different to said measurement parameter; In at least a second probing session, employing a second beam configuration B2 to irradiate the point pi with an associated second Point Spread Function F2, whereby: F2 overlaps partially with F1 in a common overlap zone Oi in which point pi is located; F1 and F2 have respective non-overlapping zones F1′ and F2′ outside of Oi, Using a Source Separation algorithm in said computer processing apparatus to perform image reconstruction in said overlap zone Oi considered separately from said non-overlapping zones F1′ and F2′.

    Abstract translation: 使用扫描型显微镜对试样的图像进行累积的方法,包括以下步骤:使来自源的辐射束通过照射器引导,以照射样本的表面S; 使用检测器来响应于所述照射来检测从样品发出的辐射通量; 使所述光束相对于所述表面跟随扫描路径; 对于所述扫描路径中的一组采样点中的每一个,记录检测器的输出Dn作为所选择的测量参数P的值Pn的函数,从而编译测量集M = {(Dn,Pn)},其中 n是整数序列的成员; 使用计算机处理装置对测量集M进行自动解卷积并对其进行空间解析以产生样本的重建图像,其中,在样本内的给定点pi处考虑,该方法包括以下步骤:在第一探测会话中, 采用第一光束配置B1以相关联的第一点扩展函数F1照射点pi,由此所述光束配置与所述测量参数不同; 在至少第二探测会话中,采用第二光束配置B2以相关联的第二点扩展函数F2照射点pi,由此:F2在与其相对应的位置的公共重叠区域Oi中部分地与F1重叠; F1和F2在Oi外部具有各自的非重叠区域F1'和F2',在所述计算机处理设备中使用源分离算法,在与所述非重叠区域F1'和F2'分开考虑的所述重叠区域Oi中执行图像重建, 。

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